Dean H. Levi

Effects of CdCl2 treatment on the recrystallization and electro-optical properties of CdTe thin films

The effects of CdCl2 processing on the physical and electro-optical properties of CdTe were evaluated for thin films produced by physical vapor deposition and close-spaced sublimation (CSS). Two substrates (CdS and Indium–tin–oxide) were used with the physical vapor deposition (PVD) films specifically to isolate the effects of the Cd(SxTe1−x) alloy formed during the treatment of films deposited on CdS. The samples were analyzed by x-ray diffraction (XRD), atomic force microscopy (AFM), and photoluminescence. The observed changes in microstructure were caused by recrystallization, which consisted of the nucleation and development of a new CdTe structure and subsequent grain growth. Nevertheless, for these processes to take place, it was necessary that enough lattice-strain energy was available in the films. For this reason, PVD films did recrystallize, while CSS films did not. For the first time, recrystallization was observed directly in AFM images of CdTe films and confirmed by XRD analysis, which indica...

Time-resolved photoluminescence studies of CdTe solar cells

We show that time-resolved photoluminescence measurements of completed polycrystalline CdTe solar cells provide a measure of recombination near the CdTe/CdS metallurgical interface that is strongly correlated to the open-circuit voltage in spite of complex carrier dynamics in the junction region. Oxygen in the growth ambient during close-spaced sublimation generally reduces this recombination rate; grain size does not have a strong effect.

Interdiffusion of CdS and Zn2SnO4 layers and its application in CdS/CdTe polycrystalline thin-film solar cells

In this work, we found that the interdiffusion of the CdS and Zn2SnO4 (ZTO) layers can occur either at high temperature (550–650 °C) in Ar or at lower temperature (400–420 °C) in a CdCl2 atmosphere. By integrating a Zn2SnO4 film into a CdS/CdTe solar cell as a buffer layer, this interdiffusion feature can solve several critical issues and improve device performance and reproducibility of both SnO2-based and Cd2SnO4-based CdTe cells. Interdiffusion consumes the CdS film from both the ZTO and CdTe sides during the device fabrication process and improves quantum efficiency at short wavelengths. The ZTO film acts as a Zn source to alloy with the CdS film, which results in increases in the band gap of the window layer and in short-circuit current density Jsc. Interdiffusion can also significantly improve device adhesion after CdCl2 treatment, thus providing much greater process latitude when optimizing the CdCl2 process step. The optimum CdCl2-treated CdTe device has high quantum efficiency at long wavelength,...

Efficient heterojunction solar cells on p-type crystal silicon wafers

Efficient crystalline silicon heterojunction solar cells are fabricated on p-type wafers using amorphous silicon emitter and back contact layers. The independently confirmed AM1.5 conversion efficiencies are 19.3% on a float-zone wafer and 18.8% on a Czochralski wafer; conversion efficiencies show no significant light-induced degradation. The best open-circuit voltage is above 700 mV. Surface cleaning and passivation play important roles in heterojunction solar cell performance.

Minority Carrier Lifetime Analysis in the Bulk of Thin-Film Absorbers Using Subbandgap (Two-Photon) Excitation

We describe a new time-resolved photoluminescence (TRPL) analysis method for the determination of minority carrier lifetime τB. This analysis is based on subbandgap excitation (two-photon excitation, or 2PE) and allows selective lifetime determination at the surface or in the bulk of semiconductor absorbers. We show that for single-crystal CdTe, τB could be determined even if surface recombination velocity is >105 cm s-1. Two-photon excitation TRPL measurements indicate that radiative lifetime in undoped CdTe is >>66 ns. We also compare one-photon excitation (1PE) and 2PE TRPL data for polycrystalline CdS/CdTe thin films.

INVESTIGATION OF INDUCED RECRYSTALLIZATION AND STRESS IN CLOSE-SPACED SUBLIMATED AND RADIO-FREQUENCY MAGNETRON SPUTTERED CDTE THIN FILMS

We have induced recrystallization of small grain CdTe thin films deposited at low temperatures by close-spaced sublimation (CSS), using a standard CdCl2 annealing treatment. We also studied the changes in the physical properties of CdTe films deposited by radio-frequency magnetron sputtering after the same post-deposition processing. We demonstrated that the effects of CdCl2 on the physical properties of CdTe films are similar, and independent of the deposition method. The recrystallization process is linked directly to the grain size and stress in the films. These studies indicated the feasibility of using lower-temperature processes in fabricating efficient CSS CdTe solar cells. We believe that, after the optimization of the parameters of the chemical treatment, these films can attain a quality similar to CSS films grown using current standard conditions.

A study of minority carrier lifetime versus doping concentration in n‐type GaAs grown by metalorganic chemical vapor deposition

Time‐resolved photoluminescence decay measurements are used to explore minority carrier recombination in n‐type GaAs grown by metalorganic chemical vapor deposition, and doped with selenium to produce electron concentrations from 1.3×1017 cm−3 to 3.8×1018 cm−3. For electron densities n 0<1018 cm−3, the lifetime is found to be controlled by radiative recombination and photon recycling with no evidence of Shockley–Read–Hall recombination. For higher electron densities, samples show evidence of Shockley–Read–Hall recombination as reflected in the intensity dependence of the photoluminescence decay. Still, we find that radiative recombination and photon recycling are important for all electron concentrations studied, and no evidence for Auger recombination was observed.

Effect of Cu deficiency on the optical bowing of chalcopyrite CuIn1−xGaxSe2

Optical bowing coefficients are used to describe the band gap variation of a composite semiconductor alloy. It is known to be related to the electronic structure and the lattice deformation in the semiconductor alloys. Spectroscopic ellipsometry study shows that the optical bowing coefficient of slightly Cu-poor polycrystalline Cu0.9In1−xGaxSe2 is larger than that of stoichiometric polycrystalline CuIn1−xGaxSe2 and band gaps are larger when Cu becomes poor. This can be explained by an increase in valence band offset due to reduced p-d coupling and an increase of perturbation potential ΔV due to lattice deformation.

Monitoring and modeling silicon homoepitaxy breakdown with real-time spectroscopic ellipsometry

Real-time spectroscopic ellipsometry (RTSE) is used to monitor the breakdown of low-temperature homoepitaxial growth of silicon on silicon wafers in a hot-wire chemical-vapor deposition reactor. We develop and evaluate two optical models to interpret the RTSE data, revealing the progression of epitaxy and its eventual breakdown into amorphous silicon growth. Comparison of the RTSE analysis with cross-sectional transmission electron microscopy, ex situ variable-angle spectroscopic ellipsometry, and Raman spectroscopy measurements shows that RTSE provides accurate and fast quantitative feedback about the progression of epitaxy.

Effect of Cu deficiency on the optical properties and electronic structure of CuInSe2 and CuIn0.8Ga0.2Se2 determined by spectroscopic ellipsometry

Spectroscopic ellipsometry measurements of CuInSe2 (CIS) and CuIn0.8Ga0.2Se2 (CIGS) reveal that there are important differences in electronic properties between stoichiometric CIS (CIGS) and Cu-poor CIS (CIGS). We find a reduction in the absorption strength in the spectral region of 1–3eV. This reduction can be explained in terms of the Cu 3d density of states. Cu-poor CIS (CIGS) materials show an increase in band gap due to the reduction in repulsion between Cu 3d and Se 4p states. The experimental results have important implications for the function of polycrystalline optoelectronic devices.