Yoshikazu Takaku
Tohoku University
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Featured researches published by Yoshikazu Takaku.
Microelectronics Reliability | 2006
Yasushi Yamada; Yoshikazu Takaku; Yuji Yagi; Yuji Nishibe; Ikuo Ohnuma; Y. Sutou; R. Kainuma; K. Ishida
Abstract Reliabilities of joints for power semiconductor devices using a Bi-based high temperature solder has been studied. The Bi-based solder whose melting point is 270 °C were prepared by mixing of the CuAlMn particles and molten Bi to overcome the brittleness of Bi. Then, joined samples using the solder were fabricated and thermal cycling tests were examined. After almost 2000 test cycles of −40/200 °C test, neither intermetallic compounds nor cracks were observed for CTE (Coefficient of Thermal Expansion) matched sample with Cu interface. On the other hand, certain amount of intermetallic compound such as Bi 3 Ni was found for a sample with Ni interface. In addition, higher reliability of this solder than Sn-Cu solder was obtained after −40/250 °C test. Furthermore, an example power module structure using double high temperature solder layers was proposed.
Rare Metals | 2008
Zhanmin Cao; Yoshikazu Takaku; Ikuo Ohnuma; R. Kainuma; Hongmin Zhu; K. Ishida
The Ni-Sb binary alloy system was thermodynamically assessed using CALPHAD approach in this article. Excess Gibbs energies of solution phases, liquid and fcc phases, were formulated using the Redlich-Kister expression. The intermediate phases were modeled by the sublattice model with (Ni, Va)0.5(Ni, Sb)0.25(Ni)0.25 for Ni3SbHT phase and (Ni, Va)0.3333(Sb)0.3333(Ni, Va)0.3333 for NiSb phase. The other phases including Ni3Sb, Ni7Sb3, and NiSb2 were treated as stoichiometric compound owing to their narrow composition ranges. Based on the reported thermodynamic properties and phase diagram data, the thermodynamic parameters of these phases were optimized, and the obtained values can reproduce the available experimental data well.
Journal of Materials Research | 2010
F. Gao; Cuiping Wang; Xingjun Liu; Yoshikazu Takaku; Ikuo Ohnuma; K. Ishida
The phase equilibria at 200 °C, 250 °C, 300 °C, and 400 °C and the phase transformation of the Sn-Au-Bi system were investigated by using the electron probe micro-analyzer (EPMA) and differential scanning calorimeter (DSC), respectively. It is found that there is a new ternary intermetallic compound with a possible AuSn structure (called the ϕ phase in the present work), which has a limited solubility of Au in the Au-rich portion, and the ϕ phase decomposes peritectically at about 313 °C. Based on the experimental data reported in the previous papers and new experimental data determined by the present work, thermodynamic assessments of the Sn-Au-Bi system were carried out by the calculation of phase diagrams (CALPHAD) method. The thermodynamic parameters for describing the Gibbs free energy of each phase were optimized, and reasonable agreement between the calculated results and experimental data was obtained in the Sn-Au-Bi ternary system.
Journal of Electronic Materials | 2002
X. J. Liu; Y. Inohana; Yoshikazu Takaku; Ikuo Ohnuma; R. Kainuma; K. Ishida; Z. Moser; W. Gasior; Janusz Pstrus
Microelectronics Reliability | 2007
Yasushi Yamada; Yoshikazu Takaku; Yuji Yagi; Ikuro Nakagawa; Takashi Atsumi; Mikio Shirai; Ikuo Ohnuma; K. Ishida
Journal of Electronic Materials | 2008
Yoshikazu Takaku; Lazuardi Felicia; Ikuo Ohnuma; R. Kainuma; K. Ishida
Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science | 2004
C. P. Wang; X. J. Liu; R. Kainuma; Yoshikazu Takaku; Ikuo Ohnuma; K. Ishida
Materials Transactions | 2004
Yoshikazu Takaku; Xing Jun Liu; Ikuo Ohnuma; R. Kainuma; K. Ishida
Journal of Electronic Materials | 2009
Yoshikazu Takaku; Komei Makino; Keita Watanabe; Ikuo Ohnuma; R. Kainuma; Yasushi Yamada; Yuji Yagi; Ikuo Nakagawa; Takashi Atsumi; K. Ishida
Journal of Electronic Materials | 2006
Yoshikazu Takaku; Ikuo Ohnuma; R. Kainuma; Yasushi Yamada; Yuji Yagi; Yuji Nishibe; K. Ishida