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Featured researches published by Yonghao Jia.


Scientific Reports | 2017

Multipole Modes Excitation of uncoupled dark Plasmons Resonators based on Frequency Selective Surface at X-band Frequency Regime

Yu Lan; Yuehang Xu; Yonghao Jia; Tengda Mei; Shi-Wei Qu; Bo Yan; Deqiang Yang; Bo Chen; Ruimin Xu; Yanrong Li

In this report, we theoretically and experimentally demonstrates that multipole modes could be excited effectively in dark plasmonic resonators without introducing any other bright resonators at microwave range based on a two-dimensional frequency selective surface (FSS) structure. These excited multipole resonances are closely related to the coupling strength between adjacent S-LSPs resonators (the periodicity of the FSS). The modes splitting effects and resonance frequencies of the excited multipole modes are regulated by changing the numbers of grooves and inner disk radius, both of which play significant roles in the excitation of the dark S-LSPs disk resonator at normal incidence. Moreover, the multipole resonances characteristics of dark S-LSPs resonators in the case of oblique incidence are also presented. Observation of such multipole resonances in dark S-LSPs without introducing extra bright resonance at normal/oblique incidence would find more potential applications in microwave and terahertz based sensors, plasmonic resonance devices and metamaterial devices.


IEICE Electronics Express | 2017

A new Inter-electrode coupling capacitance extraction method for deep-submicron AlGaN/GaN HEMTs

Xiaodong Zhao; Yuehang Xu; Zhang Wen; Yonghao Jia; Tiedi Zhang; Bo Yan; Ruimin Xu

The accurate extraction of inter-electrode coupling capacitances (IECCs) is a difficult but important issue in small-signal modeling of highly scaled transistors. In this paper, a new method of determining the IECCs for deep-submicron aluminium gallium nitride/gallium nitride (AlGaN/GaN) high electron–mobility transistors (HEMTs) is proposed. The method uses the pinch-off S-parameters under large drain bias to eliminate the influence of intrinsic capacitance on IECCs extraction, thereby determining the reliable starting value of IECCs. Compared with the conventional method, this method not only greatly reduces the parameter searching range in final value optimization but also avoids the non-physical extraction value for intrinsic parameters. Using this method, we build a small-signal model for a 0.15 μm gate-length GaN HEMT. The measured data show that this method has high precision and can be applied to the modeling of millimeter-wave GaN HEMTs.


ieee mtt s international microwave workshop series on advanced materials and processes for rf and thz applications | 2016

A robust small-signal equivalent circuit model for AlGaN/GaN HEMTs up to 110 GHz

Yonghao Jia; Yuehang Xu; Yunqiu Wu; Ruimin Xu; Jianjun Zhou; Tangsheng Chen; Bing Zhang

In this paper we present an accurate and robust small-signal equivalent circuit model(SSECM) for GaN/AlGaN HEMTs. To extend the operating frequency, a flexible equivalent circuit network for parasitic parameters is proposed. The equivalent circuit network is constructed by a number of (N) seriate equivalent resist, inductance and capacitance (Rn-Ln-Cn), which accounts for distribution effects of gate and drain feeding line. The number of seriate R-L-C can be chosen by the maximum operating frequency flexibly. As a result, we can get an accurate SSECM on certain frequency range with the minimum cost of extraction procedure and time. The proposed parasitic model has been added in the conventional SSECM and a GaN HEMT with gate length 0.1μm and 2×100μm is used for validation. The results show that the SSECM with N=2 and N=3 can well describe the scattering parameters with maximum frequency up to 66GHz and 110 GHz, respectively.


ieee mtt s international microwave workshop series on advanced materials and processes for rf and thz applications | 2016

A ultra-wideband empirical large-signal model for AlGaAs/GaAs HEMTs

Yonghao Jia; Yuehang Xu; Xiaodong Zhao; Changsi Wang

An accurate large-signal GaAs HEMT modeling is very important for microwave and millimeter wave power MMIC amplifier design. This paper presents a complete GaAs HEMT model suitable for ultra-wide band application. The model is realized with an improved drain current (Ids) formulation with self-heating and charge trapping modification. This large-signal GaAs HEMT modeling is validated for a wideband frequency from 12GHz to 40GHz and can predict fundamental output power, gain, and power added efficiency accurately.


IEEE Transactions on Microwave Theory and Techniques | 2017

Temperature-Dependent Access Resistances in Large-Signal Modeling of Millimeter-Wave AlGaN/GaN HEMTs

Xiaodong Zhao; Yuehang Xu; Yonghao Jia; Yunqiu Wu; Ruimin Xu; Jingqiang Li; Zhifu Hu; Hongjiang Wu; Wei Dai; Shujun Cai


International Journal of Numerical Modelling-electronic Networks Devices and Fields | 2018

An accurate parasitic parameters extraction method based on FW‐EM for AlGaN/GaN HEMT up to 110 GHz

Yonghao Jia; Yuehang Xu; Ruimin Xu; Yanrong Li


ECS Journal of Solid State Science and Technology | 2017

Performance Comparison of GaN HEMTs on Diamond and SiC Substrates Based on Surface Potential Model

Qingzhi Wu; Yuehang Xu; Jianjun Zhou; Yuechan Kong; Tangsheng Chen; Yan Wang; Fujiang Lin; Yu Fu; Yonghao Jia; Xiaodong Zhao; Bo Yan; Ruimin Xu


international microwave symposium | 2018

Modeling Buffer-Related Charge Trapping Effect by Using Threshold Voltage Shifts in AlGaN/GaN HEMTs

Yonghao Jia; Yuehang Xu; Yong-Xin Guo


IEEE Transactions on Microwave Theory and Techniques | 2018

A Universal Scalable Thermal Resistance Model for Compact Large-Signal Model of AlGaN/GaN HEMTs

Yonghao Jia; Yuehang Xu; Yong-Xin Guo


IEEE Transactions on Electron Devices | 2018

Characterization of Buffer-Related Current Collapse by Buffer Potential Simulation in AlGaN/GaN HEMTs

Yonghao Jia; Yuehang Xu; Kai Lu; Zhang Wen; Andong Huang; Yong-Xin Guo

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Yuehang Xu

University of Electronic Science and Technology of China

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Ruimin Xu

University of Electronic Science and Technology of China

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Xiaodong Zhao

University of Electronic Science and Technology of China

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Bo Yan

University of Electronic Science and Technology of China

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Yunqiu Wu

University of Electronic Science and Technology of China

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Yong-Xin Guo

National University of Singapore

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Yanrong Li

University of Electronic Science and Technology of China

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Zhang Wen

University of Electronic Science and Technology of China

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Andong Huang

Nanjing University of Science and Technology

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Bo Chen

University of Electronic Science and Technology of China

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