Yun-Jung Jee
Samsung
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Publication
Featured researches published by Yun-Jung Jee.
Analytical Chemistry | 2009
Kyung Joong Kim; Jong Shik Jang; Joo-Hee Lee; Yun-Jung Jee; Chung-Sam Jun
The thickness of nanometer Al(2)O(3) films was studied by X-ray photoelectron spectroscopy (XPS) and transmission electron microscopy (TEM). The thickness was determined from mutual calibration of the XPS and TEM measurements. The thickness offset of Al(2)O(3) films was proved to be close to zero by in situ XPS analysis. The thicknesses of a series of Al(2)O(3)/Si (100) films with different Al(2)O(3) thicknesses could be determined by mutual calibration from the thicknesses measured by TEM and XPS. The electron attenuation length of the Al 2p electron was determined as 2.4334 nm in the Al(2)O(3) matrix.
Archive | 2005
Tae-min Eom; Chung-sam Jun; Yu-Sin Yang; Yun-Jung Jee
Archive | 2005
Yun-Jung Jee; Chung-sam Jun; Yu-Sin Yang; Tae-kyoung Kim
Archive | 2004
Tae-min Eom; Yu-Sin Yang; Chung-sam Jun; Yun-Jung Jee; Joung-soo Kim; Moon-kyung Kim; Sang-mun Chon; Sun-Yong Choi
Archive | 2004
Tae-kyoung Kim; Yun-Jung Jee; Kyoung-Su Shin; Chung-sam Jun
Archive | 2007
Tae-min Eom; Chung-sam Jun; Yu-Sin Yang; Yun-Jung Jee
Archive | 2007
Byung-Sug Lee; Misung Lee; Yu-Sin Yang; Yun-Jung Jee; Chung-sam Jun
Archive | 2007
Tae-kyoung Kim; Yun-Jung Jee; Kyoung-Su Shin; Chung-sam Jun
Solid-state Electronics | 2013
Yun-Jung Jee; Chun-Yong Kim; Chung-sam Jun; Tae-Sung Kim; Anton Belyaev; Dmitriy Marinskiy
Archive | 2004
Yun-Jung Jee; Sun-Yong Choi; Chung-sam Jun; Kwan-Woo Ryu
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