Zhou Zhehai

Multiple optical trapping based on high-order axially symmetric polarized beams

Multiple optical trapping with high-order axially symmetric polarized beams (ASPBs) is studied theoretically, and a scheme based on far-field optical trapping with ASPBs is first proposed. The focused fields and the corresponding gradient forces on Rayleigh dielectric particles are calculated for the scheme. The calculated results indicate that multiple ultra-small focused spots can be achieved, and multiple nanometer-sized particles with refractive index higher than the ambient can be trapped simultaneously near these focused spots, which are expected to enhance the capabilities of traditional optical trapping systems and provide a solution for massive multiple optical trapping of nanometer-sized particles.

Experimental verification on tightly focused radially polarized vortex beams

The theoretical and experimental results of tightly focused radially polarized vortex beams are demonstrated. An auto-focus technology is introduced into the measurement system in order to enhance the measurement precision, and the radially polarized vortex beams are generated by a liquid-crystal polarization converter and a vortex phase plate. The focused fields of radially polarized vortex beams with different topological charges at numerical apertures (NAs) of 0.65 and 0.85 are measured respectively, and the results indicate that the total intensity distribution at focus is dependent not only on the NA of the focusing objective lens and polarization pattern of the beam but also on the topological charge l of the beam. Some unique focusing properties of radially polarized vortex beams with fractional topological charges are presented based on numerical calculations. The experimental verification paves the way for some practical applications of radially polarized vortex beams, such as in optical trapping, near-field microscopy, and material processing.

Tight focusing of axially symmetric polarized vortex beams

Tight focusing of axially symmetric polarized vortex beams is studied numerically based on vector diffraction theory. The mathematical expressions for the focused fields are derived. Simulation results show that the focused fields and phase distributions at focus are largely influenced by both the polarization order and topological charge of the incident beams. Moreover, focal spots with flat-topped or tightly-focused patterns can be flexibly achieved by carefully choosing the polarization order and the topological charge, which confirms the potential of such beams in wide applications, such as optical tweezers, laser printing, lithography, and material processing.