Yuji Nagasawa
JEOL Ltd.
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Featured researches published by Yuji Nagasawa.
Applied Surface Science | 1996
Tetsu Sekine; Nobuyuki Ikeo; Yuji Nagasawa
Abstract Scanning Auger microprobe equipped with a concentric hemispherical analyzer allows us to measure AES spectra with high-energy resolution. The question is the extent of chemical state information obtainable by AES. XPS chemical shifts and AES chemical shifts, derived from transition energies available from literature, have been compared for many compounds. The mean values were found to be for peak shift 1.71 eV in the case of XPS and −3.86 eV for AES, and the standard deviations were 2.38 eV for XPS and 3.62 eV for AES. We found that the chemical shifts in AES were generally 1.5 times larger than in XPS. For some elements such as Fe, Co, Ni, and Cu, the AES chemical shifts are exceptionally small, but the peak shapes differ depending on the chemical states.
Surface and Interface Analysis | 1989
Tomoshige Sato; Yuji Nagasawa; Tetsu Sekine; Yuji Sakai; A. D. Buonaquisti
Surface and Interface Analysis | 1988
Tetsu Sekine; Tomoshige Sato; Yuji Nagasawa; Yuji Sakai
Journal of Surface Analysis | 2002
Yoshitaka Nagatsuka; Masayuki Otsuki; Yuji Nagasawa; Yoichiro Furukawa
Surface and Interface Analysis | 1995
Tetsu Sekine; Nobuyuki Ikeo; Yuji Nagasawa; Jun Kikuma
Hyomen Kagaku | 1992
Toshiya Ogiwara; Shigeo Tanuma; Yuji Nagasawa; Nobuyuki Ikeo
Hyomen Kagaku | 1987
Tetsu Sekine; Tomoshige Sato; Yuji Nagasawa; Yuji Sakai
Journal of Surface Analysis | 2008
Y. Furukawa; Yoshitaka Nagatsuka; Yuji Nagasawa; Sei Fukushima; Michiko Yoshitake; A. Tanaka; Kagaku Kogyo
Journal of Surface Analysis | 2002
Yoshitaka Nagatsuka; Yuji Nagasawa; Akihiro Tanaka
Hyomen Kagaku | 1998
Yoshitaka Nagatsuka; Koji Yoshida; Yuji Nagasawa; Yoshiaki Ono