Yoshihiko Takishita

High-Speed C-Scan Imaging System with Electronic Scanning of 25MHz Ultrasonic Beam

C-scan imaging techniques using high frequency ultrasonic beams have shown increasing importance as a means of nondestructive quality evaluation for mass production products especially in the electronics industry e.g. semiconductor products, condenser tips or other ceramic parts, target materials and composite materials etc.. All these products require the exclusion of even the smallest defects or voids in materials.