Yoshihiro Ueno
Panasonic
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Publication
Featured researches published by Yoshihiro Ueno.
Journal of Tribology-transactions of The Asme | 1998
Kaoru Matsuoka; Koji Taniguchi; Yoshihiro Ueno
A new on-line methodology has been developed for both evaluation and analysis of head/tape interface phenomena. It uses the direct relationships between the power in the acoustic emission (AE) signal and wear, and between the power in the AE signal and the normal force acting on the magnetic head. The AE transducer is directly mounted onto the head assembly of a VCR mechanism in order to measure the head/tape contact behavior. This technique has been used to : (a) monitor the effect of relative humidity on head wear; (b) investigate the wear characteristics of Mn-Zn ferrite as a function of crystallographic orientation without direct measurement of the wear volume; and (c) evaluate tape abrasiveness. Explicit correlations were also obtained for the normal force acting on the magnetic head, the tape wrap angle around the head, and the reproduced signal flatness in terms of the tape transverse stress distribution. Moreover, the normal force as a function of the tape stress distribution is closely related to the longitudinal tape vibration at the head exit region.
Archive | 2006
Makoto Umeda; Yoshihiro Ueno; Toshio Inaji; Hideki Kuwajima
Archive | 2002
Shigeo Obata; Kaoru Matsuoka; Koichi Shinohara; Yoshihiro Ueno; Tatsuhiko Inagaki; Hideki Kuwajima; Hiromi Kita
Archive | 2004
Hideyuki Hashi; Hideki Kuwajima; Yoshihiro Ueno
Archive | 2004
Yoshihiro Ueno; Zhisheng Deng
Archive | 2001
Yoshihiro Ueno; Tatsuhiko Inagaki
IEEE Transactions on Magnetics | 2006
Hideki Kuwajima; Hiromi Kita; Hideyuki Hashi; Makoto Miyamoto; Yoshihiro Ueno; Tatsuhiko Inagaki; Kaoru Matsuoka
Archive | 2003
Takashi Honda; Katsuki Kurihara; Yoshihiro Ueno; Hideki Kuwajima
Archive | 2005
Hideyuki Hashi; Yoshihiro Ueno; Makoto Miyamoto
Microsystem Technologies-micro-and Nanosystems-information Storage and Processing Systems | 2007
Hideki Kuwajima; Yoshihiro Ueno; Makoto Umeda; Toshio Inaji; A. Ochi; Kaoru Matsuoka