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Featured researches published by Yves De Puydt.


Archive | 1992

A static SIMS study of the chemical modifications induced by plasma and flame treatments at the surface of polyolefins

Yves De Puydt; Didier Léonard; Patrick Bertrand

Static SIMS (SSIMS) has been used as an analytical tool for the study of the physicochemical changes following the surface treatments of polyolefin samples. First, the influence of the treatment duration has been investigated for nitrogen plasma and flame treated polypropylene (PP). Then, in order to confirm the interpretation of these SSIMS results, the influence of the plasma atmosphere and of the treatment duration on the surface modifications has been studied for hexatriacontane (C36H74), a model compound of linear saturated hydrocarbons. SSIMS results are discussed in light of the other complementary physicochemical characterizations presented previously, namely, surface energy measurements and XPS analyses.


Archive | 1991

Use of Ionic Spectrometries for the Study of the Metal/Polymer Interface

Yves De Puydt; Phuati Phuku; Patrick Bertrand

The study of metallized polymers samples elaborated in industrial and laboratory conditions, has allowed to determine the key parameters which govern the properties of evaporated metal films on polymers. The metal-polymer adhesion has been evaluated by the peel test and the scratch test methods. The chemical composition of the thin metal layers evaporated on polymers substrates was determined with the help of SIMS and RBS; their microstructure was studied by electron microscopy (TEM). Furthermore, ISS has been used in order to determine the locus of failure during the peel test procedure and also in order to study the early stages of the metal growth on different polymers substrates. An attempt to rely these macroscopic and microscopic properties of metallized polymers is proposed. It is shown that the control of these properties depends not only on the physico-chemical properties of the polymers substrates but also on the metallization conditions.


Archive | 1991

SIMS surface analysis of PET: degradation development

Didier Léonard; Yves De Puydt; Patrick Bertrand

Semi-crystalline industrial polyethylene terephthalate (PET) has been analyzed, directly or after an ionic prebombardment, by Static SIMS spectrometry using 4 keV Xe ions. The prebombardment doses cover approximately one order of magnitude from 1.8 x 1013 ions/cm2 (dose for a direct SSIMS spectrum) to 1.8 x 1014 ions/cm2. By comparing the spectra using differences it is shown that, for the mentioned doses, the major features of the appearing degradation are, on the one hand, crosslinking and/or graphitization and, on the other hand, unsaturation. These features are studied as a function of the ionic dose and the polymer characteristics.


Le Vide, les couches minces | 1993

Etude "in situ" de la formation de l'interface métal-polymère par spectrométries ioniques ISS et SIMS statique

Patrick Bertrand; Youssef Travaly; Yves De Puydt


Electrochemical Society Fourth symposium on Metallized Plastics: fundamental and applied aspects | 1993

In situ study of the metal-polymer interface formation by static SIMS. Cases of Al and Cu on PET

Youssef Travaly; Yves De Puydt; Patrick Bertrand


Archive | 1991

Use of ionic spectrometries for the study of the polymer / metal interface

Yves De Puydt; Edmond Phuku-Phuati; Patrick Bertrand


CIP 91 [Colloque international sur les procédés plasma] | 1991

Characterization of polymer surfaces by means of the ionic spectrometries : ISS and static SIMS

Patrick Bertrand; Yves De Puydt; Didier Léonard; Lutao Weng


Le vide, Les couches minces | 1989

In situ metallization of polypropylene films pretreated in N2 or NH3 low pressure plasma

V. Andre; F. Arefi; J. Amouroux; Yves De Puydt; Patrick Bertrand; G Lorang


Vide, les Couches Minces | 1988

Influence du traitement "couronne" sur la composition de surface du polyéthylène téréphthalate

Yves De Puydt; Y. Novis; M. Chtaib; Patrick Bertrand; P. Lutgen; Gusty Feyder


Archive | 1988

Deph profiling on Ta2O5 thin layer on Ta foil by ion scattering spectrometry

F. Rummens; Patrick Bertrand; Yves De Puydt

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Patrick Bertrand

Université catholique de Louvain

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Didier Léonard

Université catholique de Louvain

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Youssef Travaly

Université catholique de Louvain

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F. Rummens

Université catholique de Louvain

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Lutao Weng

Hong Kong University of Science and Technology

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G Lorang

Centre national de la recherche scientifique

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