Albert R. Toft
Goddard Space Flight Center
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Featured researches published by Albert R. Toft.
Applied Optics | 1988
Ritva A. M. Keski-Kuha; John F. Osantowski; Howard Herzig; Jeffrey S. Gum; Albert R. Toft
Results are presented from an experimental investigation of the normal-incidence reflectance at 58.4, 92.0, and 121.6 nm wavelength of 30- and 80-nm-thick SiC films produced by ion-beam deposition on unheated 5 x 5-cm microscope slides. The films were deposited in the 2-m evaporator described by Bradford et al. (1969) with chamber base pressure 1 microtorr, operating pressure 40 microtorr, and a 50-62-mA 750-eV Ar ion beam; the reflectance measurements were obtained in the reflector-monochromator system described by Osantowski (1974). Reflectances of over 30 percent were found at 92 and 121.6 nm, almost equal to those of polished CVD films of SiC and degrading only slightly after aging for 4 months. It is suggested that ion-beam deposition may be the best low-temperature technique for coating EUV optics for space astronomy.
Applied Optics | 1969
A. P. Bradford; G. Hass; John F. Osantowski; Albert R. Toft
The design and features of a 2-m evaporator suitable for coating large mirrors uniformly with Al + MgF(2) and Al + LiF films of high reflectance in the vacuum uv are described. The techniques used for monitoring film thicknesses during the film deposition and for producing films of uniform thicknesses over large areas are discussed. It is shown that the Al films for MgF(2)_ and LiF-protected mirrors of highest reflectance in the vacuum uv down to 1000 A should be 700-800 A thick. Data on the vacuum uv reflectance of Al coated with MgF(2) films of various thicknesses are presented. It was found that mirror coatings prepared in a large evaporator have a higher reflectance in the vacuum uv than those deposited under the same vacuum and deposition conditions in a small vacuum unit. At lambda = 1216 A, the reflectance of Al overcoated with 250 A of MgF(2) was measured to be about 85%.
Applied Optics | 1979
G. Hass; James B. Heaney; Albert R. Toft
Thin transparent films of In2O3 or In2O3 + SnO2 prepared by evaporation or sputtering have been tested for use as surface layers for spacecraft temperature control coatings. The films are intended to prevent nonuniform electric charge buildup on the spacecraft exterior. Film thicknesses of 300 to 500 A were found to be optimal in terms of durability and minimum impact on the solar absorptance and the thermal emissivity of the underlayers. As a verification of their suitability for long-duration space missions, the films were subjected to simulated solar UV plus proton irradiation in a vacuum.
Applied Optics | 1993
Howard Herzig; Albert R. Toft; Charles M. Fleetwood
We flew specimens of eight different optical coating materials in low earth orbit as part of the Long Duration Exposure Facility manifest to determine their ability to withstand exposure to the residual atomic O and other environmental effects at those altitudes. We included samples of Al, Au, Ir, Os, Pt, Al + MgF(2), Al + SiO(x), and chemical-vapor-deposited SiC, representing reflective optical applications from the vacuum ultraviolet through the visible portions of the spectrum. We found that the majority of the materials suffered sufficient reflectance degradation to warrant careful consideration in the design of future space-flight instrumentation.
Advances in Space Research | 1991
John F. Osantowski; Ritva A. M. Keski-Kuha; Howard Herzig; Albert R. Toft; Jeffrey S. Gum; Charles M. Fleetwood
Abstract Advances in optical coating and materials technology have been one of the key motivators for the development of missions such as the Far Ultraviolet Spectroscopic Explorer recently selected by NASA for an Explorer class mission in the mid 1990s. We review the performance of a range of candidate coatings for normal incidence and glancing incidence applications, and discuss strengths and problem areas for their use in space. The importance of recent developments in multilayer films, chemical vapor deposited SiC (CVD-SiC) mirrors, and SiC films are discussed in the context of EUV instrumentation design. For example, the choice of optical coatings is a design driver for the selection of the average glancing angle for the FUSE telescope, and impacts efficiency, short wavelength cut-off, and physical size.
Applied Optics | 1985
T. R. Gull; Howard Herzig; John F. Osantowski; Albert R. Toft
A number of samples of optical thin film materials were flown on Shuttle flight STS-8 as part of an experiment to evaluate their interaction with residual atomic oxygen in low earth orbit. Osmium was selected because of its usefulness as a reflective optical coating for far-UV instruments and for confirmation of results from previous Shuttle flights in which such coatings disappeared. Reflectance data and photographic evidence are presented to support the hypothesis that the osmium disappearance is due to reaction with oxygen to form a volatile oxide. Platinum and iridium, which were included for comparison, fared much better.
Applied Optics | 1988
Ritva A. M. Keski-Kuha; John F. Osantowski; Albert R. Toft; William D. Partlow
The grazing incidence reflectance of silicon carbide films produced by plasma-assisted chemical vapor deposition has been evaluated in the spectral region from 256 to 1216 Å. The results show that reflectivities higher than conventional coatings can be obtained on coatings deposited both on silicon wafers and quartz substrates. Potential application of silicon carbide films for EUV astronomical instruments will be discussed.
Applied Optics | 1992
Howard Herzig; Charles M. Fleetwood; Albert R. Toft
In the course of the development of a domed magnesium fluoride detector window for the Space Telescope Imaging Spectrograph, slated to be a second-generation instrument aboard the Hubble Space Telescope, sample window materials from various commercial sources displayed a wide variability in vacuum ultraviolet transmittance. As a result a test program was undertaken in cooperation with the supplier of a prototype domed window to maximize transmittance. Results of the program have provided clues to the causes of the variations experienced, and they point to careful selection of raw materials and strict process control to achieve optimization.
Applied Optics | 1973
John F. Osantowski; Albert R. Toft
It is shown that a simple metal-dielectric-metal filter for broadband ultraviolet (BUV) reflectance control can provide a stable and effective means for reducing stray visible radiation in UV reflective optical systems. The application of such a filter in a BUV instrument resulted in a reduction of scattered visible light by at least an order of magnitude. The instrument has been in orbit for 2.5 year without loss of sensitivity or an increase in scattered light background.-
Astronomy '90, Tucson AZ, 11-16 Feb 90 | 1990
James B. Heaney; Howard Herzig; John F. Osantowski; Albert R. Toft
This paper will discuss the scientific and technological motivations for cleaning and re-coating optical surfaces, including solar power and thermal control surfaces, in the vacuum of space. Hardware concepts and their associated problems will also be addressed.