Yuichiro Kita
Tokai University
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Featured researches published by Yuichiro Kita.
Journal of Materials Science | 1990
Yoshitake Nishi; Yuichiro Kita; Kenji Tanioka
AlthoughTc cannot be found for a liquid-quenched Bi1.6Pb0.4Sr2Ca2Cu3Ox glassy sample, a highTc is found after annealing for 24 h at 1100 K. The maximum offset temperature of the superconducting transition is 113.3 K at 2.2 × 10−2mAmm−2. The maximumTcoff is larger than that (the maximumTcoff is 103.4 K at 2.0 × 10−2 mAmm−2) of sintered specimens before liquid quenching.
Journal of Applied Physics | 1992
Yoshitake Nishi; Kazuo Nozaki; Takuya Kurotaki; Yuichiro Kita; Kazuya Oguri
Influence of Ti addition (substitution for Cu) on Tc is studied for high Tc Bi1.6Pb0.4Sr2Ca2(Cu1−zTiz)3Ox. An abnormal Tc change is found between z=0.01 and 0.1. Based on results of the electrical resistivity and x‐ray diffraction, the abnormal Tc change is discussed.
Physics Letters A | 1989
Yoshitake Nishi; Yuichiro Kita; Akira Igarashi; Shigeki Tokunaga
Abstract The cooling rate ( R ) dependence of J c is investigated for high T c YBa 2 Cu 3 O 7- y . J c ( J c 60 K , J c 70 K and J c 80 K ) at different temperatures depends on R . We show the existence of an approximately linear relationship between superconductive values ( J c 60 K , J c 70 K and J c 80 K ) and R .
Physics Letters A | 1992
Yoshitake Nishi; Kazuo Nozaki; Takuya Kurotaki; Yuichiro Kita; Kazuya Oguri
Abstract Dependences of Ti addition on T off c are investigated for Bi 1.6 Pb 0.4 Sr 2 Ca 2 Cu 3 O x . Limits of Ti addition ( (compositional substitution for Cu, Pb, Bi, Sr and Ca) to maintain the high T off c are defined. Using the X-ray diffraction and electrical results, the dependences of Ti addition on T off c are discussed.
Physical Review B | 1990
Yoshitake Nishi; Kazuya Oguri; Hideo Ohinata; Kenji Tanioka; Yuichiro Kita; Nobuyuki Ninomiya
The effect of compressive stress on {ital T}{sub {ital c}} is studied for the low-{ital T}{sub {ital c}} Bi{sub 1.6}Pb{sub 0.4}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub {ital x}} phase. Although stress decreases the {ital T}{sub {ital c}} of the high-{ital T}{sub {ital c}} sample, the small compressive stress increases the {ital T}{sub {ital c}} of the low-{ital T}{sub {ital c}} phase. The maximum {ital T}{sub {ital c}}{sup off} is about 113.6 K at 0.01 mA/mm{sup 2} (current density) and 3.92 N/mm{sup 2} of the low-{ital T}{sub {ital c}} phase where {ital T}{sub {ital c}}{sup off} is 96.2 K before loading. The maximum {ital T}{sub {ital c}}{sup off} is larger than the unloaded value (109.3 K) of the high-{ital T}{sub {ital c}} Bi{sub 1.6}Pb{sub 0.4}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub {ital x}} sample. Based on the results of x-ray-diffraction, electrical-resistivity, and Seebeck-effect measurements, the {ital T}{sub {ital c}} is dominated by carrier concentration and crystal perfection of the lattice ordering.
Physical Review B | 1990
Yoshitake Nishi; Kazuya Oguri; Hideo Ohinata; Kenji Tanioka; Yuichiro Kita; Nobuyuki Ninomiya
The effect of compressive stress on {ital T}{sub {ital c}} is studied for the low-{ital T}{sub {ital c}} Bi{sub 1.6}Pb{sub 0.4}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub {ital x}} phase. Although stress decreases the {ital T}{sub {ital c}} of the high-{ital T}{sub {ital c}} sample, the small compressive stress increases the {ital T}{sub {ital c}} of the low-{ital T}{sub {ital c}} phase. The maximum {ital T}{sub {ital c}}{sup off} is about 113.6 K at 0.01 mA/mm{sup 2} (current density) and 3.92 N/mm{sup 2} of the low-{ital T}{sub {ital c}} phase where {ital T}{sub {ital c}}{sup off} is 96.2 K before loading. The maximum {ital T}{sub {ital c}}{sup off} is larger than the unloaded value (109.3 K) of the high-{ital T}{sub {ital c}} Bi{sub 1.6}Pb{sub 0.4}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub {ital x}} sample. Based on the results of x-ray-diffraction, electrical-resistivity, and Seebeck-effect measurements, the {ital T}{sub {ital c}} is dominated by carrier concentration and crystal perfection of the lattice ordering.
Physical Review B | 1990
Yoshitake Nishi; Kazuya Oguri; Hideo Ohinata; Kenji Tanioka; Yuichiro Kita; Nobuyuki Ninomiya
The effect of compressive stress on {ital T}{sub {ital c}} is studied for the low-{ital T}{sub {ital c}} Bi{sub 1.6}Pb{sub 0.4}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub {ital x}} phase. Although stress decreases the {ital T}{sub {ital c}} of the high-{ital T}{sub {ital c}} sample, the small compressive stress increases the {ital T}{sub {ital c}} of the low-{ital T}{sub {ital c}} phase. The maximum {ital T}{sub {ital c}}{sup off} is about 113.6 K at 0.01 mA/mm{sup 2} (current density) and 3.92 N/mm{sup 2} of the low-{ital T}{sub {ital c}} phase where {ital T}{sub {ital c}}{sup off} is 96.2 K before loading. The maximum {ital T}{sub {ital c}}{sup off} is larger than the unloaded value (109.3 K) of the high-{ital T}{sub {ital c}} Bi{sub 1.6}Pb{sub 0.4}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub {ital x}} sample. Based on the results of x-ray-diffraction, electrical-resistivity, and Seebeck-effect measurements, the {ital T}{sub {ital c}} is dominated by carrier concentration and crystal perfection of the lattice ordering.
Physical Review B | 1990
Yoshitake Nishi; Kazuya Oguri; Hideo Ohinata; Kenji Tanioka; Yuichiro Kita; Nobuyuki Ninomiya
Journal of Materials Science Letters | 1992
Y. Nishi; Kazuo Nozaki; Takuya Kurotaki; Yuichiro Kita; Kazuya Oguri
Journal of Materials Science Letters | 1988
Yoshitake Nishi; Yuichiro Kita; Akira Igarashi; Shigeki Tokunaga