Anna Starczewska
Silesian University of Technology
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Anna Starczewska.
Ultrasonics Sonochemistry | 2009
Anna Starczewska; Roman Wrzalik; M. Nowak; P. Szperlich; M. Jesionek; G. Moskal; Tomasz Rzychoń; J. Szala; Danuta Stróż; P. Maślanka
The influence of the substitution of methanol in place of ethanol during the ultrasonic production of antimony sulfoiodide (SbSI) nanowires is presented. The new technology is faster and more efficient at temperatures greater than 314 K. The products were characterized by using techniques such as powder X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDXA), high-resolution transmission electron microscopy (HRTEM), selected area electron diffraction (SAED), optical diffuse reflection spectroscopy (DRS) and IR spectroscopy. The coexistence of Pna2(1) (ferroelectric) and Pnam (paraelectric) phases at 298 K was observed in the SbSI nanowires produced in methanol. The methanol decomposes during the sonication or due to the adsorption process on SbSI nanowires.
Solid State Phenomena | 2013
Anna Starczewska; J. Szala; Mirosława Kępińska; M. Nowak; Krystian Mistewicz; M. Sozańska
All over the world the investigations of nanophotonic structures called photonic crystals (PCs) are performed. These crystals have potential applications in optoelectronics, e.g. optical filters, antireflective surface coatings, lossless frequency selective mirrors. In Institute of Physics at Silesian Technical University the opal photonic crystals consisting of monodisperse spherical particles, that have diameters of several hundred nanometers, are produced using colloidal self-assembly technics. The main aim of this work is the comparison between pieces of information on morphology of photonic crystals that can be obtained from electron microscopy and from the angular characteristics of optical transmittance and reflectance. The morphology of the samples is characterized by scanning electron microscopy (SEM). Nanosphere diameters are established from statistical analysis of SEM images. The optical properties, which are determined by the photonic band structure, are studied by means of light transmission and reflection measurements. There is a relationship between the wavelength position of transmittance minimum or reflectance maximum and the diameter of the nanospheres. The size of nanospheres obtained from optical measurement results were compared with data obtained from SEM images.
Frontiers in Optics | 2014
Anna Starczewska; M. Nowak; P. Szperlich; I. Bednarczyk; Krystian Mistewicz; Mirosława Kępińska; Piotr Duka
Semiconducting ferroelectrics promise construction of crystals with tuned photonic band gap. Such structures were synthesized by self-assembling SiO2 spheres, followed by melt infiltration with antimony sulfoiodide and the removal of SiO2 spheres by chemical etching.
Journal of Non-crystalline Solids | 1999
M. Nowak; Anna Starczewska
The influence of spatial distribution of radiation intensity on results of steady-state photocarrier grating (SSPG) measurements is analyzed. This technique uses the interference pattern obtained over an illuminated sample surface when two coherent radiation beams hit the sample at different angles of incidence. The sample usually consists of a thin semiconductor film on a thick, parallel-sided substrate. In this paper, the interference of radiation internally reflected in the thin film as well as internally reflected in the substrate are taken into consideration. These phenomena evoke complicated spatial distributions of radiation in a sample, and consequently they affect the magnitude of photoconductivity. The value of SSPG response can be even a few times greater than the predicted one for a homogeneous distribution of light over the thickness of a semiconductor film. If one does not take this effect into account, the carrier diffusion lengths estimated with the SSPG technique may vary from those suggested by the measurement.
Beilstein Journal of Nanotechnology | 2018
M. Nowak; M. Jesionek; B. Solecka; P. Szperlich; Piotr Duka; Anna Starczewska
Background: Applications of two-dimensional (2D) materials in electronic devices require the development of appropriate measuring methods for determining their typical semiconductor parameters, i.e., mobility and carrier lifetime. Among these methods, contactless techniques and mobility extraction methods based on field-effect measurements are of great importance. Results: Here we show a contactless method for determining these parameters in 2D semiconductors that is based on the photomagnetoelectric (PME) effect (also known as the photoelectromagnetic effect). We present calculated dependences of the PME magnetic moment, evoked in 2D Corbino configuration, on the magnetic field as well as on the intensity and spatial distribution of illumination. The theoretical predictions agree with the results of the contactless investigations performed on non-suspended single-layer graphene. We use the contactless PME method for determining the dependence of carrier mobility on the concentration of electrons and holes induced by a back-gate voltage. Conclusion: The presented contactless PME method, used in Corbino geometry, is complementary to the mobility extraction methods based on field-effect measurements. It can be used for determining the mobility and diffusion length of carriers in different 2D materials.
Sensors and Actuators A-physical | 2014
M. Nowak; A. Nowrot; P. Szperlich; M. Jesionek; Mirosława Kępińska; Anna Starczewska; Krystian Mistewicz; Danuta Stróż; J. Szala; Tomasz Rzychoń; E. Talik; Roman Wrzalik
Infrared Physics & Technology | 2008
Anna Starczewska; Roman Wrzalik; M. Nowak; P. Szperlich; Ł. Bober; J. Szala; Danuta Stróż; D. Czechowicz
Sensors and Actuators A-physical | 2014
M. Nowak; Krystian Mistewicz; A. Nowrot; P. Szperlich; M. Jesionek; Anna Starczewska
Sensors and Actuators A-physical | 2012
Anna Starczewska; M. Nowak; P. Szperlich; B. Toroń; Krystian Mistewicz; Danuta Stróż; J. Szala
Materials Letters | 2015
Anna Starczewska; P. Szperlich; M. Nowak; Tomasz Rzychoń; I. Bednarczyk; Roman Wrzalik