Yongkai Yin

Multiple-Image Encryption Based on Compressive Ghost Imaging and Coordinate Sampling

A multiple-image encryption method that is based on a modified logistic map algorithm, compressive ghost imaging, and coordinate sampling is proposed. In the encryption process, random phase-only masks are first generated with the modified logistic map algorithm; multiple secret images are transformed to be sparsed by the 2-D discrete cosine transformation (DCT) operation and scrambled by different random sequences; the scrambled images are then grouped to one combined image with the help of the coordinate sampling matrices; finally, putting the combined image in the object plane of the compressive ghost imaging system, the ciphertext will be obtained from the buck detector and transferred to the receivers. During the decryption, which is the possession of the correct principle keys and the assistant geometrical parameter key, the original secret images can be successfully decrypted by the logistic map algorithm, measurement matrix generations, compressive sensing reconstruction, DCT distribution extraction, inverse DCT transform, and filtering operation.

Shadow removal method for phase-shifting profilometry

In a typical phase-shifting profilometry system for the three-dimensional (3D) shape measurement, shadows often exist in the captured images as the camera and projector probe the object from different directions. The shadow areas do not reflect the fringe patterns which will cause errors in the measurement results. This paper proposed a new method to remove the shadow areas from taking part in the 3D measurement. With the system calibrated and the object reconstructed, the 3D results are mapped on a point-by-point basis into the corresponding positions on the digital micro-mirror device (DMD) of the projector. A set of roles are presented to detect the shadow points based on their mapped positions on the DMD plane. Experimental results are presented to verify the effectiveness of the proposed method.

Phase error compensation methods for high-accuracy profile measurement

In a phase-shifting algorithm-based fringe projection profilometry, the nonlinear intensity response, called the gamma effect, of the projector-camera setup is a major source of error in phase retrieval. This paper proposes two novel, accurate approaches to realize both active and passive phase error compensation based on a universal phase error model which is suitable for a arbitrary phase-shifting step. The experimental results on phase error compensation and profile measurement of standard components verified the validity and accuracy of the two proposed approaches which are robust when faced with changeable measurement conditions.

Structured light field 3D imaging

In this paper, we propose a method by means of light field imaging under structured illumination to deal with high dynamic range 3D imaging. Fringe patterns are projected onto a scene and modulated by the scene depth then a structured light field is detected using light field recording devices. The structured light field contains information about ray direction and phase-encoded depth, via which the scene depth can be estimated from different directions. The multidirectional depth estimation can achieve high dynamic 3D imaging effectively. We analyzed and derived the phase-depth mapping in the structured light field and then proposed a flexible ray-based calibration approach to determine the independent mapping coefficients for each ray. Experimental results demonstrated the validity of the proposed method to perform high-quality 3D imaging for highly and lowly reflective surfaces.

High-power Yb:GGG thin-disk laser oscillator: first demonstration and power-scaling prospects

We present the first demonstration of a thin-disk laser based on the gain material Yb:GGG. This material has many desirable properties for the thin-disk geometry: a high thermal conductivity, which is nearly independent of the doping concentration, a low quantum defect, low-temperature growth, and a broadband absorption spectrum, making it a promising contender to the well-established Yb:YAG for high-power applications. In continuous wave laser operation, we demonstrate output powers above 50 W, which is an order of magnitude higher than previously achieved with this material in the bulk geometry. We compare this performance with an Yb:YAG disk under identical pumping conditions and find comparable output characteristics (with typical optical-to-optical slope efficiencies >66%). Additionally, with the help of finite-element-method simulations, we show the advantageous heat-removal capabilities of Yb:GGG compared to Yb:YAG, resulting in >50% lower thermal lensing for thin Yb:GGG disks compared to Yb:YAG disks. The equivalent optical performance of the two crystals in combination with the easy growth and the significant thermal benefits of Yb:GGG show the large potential of future high-power thin-disk amplifiers and lasers based on this material, both for industrial and scientific applications.

Fringe Pattern Analysis With Message Passing Based Expectation Maximization for Fringe Projection Profilometry

Fringe projection profilometry (FPP) is a popular optical 3-D imaging approach, in which the images of deformed fringe patterns are analyzed to extract object surfaces (i.e., height maps of object surfaces). As an object surface normally does not change independently, height correlations of an object surface can be used to denoise and improve the measurement performance of the FPP. This paper investigates the issue of exploiting height correlations in FPP fringe pattern analysis. The challenge lies in that height correlations are unknown and they are different from object to object. In addition, the problem of interest is normally in a large scale. In this paper, we use autoregressive (AR) models with unknown parameters to model the unknown height correlations and formulate the FPP analysis problem (with height correlations exploited) under the framework of expectation maximization (EM). With EM, the unknown AR model parameters are determined based on observations, and the estimates of the heights with their correlations exploited can also be extracted. To deal with the large-scale problem, a message passing-based implementation of the formulated EM problem is studied and the relevant message updating rules are developed. The proposed approach has a linear complexity and it allows parallel processing due to the nature of message passing. Simulation and experimental results demonstrate a significant performance improvement by the proposed approach.

Improved performance of multi-view fringe projection 3D microscopy

Fringe projection 3D microcopy (FP-3DM) plays an increasingly important role in micro manufacturing and measurement. In recent decades, research on FP-3DM has made considerable progress. Nevertheless, some disadvantages arising from the limited depth of field, local specular reflection and occlusion still exist and need to be further addressed. In this paper, a multi-view FP-3DM (MVFP-3DM) is presented. Four imaging branches with the Scheimpflug condition and one vertical projection branch are deployed to establish the system. The system is described with a general imaging model, which is independent of the system configuration. In system calibration, the edge of binary fringe is used to locate the benchmark, which takes advantage of the fact that the edge will keep its position whether it is in focus or out of focus. Furthermore, a group of experiments prove that our proposed MVFP-3DM system can extend measurable range in depth, improve precision in 3D reconstruction and reduce occlusion.

Three-dimensional surface inspection for semiconductor components with fringe projection profilometry

With the increasing integration level of components in modern electronic devices, three-dimensional automated optical inspection has been widely used in the manufacturing process of electronic and communication industries to improve the product quality. In this paper, we develop a three-dimensional inspection and metrology system for semiconductor components with fringe projection profilometry, which is composed of industry camera, telecentric lens and projection module. This system is used to measure the height, flatness, volume, shape, coplanarity for quality checking. To detect the discontinuous parts in the internal surface of semiconductor components, we employ the fringes with multiple spatial frequencies to avoid the measurement ambiguity. The complete three-dimensional information of semiconductor component is obtained by fusing the absolute phase maps from different views. The practical inspection results show that the depth resolution of our system reaches 10 μm . This system can be further embedded for the online inspection of various electronic and communication products.

Automated approach for the surface profile measurement of moving objects based on PSP

Phase shifting profilometry can achieve high accuracy for the 3D shape measurement of static object. Errors will be introduced when the object is moved during the movement. The fundamental reason causing the above issue is: PSP requires multiple fringe patterns but the reconstruction model does not include the object movement information. This paper proposes a new method to automatically measure the 3D shape of the rigid object with arbitrary 2D movement. Firstly, the object movement is tracked by the SIFT algorithm and the rotation matrix and translation vector describing the movement are estimated. Then, with the reconstruction model including movement information, a least-square algorithm is applied to retrieve the correct phase value. The proposed method can significantly reduce the errors caused by the object movement. The whole reconstruction process does not need human intervention and the proposed method has high potential to be applied in industrial applications. Experiments are presented to verify the effectiveness.

Singular value decomposition ghost imaging

The singular value decomposition ghost imaging (SVDGI) is proposed to enhance the fidelity of computational ghost imaging (GI) by constructing a measurement matrix using singular value decomposition (SVD) transform. After SVD transform on a random matrix, the non-zero elements of singular value matrix are all made equal to 1.0, then the measurement matrix is acquired by inverse SVD transform. Eventually, the original objects can be reconstructed by multiplying the transposition of the matrix by a series of collected intensity. SVDGI enables the reconstruction of an N-pixel image using much less than N measurements, and perfectly reconstructs original object with N measurements. Both the simulated and the optical experimental results show that SVDGI always costs less time to accomplish better works. Firstly, it is at least ten times faster than GI and differential ghost imaging (DGI), and several orders of magnitude faster than pseudo-inverse ghost imaging (PGI). Secondly, in comparison with GI, the clarity of SVDGI can get sharply improved, and it is more robust than the other three methods so that it yields a clearer image in the noisy environment.