Ana Kanevce

Minority Carrier Lifetime Analysis in the Bulk of Thin-Film Absorbers Using Subbandgap (Two-Photon) Excitation

We describe a new time-resolved photoluminescence (TRPL) analysis method for the determination of minority carrier lifetime τB. This analysis is based on subbandgap excitation (two-photon excitation, or 2PE) and allows selective lifetime determination at the surface or in the bulk of semiconductor absorbers. We show that for single-crystal CdTe, τB could be determined even if surface recombination velocity is >105 cm s-1. Two-photon excitation TRPL measurements indicate that radiative lifetime in undoped CdTe is >>66 ns. We also compare one-photon excitation (1PE) and 2PE TRPL data for polycrystalline CdS/CdTe thin films.

Indications of short minority-carrier lifetime in kesterite solar cells

Solar cells based on kesterite absorbers consistently show lower voltages than those based on chalcopyrites with the same bandgap. We use three different experimental methods and associated data analysis to determine minority-carrier lifetime in a 9.4%-efficient Cu2ZnSnSe4 device. The methods are cross-sectional electron-beam induced current, quantum efficiency, and time-resolved photoluminescence. These methods independently indicate minority-carrier lifetimes of a few nanoseconds. A comparison of current-voltage measurements and device modeling suggests that these short minority-carrier lifetimes cause a significant limitation on the voltage produced by the device. The comparison also implies that low minority-carrier lifetime alone does not account for all voltage loss in these devices.

Minority-Carrier Lifetime and Surface Recombination Velocity in Single-Crystal CdTe

We apply an earlier developed method [Kuciauskas et al., IEEE J. Photovoltaics , vol. 3, p. 1319, 2013] to analyze surface and bulk recombination in high-quality undoped single-crystal CdTe. By using two-photon excitation time-resolved photoluminescence, we determined a room-temperature minority-carrier lifetime of 360 ns. This lifetime has weak temperature dependence at 202-295 K. We also show that the high surface recombination velocity (>105 cm/s) typical for single-crystal CdTe was reduced by an order of magnitude to ≈ 1×104 cm/s.

Charge-carrier transport and recombination in heteroepitaxial CdTe

We analyze charge-carrier dynamics using time-resolved spectroscopy and varying epitaxial CdTe thickness in undoped heteroepitaxial CdTe/ZnTe/Si. By employing one-photon and nonlinear two-photon excitation, we assess surface, interface, and bulk recombination. Two-photon excitation with a focused laser beam enables characterization of recombination velocity at the buried epilayer/substrate interface, 17.5 μm from the sample surface. Measurements with a focused two-photon excitation beam also indicate a fast diffusion component, from which we estimate an electron mobility of 650 cm2 (Vs)−1 and diffusion coefficient D of 17 cm2 s−1. We find limiting recombination at the epitaxial film surface (surface recombination velocity Ssurface = (2.8 ± 0.3) × 105 cm s−1) and at the heteroepitaxial interface (interface recombination velocity Sinterface = (4.8 ± 0.5) × 105 cm s−1). The results demonstrate that reducing surface and interface recombination velocity is critical for photovoltaic solar cells and electronic d...

Spectrally and time resolved photoluminescence analysis of the CdS/CdTe interface in thin-film photovoltaic solar cells

Light absorption and charge separation in thin-film polycrystalline cadmium telluride (CdTe) photovoltaic (PV) solar cells largely occur in the vicinity of the CdS/CdTe interface. Sulfur alloying at this interface to form CdSxTe1-x and doping with Cu appear to be important for efficient PV devices. Based on the different band gaps of CdSxTe1-x and CdTe, we apply spectroscopic and computational photoluminescence (PL) analysis to characterize this interface. We find that Cu concentration changes the dynamics of charge separation and PL emission intensities from the CdSxTe1-x and CdTe regions. We have determined charge separation lifetime and minority carrier lifetime, and we have estimated minority carrier mobility as <100 cm2 V−1 s−1.

Beneficial effect of post-deposition treatment in high-efficiency Cu(In,Ga)Se2 solar cells through reduced potential fluctuations

World-record power conversion efficiencies for Cu(In,Ga)Se2 (CIGS) solar cells have been achieved via a post-deposition treatment with alkaline metals, which increases the open-circuit voltage and fill factor. We explore the role of the potassium fluoride (KF) post-deposition treatment in CIGS by employing energy- and time-resolved photoluminescence spectroscopy and electrical characterization combined with numerical modeling. The bulk carrier lifetime is found to increase with post-deposition treatment from 255 ns to 388 ns, which is the longest charge carrier lifetime reported for CIGS, and within ∼40% of the radiative limit. We find evidence that the post-deposition treatment causes a decrease in the electronic potential fluctuations. These potential fluctuations have previously been shown to reduce the open-circuit voltage and the device efficiency in CIGS. Additionally, numerical simulations based on the measured carrier lifetimes and mobilities show a diffusion length of ∼10 μm, which is ∼4 times la...

Emitter/absorber interface of CdTe solar cells

The performance of CdTe solar cells can be very sensitive to the emitter/absorber interface, especially for high-efficiency cells with high bulk lifetime. Performance losses from acceptor-type interface defects can be significant when interface defect states are located near mid-gap energies. Numerical simulations show that the emitter/absorber band alignment, the emitter doping and thickness, and the defect properties of the interface (i.e., defect density, defect type, and defect energy) can all play significant roles in the interface recombination. In particular, a type I heterojunction with small conduction-band offset (0.1 eV ≤ ΔEC ≤ 0.3 eV) can help maintain good cell efficiency in spite of high interface defect density, much like with Cu(In,Ga)Se2 (CIGS) cells. The basic principle is that positive ΔEC, often referred to as a “spike,” creates an absorber inversion and hence a large hole barrier adjacent to the interface. As a result, the electron-hole recombination is suppressed due to an insufficie...

Recombination Analysis in Cadmium Telluride Photovoltaic Solar Cells With Photoluminescence Spectroscopy

We used photoluminescence (PL) spectroscopy to study recombination in polycrystalline CdS/CdTe photovoltaic solar cells with open-circuit voltages in the range of 0.899-0.895 V. From PL emission spectra, we identified defects with an activation energy of 0.11-0.12 eV in the junction and back-contact regions. At <;100 K, lifetimes in devices were similar to those in single crystals and ranged from 300-400 ns. Strong lifetime temperature dependence at 100-300 K suggests the presence of a relatively shallow recombination center. Therefore, it is possible that in CdTe solar cells, lifetime is limited by relatively shallow defects.

The roles of carrier concentration and interface, bulk, and grain-boundary recombination for 25% efficient CdTe solar cells

CdTe devices have reached efficiencies of 22% due to continuing improvements in bulk material properties, including minority carrier lifetime. Device modeling has helped to guide these device improvements by quantifying the impacts of material properties and different device designs on device performance. One of the barriers to truly predictive device modeling is the interdependence of these material properties. For example, interfaces become more critical as bulk properties, particularly, hole density and carrier lifetime, increase. We present device-modeling analyses that describe the effects of recombination at the interfaces and grain boundaries as lifetime and doping of the CdTe layer change. The doping and lifetime should be priorities for maximizing open-circuit voltage (Voc) and efficiency improvements. However, interface and grain boundary recombination become bottlenecks for device performance at increased lifetime and doping levels. This work quantifies and discusses these emerging challenges f...

The impact of Cu on recombination in high voltage CdTe solar cells

Using photoluminescence spectroscopy, we construct a recombination model for state-of-the-art CdTe solar cells doped with Cu. We observe that Cu on Cd sites form a dominant acceptor state about 150 meV from the valence band. Although it is intuitive that this state can increase hole density, we also find that this relatively shallow dopant can also limit lifetime. Consequently, CdTe solar cells doped with Cu could have a lifetime limitation inversely proportional to the hole concentration.