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Dive into the research topics where Yuji Nagasawa is active.

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Featured researches published by Yuji Nagasawa.


Applied Surface Science | 1996

Comparison of AES chemical shifts with XPS chemical shifts

Tetsu Sekine; Nobuyuki Ikeo; Yuji Nagasawa

Abstract Scanning Auger microprobe equipped with a concentric hemispherical analyzer allows us to measure AES spectra with high-energy resolution. The question is the extent of chemical state information obtainable by AES. XPS chemical shifts and AES chemical shifts, derived from transition energies available from literature, have been compared for many compounds. The mean values were found to be for peak shift 1.71 eV in the case of XPS and −3.86 eV for AES, and the standard deviations were 2.38 eV for XPS and 3.62 eV for AES. We found that the chemical shifts in AES were generally 1.5 times larger than in XPS. For some elements such as Fe, Co, Ni, and Cu, the AES chemical shifts are exceptionally small, but the peak shapes differ depending on the chemical states.


Surface and Interface Analysis | 1989

Conversion of Auger sensitivities at one primary excitation energy to those at another

Tomoshige Sato; Yuji Nagasawa; Tetsu Sekine; Yuji Sakai; A. D. Buonaquisti


Surface and Interface Analysis | 1988

Topographic compensation in Auger electron spectroscopy

Tetsu Sekine; Tomoshige Sato; Yuji Nagasawa; Yuji Sakai


Journal of Surface Analysis | 2002

Automatic Background Estimation of Spectra

Yoshitaka Nagatsuka; Masayuki Otsuki; Yuji Nagasawa; Yoichiro Furukawa


Surface and Interface Analysis | 1995

Analysis of polymers by auger electron spectroscopy with a cold stage

Tetsu Sekine; Nobuyuki Ikeo; Yuji Nagasawa; Jun Kikuma


Hyomen Kagaku | 1992

Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy. Effects of Zalar Rotation and Liquid Nitrogen Cold Stage

Toshiya Ogiwara; Shigeo Tanuma; Yuji Nagasawa; Nobuyuki Ikeo


Hyomen Kagaku | 1987

Topographic Compensation in Auger Electron Spectroscopy

Tetsu Sekine; Tomoshige Sato; Yuji Nagasawa; Yuji Sakai


Journal of Surface Analysis | 2008

Practical methods for detecting peaks in auger electron spectroscopy and x-ray photoelectron spectroscopy

Y. Furukawa; Yoshitaka Nagatsuka; Yuji Nagasawa; Sei Fukushima; Michiko Yoshitake; A. Tanaka; Kagaku Kogyo


Journal of Surface Analysis | 2002

TASSAのたまご: Guide to some methods for detecting peaks in X-ray photoelectron spectroscopy and Auger electron spectroscopy

Yoshitaka Nagatsuka; Yuji Nagasawa; Akihiro Tanaka


Hyomen Kagaku | 1998

Development of AES/XPS Qualitative Analysis Software and Its Application

Yoshitaka Nagatsuka; Koji Yoshida; Yuji Nagasawa; Yoshiaki Ono

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Michiko Yoshitake

National Institute for Materials Science

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Sei Fukushima

National Institute for Materials Science

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