Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where Yu-Jae Jeon is active.

Publication


Featured researches published by Yu-Jae Jeon.


Journal of Energy Engineering-asce | 2012

The Study on Thermal Shock Test Characteristics of Solar Cell for Long-term Reliability Test

Min-Soo Kang; Do-Seok Kim; Yu-Jae Jeon; Young-Eui Shin

Abstract ―This study has been performed Thermal Shock test for analyze the cause of Power drop in PV(Photovoltaic) Module. Thermal Shock test condition was performed with temperature range from -40℃ ~ 85℃. One cycle time is 30min. which are consist of low and high temperature 15min. each other. The test was performed with total 500cycles. EL, I-V were conducted every 100cycle up to 500cycles. Mono Cell resulted in 8% Power drop rates in Bare Cell and 9% in Solar Cell. In the case of Multi Cell resulted in 6% Power drop rates in Bare Cell and 13% in Solar Cell. After Thermal Shock test, Solar Cells Power drop resulted from surface damages, but in the case of Bare Cells Power drop had no surface damages. Therefore, Bare Cells Power drop was confirmed as according to leakage current increase by analysis of Fill Factor after Thermal Shock test. Also, Solar Cells Power drop rates are higher than that of Bare Cell because of surface damages and consuming electric power increase. From now on, it should be considered that analyzed the reasons of Fill Factor decrease and irregular Power drop in PV module and Cell level using cross section, various conditions and test methods.


Journal of Energy Engineering-asce | 2012

A Study on The Characteristics of Solar Cell by Thermal Shock test

Min-Soo Kang; Yu-Jae Jeon; Young-Eui Shin

In this study, The report analysed the characteristics of power drop in solar cell through thermal shock test. The solar cells were tested 500 cycles in lowest temperature and highest temperature by thermal shock test on ironbound conditions, that excerpted standard of PV Module(KS C IEC-61215). The result of the efficiency analysis through measure of I-V, efficiency of Cell decreased from 13.9% to 11.0% and decreasing rate was 20.9% after test. The result of the surface analysis through EL, solar cell has damage of gridfinger and ribbon joint. Cell cracks were founded in damage of cells through cross section of solar cells. Also, Fill factors were decreased from 72.3% to 62.0% after thermal shock test and decreasing rate is 11.8%. therefore, Yearly power drop is aggravated with facts that cell crack, damage of surface and power loss of cell by change of I-V characteristic curve with decreasing of parallel resistance.


Journal of Energy Engineering-asce | 2012

Study on the Long-term Reliability of Solar Cell by High Temperature & Humidity Test

Min-Soo Kang; Yu-Jae Jeon; Do-Seok Kim; Young-Eui Shin

In this study, The report analysed the characteristics of power drop and damage of surface in solar cell through high temperature and humidity test. The solar cells were tested during the 1000hr in temperature and 85% humidity conditions, that excerpted standard of PV Module(KS C IEC-61215). An analysis of the cell surface through EL(Electroluminescence), the cell has partly change of surface in yearly. Single-crystalline Solar cell efficiency is decreased from 17.7% to 15.6% and decreasing rate is 11.9%. On the other hand, Poly-crystalline Solar cell efficiency is decreased from 15.5% to 14.0% and decreasing rate is 9.3%. A comparison of the fill factor for analysis of electro characteristic in yearly, Single-crystalline Solar cell efficiency is decreased from 78.7% to 78.1% and decreasing rate is 4.7%. On the other hand, Poly-crystalline Solar cell efficiency is decreased from 78.1% to 76.7% and decreasing rate is 1.8%. Single-crystalline has more bigger power drop than poly-crystalline by the silicon purity and silicon atom arrangement. Also, FF decreasing rate has more bigger drop than efficiency decreasing rate for the reason that the damage of surface by exterior environmental factor is the more influence in cell than other reason that is decreasing FF by damage of p-n junction.


Journal of The Korean Institute of Electrical and Electronic Material Engineers | 2010

A Study of Thermal Shock Characteristics on the Joints of Automotive Application Component using Sn-3Ag-0.5Cu Solder

Yu-Jae Jeon; Sun-Ik Son; Do-Seok Kim; Young-Eui Shin

This study investigated the characteristics of fracture behavior and mode on solder joints before and after thermal shock test for automotive application component using Sn-3.0Ag-0.5Cu solder, which has a outstanding property as lead-free solder. The shear strength was decreased with thermal cycle number, after 432 cycles of thermal shock test. In addition, fracture mode was verified to ductile, brittle fracture and base materials fracture such as different kind fractured mode using SEM and EDS. Before the thermal shock, the fractured mode was found to typical ductile fracture in solder layer. After thermal shock test, especially, Ag was found on fractured portion as roughest surface. Moreover, it occurred delamination between a PCB and a Cu land. Before thermal shock test, most of fractured mode in solder layer has dimples by ductile fracture. However, after thermal shock test, the fractured mode became a combination of ductile and brittle fracture, and it also could find that the fracture behavior varied including delamination between substrate and Cu land.


Journal of The Korean Institute of Electrical and Electronic Material Engineers | 2016

A Study on The Degradation Characteristics of MLCCs SAC305 Lead-free Solder Joints and Growth IMCs by Thermal Shock Test

Sang-Won Jung; Min-Soo Kang; Yu-Jae Jeon; Do-Seok Kim; Young-Eui Shin

The bonding characteristics of MLCCs (multi layer ceramic capacitor, C1608) lead-free solder (SAC305) joints were evaluated through thermal shock test (, total 1,800 cycle). After the test, IMCs( intermetallic compounds) growth and cracks were verified, also shear strengths were measured for degradation of solder joints. In addition, The thermal stress distributions at solder joints were analyzed to compare the solder joints changes before and after according to thermal shock test by FEA (finite elements analysis). We considered the effects of IMCs growth at solder joints. As results, the bonding characteristics degradation was occurred according to initial crack, crack propagations and thermal stress concentration at solder-IMCs interface, when the IMCs grown to solder inside.


Journal of Energy Engineering-asce | 2014

The Study on the Long-term Reliability Characteristics of Ribbon Joint: Solar Cell Ribbon Thickness and Solder Compositions

Yu-Jae Jeon; Min-Soo Kang; Kyung-Jun So; Jae-June Lee; Young-Eui Shin

In this paper, Thermal Shock tests were performed varying the composition of the solder and ribbon thickness (A-type:0.2mm/60Sn40Pb, B-type:0.25mm/60Sn40Pb, C-type:0.2 /62Sn36Ag2Pb, D-type:0.25mm/ 62Sn36Ag2Pb) for evaluating the long-term reliability about Ribbon junction of Silicon solar cells. Thermal Shock test condition was performed during the 600cycles having -40 ~85 temperature range each 15 minutes; Ai Ai One cycle time was 30min. As a result, the initial efficiency of the A-type, B-type, and C, D-type were showed 15.0%, 15.4% and 15.8% respectively. After thermal shock test, the efficiency decreasing-rate of each type were as follow that A-type was 13.8%, B-Type was 15.4%. C-Type and D-Type was 15.3% and 16.2%, respectively. Also, degradation of surface changes and I-V characteristic curves were showed that the series resistance of the A, C-type was increased. Also, current lowering starting point of C-type shown 0.05volt(v) earlier than that of A-type. And B, D-type shown characteristics of composite lowering efficiency such as increase of series resistance, decrease of parallel resistance and cell damage. Therefore Initial solderability and efficiency of


Journal of The Korean Institute of Electrical and Electronic Material Engineers | 2011

A Study on the Characteristics and Error Ranges of Automotive Application Component's Mechanical Bonding Strength for the Its Reliability Evaluation

Yu-Jae Jeon; Do-Seok Kim; Young-Eui Shin

In this study, the characteristics and error ranges of the mechanical bonding strength were analyzed according to before and after thermal shock test for various chips of automotive application component using Sn-3.0Ag-0.5Cu solder. In the after thermal shock test, the mechanical bonding strengths tend to decrease, meanwhile decreasing rates of mechanical strengths were less then 12% at specimen`s bonding area below 3.5, and were from 17 to 21% at specimen`s bonding area above 12 . On the other hand, Specimen`s mean deviation rates were about 5% at specimen`s bonding area more than 12 . Inversely, at specimen`s bonding area is less then 3.5 , mean deviation rates were increased to about 8%. It means that the smaller device size is, the larger mean deviation rate. In addition, error ranges and deviation rates of the mechanical bonding strengths may differ slightly depending on their bonding area. Furthermore, process conditions as well as method of mechanical reliability evaluation should be established to reduce the error ranges of bonding strength.


International Journal of Precision Engineering and Manufacturing | 2014

Study of characteristics of solar cells through thermal shock and high-temperature and high-humidity testing

Yu-Jae Jeon; Do-Seok Kim; Young-Eui Shin


Transactions of the Korean Society of Automotive Engineers | 2011

A Study on the Fracture Mode Characteristics of Automotive Application Component Lead-free Solder Joints

Yu-Jae Jeon; Do-Seok Kim; Young-Eui Shin


International Journal of Precision Engineering and Manufacturing | 2016

Degradation Characteristics and Ni3Sn4 IMC Growth by a Thermal Shock Test in SAC305 Solder Joints of MLCCs Applied in Automotive Electronics

Min-Soo Kang; Yu-Jae Jeon; Do-Seok Kim; Young-Eui Shin

Collaboration


Dive into the Yu-Jae Jeon's collaboration.

Top Co-Authors

Avatar
Top Co-Authors

Avatar
Top Co-Authors

Avatar
Researchain Logo
Decentralizing Knowledge