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Publication
Featured researches published by Andrew K. Chan.
international reliability physics symposium | 1996
Richard Wong; Kathryn E. Gordon; Andrew K. Chan
The programmed amorphous silicon antifuse reliability is characterized for the first time as a time dependent phenomenon. Previously, the reliability has been characterized as a switch off or threshold behavior. Both the DC and AC read disturb are now shown to have a time dependence. The stress current and ambient temperature acceleration factors are discussed.
Archive | 1991
Kathryn E. Gordon; Andrew K. Chan
Archive | 2000
Robert Fu; David D. Eaton; Kevin K. Yee; Andrew K. Chan
Archive | 1996
James M. Apland; David D. Eaton; Andrew K. Chan
Archive | 1992
William D. Cox; Andrew K. Chan; Richard Wong; James M. Apland; Kathryn E. Gordon
Archive | 2001
Andrew K. Chan; James M. Apland; Senani Gunaratna; SunilKumar G. Mudunuri; Ket-Chong Yap
Archive | 2000
David D. Eaton; Ket-Chong Yap; Kevin K. Yee; E. Thomas Hart; Andrew K. Chan; Neal A. Palmer; Michael W Dini; James M. Apland; Panawalge S. N. Gunaratna
Archive | 1997
James M. Apland; Andrew K. Chan
Archive | 1999
Andrew K. Chan; James M. Apland; Ket-Chong Yap
Archive | 1995
Amarpreet S. Chawla; Richard Wong; Andrew K. Chan
