Andreas Leber

Facet degradation of GaN heterostructure laser diodes

We investigated the degradation of cleaved facets of (Al,In)GaN laser diodes in different atmospheres. We found that operation in water-free atmospheres with sufficient oxygen shows a slow degradation. Operation in atmospheres with water vapor causes a fast degradation and an oxidation on the facet. This deposition is a permanent damage to the laser diode. If the laser diode is operated in pure nitrogen, we find a thick deposition on the facet, which shows high absorption. This deposition can be removed by either high optical output powers or by operation in atmospheres with sufficient oxygen. We also explain the influence of these coatings to the degradation behavior and see these coatings as the reason for unstable kinks in the L–I characteristics during operation.

Microscopic analysis of optical gain in InGaN∕GaN quantum wells

A microscopic theory is used to analyze optical gain in InGaN∕GaN quantum wells (QW). Experimental data are obtained from Hakki–Paoli measurements on edge-emitting lasers for different carrier densities. The simulations are based on the solution of the quantum kinetic Maxwell–Bloch equations, including many-body effects and a self-consistent treatment of piezoelectric fields. The results confirm the validity of a QW gain description for this material system with a substantial inhomogeneous broadening due to structural variation. They also give an estimate of the nonradiative recombination rate.

Near-field and far-field dynamics of (Al,In)GaN laser diodes

Near- and far-field dynamics of edge-emitting (Al,In)GaN laser diodes are measured simultaneously with a 100 nm spatial and a 5 ns temporal resolution using a scanning near-field microscope. We reconstruct the phase distribution at the laser diode facet. Beam steering and near-field mode dynamics are interpreted in terms of thermal and carrier induced change of refractive index in the waveguide.

Correlation of strain, wing tilt, dislocation density, and photoluminescence in epitaxial lateral overgrown GaN on SiC substrates

Epitaxial lateral overgrown (ELOG) gallium nitride (GaN) on SiC is being studied as a possible substrate for blue laser diodes. A defect density below 2.2×107cm−2 in the wings, compared to 2×109cm−2 in the windows, was achieved. Interaction of the overgrown GaN with the SiO2 mask causes a few degree wing tilt and a transition region of high defect density between windows and wings. Diminished PL, strong tensile stress, and a defect correlated line at around 3.4eV emerge in this up to two-micron-wide transition region. By changing the mask material from SiO2 to SiN we were able to reduce the wing tilt drastically to below 0.7°. This eliminates the defective transition region and extends the low strain and the low defect density area of the ELOG wings. The methods used to study strain, wing tilt, and threading dislocations in the ELOG samples are microphotoluminescence (μPL), transmission electron microscopy, x–ray diffraction, and scanning electron microscope. We also demonstrate the use of the first momen...