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Dive into the research topics where Yuji Wada is active.

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Featured researches published by Yuji Wada.


Archive | 2001

Fabrication method of semiconductor integrated circuit device and its testing apparatus

Naoto Ban; Masaaki Namba; Akio Hasebe; Yuji Wada; Ryuji Kohno; Akira Seito; Yasuhiro Motoyama


Archive | 2003

Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step

Ryuji Kohno; Tetsuo Kumazawa; Makoto Kitano; Akihiko Ariga; Yuji Wada; Naoto Ban; Shuji Shibuya; Yasuhiro Motoyama; Kunio Matsumoto; Susumu Kasukabe; Terutaka Mori; Hidetaka Shigi; Takayoshi Watanabe


Archive | 1998

IC testing apparatus and method

Yuji Wada; Kaoru Fukuda; Yoshio Kamiko; Masaaki Mochiduki


Archive | 1999

Interface unit for a tester and method of connecting a tester with a semiconductor device to be tested

Makoto Yanagawa; Yuji Wada; Keiji Muraju


Archive | 2001

Rare earth complex, optically functional material using the same and emission device

Shigeo Fujita; Seiya Hasegawa; Yoichi Kawakami; Junichi Shimada; Yuji Wada; Shozo Yanagida; 雄二 和田; 順一 島田; 養一 川上; 祥三 柳田; 茂夫 藤田; 靖哉 長谷川


Archive | 2005

METHOD FOR PRODUCING METAL PARTICULATE AND METAL PARTICULATE PRODUCED THEREBY

Yasunori Tsukahara; Yuji Wada; 雄二 和田; 保徳 塚原


Archive | 2007

METHOD FOR PRODUCING METAL NANOPARTICLE, SILVER/COPPER NANOPARTICLE, AND ELECTRICALLY CONDUCTIVE PASTE

Hisami Bessho; Yumi Kanbe; Takashi Nakamura; Yasunori Tsukahara; Yuji Wada; Tomohisa Yamauchi; 考志 中村; 久美 別所; 雄二 和田; 保徳 塚原; 智央 山内; 由美 神戸


Archive | 2009

Microwave chemical reaction device and reaction method using said device

Yasunori Tsukahara; 塚原保徳; Iwao Yoshino; 吉野巌; Kunitaka Momota; 百田邦堯; Yuji Wada; 和田雄二; Tomohisa Yamauchi; 山内智央


Archive | 2002

Packaging device for holding a plurality of semiconductor devices to be inspected

Ryuji Kohno; Hiroya Shimizu; Masatoshi Kanamaru; Atsushi Hosogane; Toshio Miyatake; Hideo Miura; Tatsuya Nagata; Yoshishige Endo; Masaaki Namba; Yuji Wada


Archive | 2000

Method of testing memory device, method of manufacturing memory device, apparatus for testing memory device, method of testing memory module, method of manufacturing memory module, apparatus for testing memory module and method of manufacturing computer

Hideyuki Aoki; Takeshi Wada; Masaaki Namba; Noboru Uchida; Shigeki Katsumi; Yuji Wada; Masaaki Mochiduki

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Shuntaro Tsubaki

Tokyo Institute of Technology

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