Zainalabedin Navabi
University of Tehran
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Zainalabedin Navabi.
Journal of Systems Architecture | 2010
Pejman Lotfi-Kamran; Amir-Mohammad Rahmani; Masoud Daneshtalab; Ali Afzali-Kusha; Zainalabedin Navabi
In this paper, an adaptive routing algorithm for two-dimensional mesh network-on-chips (NoCs) is presented. The algorithm, which is based on Dynamic XY (DyXY), is called Enhanced Dynamic XY (EDXY). It is congestion-aware and more link failure tolerant compared to the DyXY algorithm. On contrary to the DyXY algorithm, it can avoid the congestion when routing from the current switch to the destination whose X position (Y position) is exactly one unit apart from the switch X position (Y position). This is achieved by adding two congestion wires (one in each direction) between each two cores which indicate the existence of congestion in a row (column). The same wires may be used to alarm a link failure in a row (column). These signals enable the routing algorithm to avoid these paths when there are other paths between the source and destination pair. To assess the latency of the proposed algorithm, uniform, transpose, hotspot, and realistic traffic profiles for packet injection are used. The simulation results reveal that EDXY can achieve lower latency compared to those of other adaptive routing algorithms across all workloads examined, with a 20% average and 30% maximum latency reduction on SPLASH-2 benchmarks running on a 49-core CMP. The area of the technique is about the same as those of the other routing algorithms.
defect and fault tolerance in vlsi and nanotechnology systems | 2007
Armin Alaghi; Naghmeh Karimi; Mahshid Sedghi; Zainalabedin Navabi
This paper presents an efficient method for online testing of NoC switches. This method deals with control faults of NoC switches; i.e. the routing faults which cause NoC packets to be sent to output ports not intended to. A high level fault model has been proposed in this paper to model switch routing faults. The proposed method is evaluated by fault simulation that is based on our high-level fault model. This simulation and evaluation environment is modeled at the transaction level in VHDL.
design, automation, and test in europe | 2006
Mohammad Hosseinabady; Abbas Banaiyan; Mahdi Nazm Bojnordi; Zainalabedin Navabi
This paper proposes reuse of on-chip networks for testing switches in network on chips (NoCs). The proposed algorithm broadcasts test vectors of switches through the on-chip networks and detects faults by comparing output responses of switches with each other. This algorithm alleviates the need for: (1) external comparison of the output response of the circuit-under-test with the response of a fault free circuit stored on a tester (2) on-chip signature analysis (3) a dedicated test-bus to reach test vectors and collect their responses. Experimental results on a few test benches compare the proposed algorithm with traditional system on chip (SoC) test methods
design, automation, and test in europe | 2008
Pejman Lotfi-Kamran; Masoud Daneshtalab; Caro Lucas; Zainalabedin Navabi
A novel routing algorithm, named balanced adaptive routing protocol (BARP), is proposed for NoCs to provide adaptive routing and ensure deadlock-free and livelock-free routing at the same time. By evenly distributing input packets of a router among all its shortest path output ports, a novel adaptive routing protocol for avoiding congestion condition emerges. It is observed that BARP can achieve better performance compared to static XY routing, odd- even routing and dynamic XY routing.
international on line testing symposium | 2008
Fatemeh Refan; Homa Alemzadeh; Saeed Safari; Paolo Ernesto Prinetto; Zainalabedin Navabi
Networks on chips (NoCs) provide a mechanism for handling complex communications in the next generation of integrated circuits. At the same time, lower yield in nano-technology, makes self repair communication channels a necessity in design of digital systems. This paper proposes a reliable NoC architecture based on specific application mapped onto an NoC. This architecture is capable of recovering from permanent switch failures via replacing them by neighboring switches. This method has hardware and power consumption overhead, but significantly improves reliability and has a very little effect on the performance of the system. We suggest a reliability analysis method based on the combinatorial reliability models and use it to evaluate our proposed fault-tolerant NoC architecture.
application-specific systems, architectures, and processors | 2006
Masoud Daneshtalab; Ashkan Sobhani; Ali Afzali-Kusha; Omid Fatemi; Zainalabedin Navabi
In this paper, a routing model for minimizing hot spots in the network on chip (NOC) is presented. The model makes use of AntNet routing algorithm which is based on Ant colony. Using this algorithm, which we call AntNet routing algorithm, heavy packet traffics are distributed on the chip minimizing the occurrence of hot spots. To evaluate the efficiency of the scheme, the proposed algorithm was compared to the XY, Odd- Even, and DyAD routing models. The simulation results show that in realistic (Transpose) traffic as well as in heavy packet traffic, the proposed model has less average delay and peak power compared to the other routing models. In addition, the maximum temperature in the proposed algorithm is less than those of the other routing algorithms.
design, automation, and test in europe | 2005
Shervin Sharifi; Javid Jaffari; Mohammad Hosseinabady; Ali Afzali-Kusha; Zainalabedin Navabi
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in future technologies the static portion of power dissipation will outreach the dynamic portion. This paper proposes an efficient technique to reduce both dynamic and static power dissipation in scan structures. Scan cell outputs which are not on the critical path(s) are multiplexed to fixed values during scan mode. These constant values and primary inputs are selected such that the transitions occurring on nonmultiplexed scan cells are suppressed and the leakage current during scan mode is decreased. A method for finding these vectors is also proposed. The effectiveness of this technique is proved by experiments performed on ISCAS89 benchmark circuits.
TAEBC-2011 | 2011
Zainalabedin Navabi
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
design, automation, and test in europe | 2007
Mohammad Hosseinabady; Atefe Dalirsani; Zainalabedin Navabi
This paper proposes an efficient test methodology to test switches in a network-on-chip (NoC) architecture. A switch in a NoC consists of a number of ports and a router. Using the intra-switch regularity among ports of a switch and inter-switch regularity among routers of switches, the proposed method decreases the test application time and test data volume of NoC testing. Using a test source to generate test vectors and scan-based testing, this methodology broadcasts test vectors through the minimum spanning tree of the NoC and concurrently tests its switches. In addition, a possible fault is detected by comparing test results using inter- or intra- switch comparisons. The logic and memory parts of a switch are tested by appropriate memory and logic testing methods. Experimental results show less test application time and test power consumption, as compared with other methods in the literature
design, automation, and test in europe | 2008
Pejman Lotfi-Kamran; Masoud Daneshtalab; Caro Lucas; Zainalabedin Navabi
A novel routing algorithm, named Balanced Adaptive Routing Protocol (BARP), is proposed for NoCs to provide adaptive routing and ensure deadlock-free and livelock-free routing at the same time. By evenly distributing input packets of a router among all its shortest path output ports, a novel adaptive routing protocol for avoiding congestion condition emerges. It is observed that BARP can achieve better performance compared to static XY routing, oddeven routing and dynamic XY routing.