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Dive into the research topics where Zheng Xue-ren is active.

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Featured researches published by Zheng Xue-ren.


Review of Scientific Instruments | 1997

A two-dimensional flow sensor using integrated silicon spreading-resistance temperature detectors

Liu Baiyong; P. T. Lai; Zheng Xue-ren; Wu Zhaohui; Li Bin

A simple silicon two-dimensional (2D) flow sensor for the measurement of both flow direction and speed is described. By integrating two couples of silicon spreading-resistance temperature (SRT) sensors in two perpendicular directions on the surface of a silicon chip, this sensor can detect flow speed and flow direction φ in a full range of 360°. Experimental results confirm theoretical analysis that the output of the sensor increases with the square root of the flow velocity, and the outputs in the two perpendicular directions are proportional to sin φ and cos φ, respectively. The effects of sensor layout are also discussed. With complete oxide isolation for the SRT sensors, the flow sensor could achieve higher sensitivity by operating above the intrinsic temperature of silicon (∼150 °C), or could be used to detect fluid flow at a temperature as high as 300 °C.


Journal of Semiconductors | 2009

Modeling of self-heating effects in polycrystalline silicon thin film transistors

Deng Wanling; Zheng Xue-ren

An analytical DC model accounting for the self-heating effect of polycrystalline silicon thin-film transistors (poly-Si TFTs) is presented. In deriving the model for the self-heating effect, the temperature dependence of the effective mobility is studied in detail. Based on the mobility model and a first order approximation, a closed-form analytical drain current model considering the self-heating effect is derived. Compared with the available experimental data, the proposed model, which includes the self-heating and kink effects, provides an accurate description of the output characteristics over the linear, the saturation, and the kink regimes.


Journal of Semiconductors | 2011

Analytical drain current model for amorphous IGZO thin-film transistors in above-threshold regime

He Hongyu; Zheng Xue-ren

An analytical drain current model is presented for amorphous In-Ga-Zn-oxide thin-film transistors in the above-threshold regime, assuming an exponential trap states density within the bandgap. Using a charge sheet approximation, the trapped and free charge expressions are calculated, then the surface potential based drain current expression is developed. Moreover, threshold voltage based drain current expressions are presented using the Taylor expansion to the surface potential based drain current expression. The calculated results of the surface potential based and threshold voltage based drain current expressions are compared with experimental data and good agreements are achieved.


Science Technology and Engineering | 2007

Thermal Resistance Calculation Method of High-power LEDs

Zheng Xue-ren


Journal of Semiconductors2007, Vol. 28, Pages 1916-1923 | 2007

A New Poly-Si TFTs DC Model for Device Characterization and Circuit Simulation

Deng Wanling; Zheng Xue-ren; Chen Rongsheng


Archive | 1999

Electromagnetic range with microprocessor to control zero-cross power and its control method

Huang Mingwen; Zheng Xue-ren; Liu Baiyong


Video Engineering | 2011

Design of Tri-Rate SDI Based on FPGA

Zheng Xue-ren


Microelectronics | 2011

Study on Metastability in FPGA Design

Zheng Xue-ren


Electronics & Packaging | 2009

4 Gbps Low Power Serializer CMOS IC

Zheng Xue-ren


Electronic Product Reliability and Environmental Testing | 2009

Improving the Reliability of Power MOSFET Package

Zheng Xue-ren

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Liu Baiyong

South China University of Technology

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Wu Zhaohui

South China University of Technology

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He Hongyu

Guangdong University of Technology

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Li Bin

South China University of Technology

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Liang Zhiming

South China University of Technology

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Liu Yi

South China University of Technology

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P. T. Lai

University of Hong Kong

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