Young-Mok Son

Microfabricated coupled-cavity backward-wave oscillator for terahertz imaging

A design study of a 0.1-THz coupled-cavity backward-wave oscillator (CCBWO) is presented using a finite element method and a particle-in-cell simulation. In experiments, the Si-based technology of 2-step deep reactive ion etching (DRIE) and eutectic bonding shows a good potential for the microfabrication of the interaction circuit. A miniaturized field emission cathode using carbon nanotubes grown by chemical vapor deposition (CVD) is also a good candidate for the electron beam generation. An integration of the cathode and the interaction circuit will be discussed. In addition, a preliminary design of a continuous-wave (CW) THz imaging system is demonstrated for the THz propagation and detection.

CW Terahertz imaging of paraffin-embedded epithelia cell of rat

CW Terahertz imaging system is being constructed to investigate the response of cell to the terahertz wave. This system consists of a 0.2 THz radiation source and some off-axis-parabolic mirrors (OAPs) with 2 dimensional (2D) translation stage. Detection is achieved with a pyroelectric sensor operated at room temperature. Biological terahertz imaging of a ratpsilas paraffin-embedded epithelial cell with tumor is presented.

Comparative analysis on DRIE and LIGA fabrications for millimeter-wave backward-wave oscillators

For the generation of millimeter wave from vacuum electron devices, the microfabrication of an interaction circuit is one of the key factors. Two different technologies, a deep etch X-ray lithography (x-ray LIGA) and a deep reactive ion etching (DRIE), were employed for the comparative study and the realization of a backward-wave oscillator. Both methods showed accurate and reliable results, which enabled the integration of the interaction circuit for millimeter-wave backward-wave oscillators.

P-228: Degradation of White Light Emitting OLEDs

We firstly report the degradation analysis of multilayer structured WOLED by using spectroscopic and microscopic analytical methods. Our analytical results demonstrated that the interface between cathode and electron-transporting layer is responsible for the intrinsic long-term degradation of WOLEDs.