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Archive | 1991

X-Ray Methods

A. Markowicz; René Van Grieken

Two groups of X-ray methods are now widely applied to the study of environmental samples for geochemistry and pollution investigations, X-ray emission spectrometry (XRS) and X-ray diffraction (XRD), and the underlying physical principles of these methods and their limitations are well understood. XRD is indispensable for the investigation of the crystal structure of matter. Since the wavelengths of X-rays are of the same order of magnitude as the distances between atoms in a crystal (approximately 10-10 m), the diffraction effects provide a detailed picture of the contents of the crystal at the atomic level. Using XRD measurements one can determine the crystal structure (interatomic distances, bond angles, planarity of a particular group of atoms and angles between planes) and perform a quantitative chemical analysis (speciation) as well.


Analytical Chemistry | 1984

Composition dependence of Bremsstrahlung background in electron-probe X-ray microanalysis

A. Markowicz; René Van Grieken


Physical and chemical characterization of individual airborne particles / Spurny, K.R. [edit.] | 1986

Analytical electron microscopy of single particles

A. Markowicz; B. Raeymaekers; R. Van Grieken; F. Adams


X-Ray Spectrometry | 1980

Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis

A. Markowicz; P. Van Dyck; R. Van Grieken


X-Ray Spectrometry | 1985

Influence of sample thickness, excitation energy and geometry on particle size effects in XRF

P. Van Dyck; A. Markowicz; R. Van Grieken


X-Ray Spectrometry | 1980

Automatic absorption correction in x‐ray fluorescence analysis of intermediate thickness samples using a dual external reference signal

P. Van Dyck; A. Markowicz; R. Van Grieken


X-Ray Spectrometry | 1991

Current trends in the literature on x-ray emission spectrometry

R. Van Grieken; A. Markowicz; P. Veny


Analytical Chemistry | 1985

Bremsstrahlung background in electron probe x-ray microanalysis of thin films

A. Markowicz; H. Storms; René Van Grieken


Analytical Chemistry | 1984

Atomic number correction in electron-probe X-ray microanalysis of curved samples and particles

A. Markowicz; René Van Grieken


X-Ray Spectrometry | 1986

Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples

A. Markowicz; H. Storms; R. Van Grieken

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H. Storms

University of Antwerp

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P. Veny

University of Antwerp

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