Yusuke Kamada
Chitose Institute of Science and Technology
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Publication
Featured researches published by Yusuke Kamada.
IEEE Transactions on Components and Packaging Technologies | 2009
Makoto Hasegawa; Yoshinobu Tamaki; Yusuke Kamada
A minimum arc current value for each contact material is one of the very important factors in consideration and comparison of arc discharge characteristics for proper selection of contact materials. In this paper, Ag and Ag alloy contacts were operated to break various dc load currents in the range of up to 1.5 A with 10-30 V, and occurrence rates of break arcs (having durations equal to or longer than a few microseconds) were investigated at each condition. As a result, it is confirmed that at the conventional minimum arc current level, break arcs on the order of several tens of microseconds occur at occurrence rate close to 100% when sufficient energy is supplied to contacts upon opening. Thus, careful attention should be paid to when using the term ldquominimum arc currentrdquo in order to avoid misinterpretation.
IEICE Transactions on Electronics | 2005
Makoto Hasegawa; Yusuke Kamada
holm conference on electrical contacts | 2006
Makoto Hasegawa; Yoshinobu Tamaki; Yusuke Kamada
IEICE Transactions on Electronics | 2006
Makoto Hasegawa; Yusuke Kamada
Archive | 2002
T. Oikawa; N. Oyama; Yusuke Kamada; Yayoi N. Miura; Yoshio Koide; L. L. Lao; Anthony William Leonard; T.H. Osborne; Philip B. Snyder; R. J. Groebner
Nuclear Fusion | 2017
Y. Takase; A. Ejiri; Takaaki Fujita; N. Fukumoto; A. Fukuyama; K. Hanada; H. Idei; M. Nagata; Yasushi Ono; Hiromasa Tanaka; Masaki Uchida; Ritoku Horiuchi; Yusuke Kamada; H. Kasahara; S. Masuzaki; Y. Nagayama; Tetsutarou Oishi; K. Saito; Y. Takeiri; Shunji Tsuji-Iio
Journal of Plasma and Fusion Research | 2005
S. Shiraiwa; A. Ejiri; K. Hanada; M. Hasegawa; Hiroyuki Hoshika; H. Idei; Atsuhiro Iyomasa; Yusuke Kamada; H. Kasahara; Osamu Mitarai; Kazuo Nakamura; N. Nishino; H. Nozato; S. Ohara; K. Sasaki; M. Sakamoto; Kohnosuke Sato; Y. Takase; Yasunobu Takagi; Takuma Yamada; H. Zushi
IEICE Transactions on Electronics | 2005
M. Hasegawa; Yusuke Kamada
IEICE Transactions on Electronics | 2005
M. Hasegawa; Yusuke Kamada
電子情報通信学会技術研究報告. EMD, 機構デバイス | 2004
Yusuke Kamada; M. Hasegawa