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international symposium on electromagnetic compatibility | 2017

Comparison of configurations for conducted emission measurement specified in CISPR 32 and CISPR 13

Nozomi Miyake; Koichi Kakuda; Yoshiaki Hiratsuka; Hidenori Muramatsu

Configurations, such as the physical layout of the measurement setup and operation conditions of equipment under test (EUT) especially the complexity of the displayed image for conducted emission measurements specified in CISPR 32[1] differ from those in CISPR 13 [2]. CISPR 32 requires a typical system configuration but CISPR 13 does not require the system. After CISPR 32 was published, multimedia equipment (MME), which has broadcast receiver functions measured with the configuration in CISPR 13 shall be measured with that in CISPR 32. Therefore, effects of differences in configurations for conducted emission measurement have to be clarified to obtain equivalent results. From the results of investigations into asymmetric mode conducted emission measurements, more practical operations of EUT can be simulated with the physical layout in CISPR 32. Also, the conducted emissions did not significantly change due to the complexity of the images displayed on the monitor.


Archive | 1996

Electronic apparatus having cooling system

Yoshiaki Hiratsuka


Archive | 1992

D.C. fan control circuit device for linearly variable cooling

Yoshiaki Hiratsuka; Tsutomu Yoshii


Archive | 2001

Display panel module of low electromagnetic radiation

Yoshiaki Hiratsuka; Hisashi Yoshinaga; Masanori Yamaguchi


Archive | 2000

Printed circuit board, printed circuit board module and electronic device adapting same

Yoshiaki Hiratsuka; Masanori Yamaguchi; Hisashi Yoshinaga


Archive | 2006

Shield structure for information technology equipments

Yoshiro Tanaka; Yoshiaki Hiratsuka; Yosuke Konaka; Takayuki Niiyama; Daisuke Seki


Archive | 2007

Divisional panel module of low electromagnetic radiation

Yoshiaki Hiratsuka; Hisashi Yoshinaga; Masanori Yamaguchi


Archive | 2004

Printed-circuit board and electronic device

Yoshiaki Hiratsuka; Yoshiro Tanaka


Archive | 2008

Resistance measurement method and component inspection process

Yoshiaki Hiratsuka; Akio Ikeda; Masaharu Suzuki


Archive | 2001

DISPLAY PANEL MODULE

Yoshiaki Hiratsuka; Masanori Yamaguchi; Hisashi Yoshinaga; 寿 吉長; 正徳 山口; 良秋 平塚

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