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Publication
Featured researches published by Algirdas Joseph Gruodis.
IEEE Design & Test of Computers | 1988
Algirdas Joseph Gruodis; Dale E. Hoffman
New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM.<<ETX>>
Archive | 1996
Ferenc Miklos Bozso; Yiu-Hing Chan; Philip G. Emma; Algirdas Joseph Gruodis; David Patrick Hillerud; Scott Barnett Swaney
Archive | 1992
Algirdas Joseph Gruodis; Piyushkumar C. Patel; Kurt Paul Szabo
Archive | 1983
Yi-Hua E. Chang; Algirdas Joseph Gruodis; Hans P. Muhlfeld; Charles W. Rodriguez; Mark L. Shulman
Archive | 1992
John Edward Dickol; Algirdas Joseph Gruodis; Dale E. Hoffman
Archive | 1992
John Edward Dickol; Dinh Lien Do; Algirdas Joseph Gruodis
Archive | 1990
Algirdas Joseph Gruodis
Archive | 1975
John Balyoz; Algirdas Joseph Gruodis; Teh-Sen Jen; Wadie Faltas Mikhail
Archive | 1984
Yi-Hua E. Chang; Lawrence Joseph Grasso; Algirdas Joseph Gruodis; Carroll E. Morgan
Archive | 1990
Michael Lee Combs; Algirdas Joseph Gruodis; Dale E. Hoffman; Charles Albert Puntar; Kurt Paul Szabo
