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Featured researches published by Alexander Tregub.


MRS Proceedings | 2002

Effect of CMP Pad Exposure to Aqueous Media on the Pad Properties. Part 1. Dynamic Mechanical and Modulated DSC Analysis

Alexander Tregub; Mansour Moinpour; J. Sorooshian

Soaking of polyurethane-based CMP pad in oxide slurry, de-ionized water, and pH buffer solution, and its effect on thermal and mechanical properties of the pads was studied using Dynamic Mechanical Analysis and Modulated Differential Scanning Calorimetry. Pad softening due to soaking was established, and softening mechanisms are discussed. Diffusion of the aqueous medias to polyurethane pad was described using Fickian diffusion model.


MRS Online Proceedings Library Archive | 2003

Pad Degradation During CMP Process: Effect of Soak in Slurry and Water on Thermal and Mechanical Properties of the CMP Pads

Alexander Tregub; G. Ng; Mansour Moinpour

Soak of polyurethane-based CMP pads in tungsten slurry and de-ionized water and its effect on retention of thermal and mechanical properties of the pads was studied using Dynamic Mechanical Analysis (DMA), Thermal Mechanical Analysis (TMA), Thermal Gravimetric Analysis (TGA), and Modulated Differential Scanning Calorimetry (MDSC). Simultaneous cross-linking and plastisizing due to soak were established using DMA and MDSC analysis. The stable operating temperature range and its dependence on soak time were determined using TMA analysis. Substantial difference in diffusion behavior of the “soft” and “hard” pads was discovered: diffusion into the hard pads followed Fickian law [1], while diffusion into the multi-layer soft pads was dominated by the fast filling of the highly porous pad surface with liquid. During a traditional CMP process, which involves application of polishing pads and slurry, the pad properties can be substantially and irreversibly changed as the result of slurry/rinse water absorption. The retention of the pad properties after exposure was monitored using such thermal and mechanical techniques, as Thermal Mechanical Analysis (TMA), Dynamical Mechanical Analysis (DMA), Modulated Differential Scanning Calorimetry (MDSC), Thermal Gravimetric Analysis (TGA).


Archive | 2003

Mounting a pellicle to a frame

Florence Eschbach; Paul Zimmerman; Alexander Tregub; Fu-Chang Lo


Archive | 2005

Detecting particle agglomeration in chemical mechanical polishing slurries

Alexander Tregub; Mansour Moinpour


Archive | 2005

Brush for cleaning wafer

Huey-Chiang Liou; Alexander Tregub; Mansour Moinpour


Archive | 2002

Brush for cleaning/scrubbing a substrate

Alexander Tregub; Jamie Ludke; Mark McGhee; Mansour Moinpour; Joseph Parks; Jade Sun; Jonathan Thibado


Archive | 2003

Attaching a pellicle frame to a reticle

Florence Eschbach; Paul Zimmerman; Alexander Tregub; Fu-Chang Lo


Archive | 2004

Anti-bacterial protection to improve performance of post CMP clean brush

Alexander Tregub; Mansour Moinpour


Archive | 2004

Process to optimize properties of polymer pellicles and resist for lithography applications

Alexander Tregub; Florence Eschbach; Fu-Chang Lo; Susan M. Holl


Thermochimica Acta | 2005

Thermoanalytical characterization of thermoset polymers for chemical mechanical polishing

Alexander Tregub; G. Ng; J. Sorooshian; Mansour Moinpour

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