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Dive into the research topics where A. A. Kozlov is active.

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Featured researches published by A. A. Kozlov.


Optics Letters | 2004

Demonstration of coherent addition of multiple gratings for high-energy chirped-pulse-amplified lasers

Terrance J. Kessler; J. Bunkenburg; Hu Huang; A. A. Kozlov; D. D. Meyerhofer

Petawatt solid-state lasers require meter-sized gratings to reach multiple-kilojoule energy levels without laser-induced damage. As an alternative to large single gratings, we demonstrate that smaller, coherently added (tiled) gratings can be used for subpicosecond-pulse compression. A Fourier-transform-limited, 650-fs chirped-pulse-amplified laser pulse is maintained by replacing a single compression grating with a tiled-grating assembly. Grating tiling provides a means to scale the energy and irradiance of short-pulse lasers.


Optics Express | 2012

Stress compensation in hafnia/silica optical coatings by inclusion of alumina layers

James B. Oliver; Pete Kupinski; Amy L. Rigatti; Ansgar W. Schmid; John C. Lambropoulos; Semyon Papernov; A. A. Kozlov; C. Smith; Robert D. Hand

Hafnium dioxide films deposited using electron-beam evaporation tend to exhibit high tensile stresses, particularly when deposited on low-thermal-expansion substrates for use in a low-relative-humidity environment. Hafnia has been shown to be a critical material, however, for use in high-peak-power laser coatings, providing exceptional deposition control and laser-damage resistance. To correct for tensile thin-film stresses in hafnia/silica multilayer coatings, alumina compensation layers were incorporated in the multilayer design. Determination of the stresses resulting from alumina layers in different coating designs has led to the realization of the influence of water diffusion and the diffusion-barrier properties of alumina that must be considered. The inclusion of alumina layers in a hafnia/silica multilayer provides the ability to produce low-compressive-stress, high-laser-damage-threshold coatings.


Applied Optics | 2013

Improving the performance of high-laser-damage-threshold, multilayer dielectric pulse-compression gratings through low-temperature chemical cleaning

H.P. Howard; Anthony F. Aiello; Justin G. Dressler; Nicholas R. Edwards; Terrance J. Kessler; A. A. Kozlov; Ian R. T. Manwaring; Kenneth L. Marshall; James B. Oliver; Semyon Papernov; Amy L. Rigatti; Alycia Roux; Ansgar W. Schmid; Nicholas P. Slaney; Christopher C. Smith; B. Taylor; Stephen D. Jacobs

A low-temperature chemical cleaning approach has been developed to improve the performance of multilayer dielectric pulse-compressor gratings for use in the OMEGA EP laser system. X-ray photoelectron spectroscopy results guided the selection of targeted cleaning steps to strip specific families of manufacturing residues without damaging the gratings fragile 3D profile. Grating coupons that were cleaned using the optimized method consistently met OMEGA EP requirements on diffraction efficiency and 1054 nm laser-damage resistance at 10 ps. The disappearance of laser-conditioning effects for the highest-damage-threshold samples suggests a transition from a contamination-driven laser-damage mechanism to defect-driven damage for well-cleaned components.


Applied Optics | 2011

Large-aperture plasma-assisted deposition of inertial confinement fusion laser coatings

James B. Oliver; Pete Kupinski; Amy L. Rigatti; Ansgar W. Schmid; John C. Lambropoulos; Semyon Papernov; A. A. Kozlov; John Spaulding; Daniel Sadowski; Z. Roman Chrzan; Robert D. Hand; Desmond Gibson; Ian Brinkley; Frank Placido

Plasma-assisted electron-beam evaporation leads to changes in the crystallinity, density, and stresses of thin films. A dual-source plasma system provides stress control of large-aperture, high-fluence coatings used in vacuum for substrates 1m in aperture.


in Laser-Induced Damage in Optical Materials: 2005, edited by G. J. Exarhos, A. H. Guenther, K. L. Lewis, D. Ristau, M. J. Soileau, and C. J. Stolz (SPIE, Bellingham, WA, 2005) | 2005

Thin-film polarizers for the OMEGA EP laser system

J. B. Oliver; Amy L. Rigatti; Jim Howe; J. Keck; J. Szczepanski; Ansgar W. Schmid; Semyon Papernov; A. A. Kozlov; T.Z. Kosc

Thin-film polarizers are essential components of large laser systems such as OMEGA EP and the NIF because of the need to switch the beam out of the primary laser cavity (in conjunction with a plasma-electrode Pockels cell) as well as providing a well-defined linear polarization for frequency conversion and protecting the system from back-reflected light. The design and fabrication of polarizers for pulse-compressed laser systems is especially challenging because of the spectral bandwidth necessary for chirped-pulse amplification. The design requirements for a polarizer on the OMEGA EP Laser System include a Tp greater than 98% over a spectral range of 1053±4 nm while maintaining a contrast ratio (Tp/Ts) of greater than 200:1 (500:1 goal) over the same range. An allowance must be made for the uniformity of the film deposition such that the specifications are met over the aperture of the component while allowing for some tolerance of angular misalignment. Production results for hafnia/silica designs will be shown, illustrating high transmission and contrast over an extended wavelength/angular range suitable for the 8 nm spectral bandwidth of OMEGA EP. Difficulties in production will also be illustrated, as well as the methods being implemented to overcome these challenges. A key challenge continues to be the fabrication of such a coating suitable for use on fused-silica substrates in a dry environment. Laser-damage thresholds for 1-ns and 10-ps pulse widths will be discussed.


in Laser-Induced Damage in Optical Materials: 2005, edited by G. J. Exarhos, A. H. Guenther, K. L. Lewis, D. Ristau, M. J. Soileau, and C. J. Stolz (SPIE, Bellingham, WA, 2005) | 2005

Manufacture and development of multilayer diffraction gratings

J. Keck; James B. Oliver; Terrance J. Kessler; H. Huang; J. Barone; J. Hettrick; Amy L. Rigatti; T. Hoover; Kenneth L. Marshall; Ansgar W. Schmid; A. A. Kozlov; T.Z. Kosc

The OMEGA EP Facility includes two high-energy, short-pulse laser beams that will be focused to high intensity in the OMEGA target chamber, providing backlighting of compressed fusion targets and investigating the fast-ignition concept. To produce 2.6-kJ output energy per beam, developments in grating compressor technology are required. Gold-coated diffraction gratings limit on-target energy because of their low damage fluence. Multilayer dielectric (MLD) gratings have shown promise as high-damage-threshold, high-efficiency diffraction gratings suitable for use in high-energy chirped-pulse amplification [ B. W. Shore et al., J. Opt. Soc. Am. A 14, 1124 (1997).] Binary 100-mm-diam MLD gratings have been produced at the Laboratory for Laser Energetics (LLE) using large-aperture, holographic exposure and reactive ion-beam etching systems. A diffraction efficiency of greater than 99.5% at 1053 nm has been achieved for gratings with 1740 grooves/mm, with a 1:1 damage threshold of 5.49 J/cm2 diffracted beam fluence at 10 ps. To demonstrate the ability to scale up to larger substrates, several 100-mm substrates have been distributed over an aperture of 47 × 43 cm and successfully etched, resulting in high efficiency over the full aperture. This paper details the manufacture and development of these gratings, including the specifics of the MLD coating, holographic lithography, reactive ion etching, reactive ion-beam cleaning, and wet chemical cleaning.


Optics Express | 2006

Formation of periodic microstructures on multilayer dielectric gratings prior to total ablation

T. Z. Kosc; A. A. Kozlov; Ansgar W. Schmid

The damage morphology produced by high-power, short-pulse lasers on multilayer dielectric (MLD) gratings has been closely examined. An unusual ripple formation arises under specific laser fluence conditions and produces a bright diffractive effect. A single irradiation does not produce this morphology, proving that it is a cumulative effect requiring multiple laser shots on a test site. The period of this microstructure is found to be between 2.0 and 2.4 mum. The ripple orientation varies across the test site. Varying several experimental conditions such as pulse length, beam polarization and angle of incidence still produces this periodic microstructure, though not always efficiently. This morphology is not seen on MLD stacks or other homogeneous samples.


Boulder Damage Symposium XXXVIII: Annual Symposium on Optical Materials for High Power Lasers | 2006

Evaluation of cleaning methods for multilayer diffraction gratings

B. Ashe; Kenneth L. Marshall; C. Giacofei; Amy L. Rigatti; Terrance J. Kessler; Ansgar W. Schmid; J. B. Oliver; J. Keck; A. A. Kozlov

Multilayer dielectric (MLD) diffraction gratings are an essential component for the OMEGA EP short-pulse, highenergy laser system. The MLD gratings must have both high-optical-diffraction efficiency and high laser-damage threshold to be suitable for use within the OMEGA EP Laser System. Considerable effort has been directed toward optimizing the process parameters required to fabricate gratings that can withstand the 2.6-kJ output energy delivered by each beam. In this paper, we discuss a number of conventional semiconductor chemical cleaning processes that have been investigated for grating cleaning, and present evidence of their effectiveness in the critical cleaning of MLD gratings fabricated at LLE. Diffraction efficiency and damage-threshold data were correlated with both scanning electron microscopy (SEM) and time-of-flight secondary ion-mass spectrometry (ToF-SIMS) to determine the best combination of cleaning process and chemistry. We found that using these cleaning processes we were able to exceed both the LLE diffraction efficiency (specification >97%) and laser-damage specifications (specification >2.7 J/cm2).


in Laser-Induced Damage in Optical Materials: 2005, edited by G. J. Exarhos, A. H. Guenther, #R##N#K. L. Lewis, D. Ristau, M. J. Soileau, and C. J. Stolz (SPIE, Bellingham, WA, 2005) | 2005

Thin-film design for multilayer diffraction gratings

James B. Oliver; Terrance J. Kessler; H. Huang; J. Keck; Amy L. Rigatti; Ansgar W. Schmid; A. A. Kozlov; T.Z. Kosc

Multilayer dielectric (MLD) diffraction gratings are a key component for the construction of high-peak-power, pulse-compressed laser systems. While a great deal of effort has been devoted to the design of optimal grating structures and the etching of these structures into the MLD coating, there has not been the same effort put into the optimization of the MLD coating itself. The primary characteristics of the multilayer that must be considered during design include minimization of the standing wave created in the photoresist because of the reflectivity of the coated optical surface, creation of a sufficiently high reflectivity at the use wavelength and incidence angle in a dry environment, proper balance of the individual layer materials to yield a coating with an overall neutral or slightly compressive stress, and a high laser-damage threshold for the wavelength and pulse duration of use. This work focuses on the modification of a standard MLD mirror, while considering these characteristics, to allow the fabrication of a diffraction grating with higher efficiency and laser-damage threshold than is typically achieved. Scanning electron microscopy (SEM) images of the grating structures demonstrate smoother shapes with lower roughness due to the holographic exposure. Damage testing performed at 1053 nm with a pulse width of 10 ps demonstrates the MLD coating has a sufficiently high laser-damage threshold to form the basis of reflection gratings that survive in high-fluence applications.


Optical Engineering | 2014

Near-ultraviolet absorption annealing in hafnium oxide thin films subjected to continuous-wave laser radiation

Semyon Papernov; A. A. Kozlov; James B. Oliver; Terrance J. Kessler; Alexander A Shvydky; Brendan T. Marozas

Abstract. Hafnium oxide (HfO2) is the most frequently used high-index material in multilayer thin-film coatings for high-power laser applications ranging from near-infrared to near-ultraviolet (UV). Absorption in this high-index material is also known to be responsible for nanosecond-pulse laser-damage initiation in multilayers. In this work, modification of the near-UV absorption of HfO2 monolayer films subjected to irradiation by continuous-wave (cw), 355-nm or 351-nm laser light focused to produce power densities of the order of ∼100  kW/cm2 is studied. Up to a 70% reduction in absorption is found in the areas subjected to irradiation. Temporal behavior of absorption is characterized by a rapid initial drop on the few-tens-of-seconds time scale, followed by a longer-term decline to a steady-state level. Absorption maps generated by photothermal heterodyne imaging confirm the permanent character of the observed effect. Nanosecond-pulse, 351-nm and 600-fs, 1053-nm laser-damage tests performed on these cw laser–irradiated areas confirm a reduction of absorption by measuring up to 25% higher damage thresholds. We discuss possible mechanisms responsible for near-UV absorption annealing and damage-threshold improvement resulting from irradiation by near-UV cw laser light.

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J. B. Oliver

University of Rochester

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