Annick De Backer
University of Antwerp
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Annick De Backer.
Nano Letters | 2013
Bart Goris; Annick De Backer; Sandra Van Aert; Sergio Gómez-Graña; Luis M. Liz-Marzán; Gustaaf Van Tendeloo; Sara Bals
A thorough understanding of the three-dimensional (3D) atomic structure and composition of core-shell nanostructures is indispensable to obtain a deeper insight on their physical behavior. Such 3D information can be reconstructed from two-dimensional (2D) projection images using electron tomography. Recently, different electron tomography techniques have enabled the 3D characterization of a variety of nanostructures down to the atomic level. However, these methods have all focused on the investigation of nanomaterials containing only one type of chemical element. Here, we combine statistical parameter estimation theory with compressive sensing based tomography to determine the positions and atom type of each atom in heteronanostructures. The approach is applied here to investigate the interface in core-shell Au@Ag nanorods but it is of great interest in the investigation of a broad range of nanostructures.
Nature Materials | 2016
Jaco J. Geuchies; Carlo van Overbeek; W Wiel Evers; Bart Goris; Annick De Backer; Anjan P. Gantapara; Freddy T. Rabouw; Jan Hilhorst; Joep L. Peters; Oleg Konovalov; Andrei V. Petukhov; Marjolein Dijkstra; Laurens D. A. Siebbeles; Sandra Van Aert; Sara Bals; Daniel Vanmaekelbergh
Oriented attachment of PbSe nanocubes can result in the formation of two-dimensional (2D) superstructures with long-range nanoscale and atomic order. This questions the applicability of classic models in which the superlattice grows by first forming a nucleus, followed by sequential irreversible attachment of nanocrystals, as one misaligned attachment would disrupt the 2D order beyond repair. Here, we demonstrate the formation mechanism of 2D PbSe superstructures with square geometry by using in situ grazing-incidence X-ray scattering (small angle and wide angle), ex situ electron microscopy, and Monte Carlo simulations. We observed nanocrystal adsorption at the liquid/gas interface, followed by the formation of a hexagonal nanocrystal monolayer. The hexagonal geometry transforms gradually through a pseudo-hexagonal phase into a phase with square order, driven by attractive interactions between the {100} planes perpendicular to the liquid substrate, which maximize facet-to-facet overlap. The nanocrystals then attach atomically via a necking process, resulting in 2D square superlattices.
Nano Letters | 2015
Bart Goris; Jan De Beenhouwer; Annick De Backer; Daniele Zanaga; K. Joost Batenburg; Ana Sánchez-Iglesias; Luis M. Liz-Marzán; Sandra Van Aert; Sara Bals; Jan Sijbers; Gustaaf Van Tendeloo
The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We therefore propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D.
Physical Review Letters | 2016
Karel Hendrik Wouter van den Bos; Annick De Backer; Gerardo T. Martinez; Naomi Winckelmans; Sara Bals; Peter D. Nellist; Sandra Van Aert
The development of new nanocrystals with outstanding physicochemical properties requires a full three-dimensional (3D) characterization at the atomic scale. For homogeneous nanocrystals, counting the number of atoms in each atomic column from high angle annular dark field scanning transmission electron microscopy images has been shown to be a successful technique to get access to this 3D information. However, technologically important nanostructures often consist of more than one chemical element. In order to extend atom counting to heterogeneous materials, a new atomic lensing model is presented. This model takes dynamical electron diffraction into account and opens up new possibilities for unraveling the 3D composition at the atomic scale. Here, the method is applied to determine the 3D structure of Au@Ag core-shell nanorods, but it is applicable to a wide range of heterogeneous complex nanostructures.
IUCrJ | 2016
Sandra Van Aert; Annick De Backer; Gerardo T. Martinez; Arnold J. den Dekker; Dirk Van Dyck; Sara Bals; Gustaaf Van Tendeloo
An overview of statistical parameter estimation methods is presented and applied to analyse transmission electron microscopy images in a quantitative manner.
Ultramicroscopy | 2017
Annelies De wael; Annick De Backer; Lewys Jones; Peter D. Nellist; Sandra Van Aert
A hybrid statistics-simulations based method for atom-counting from annular dark field scanning transmission electron microscopy (ADF STEM) images of monotype crystalline nanostructures is presented. Different atom-counting methods already exist for model-like systems. However, the increasing relevance of radiation damage in the study of nanostructures demands a method that allows atom-counting from low dose images with a low signal-to-noise ratio. Therefore, the hybrid method directly includes prior knowledge from image simulations into the existing statistics-based method for atom-counting, and accounts in this manner for possible discrepancies between actual and simulated experimental conditions. It is shown by means of simulations and experiments that this hybrid method outperforms the statistics-based method, especially for low electron doses and small nanoparticles. The analysis of a simulated low dose image of a small nanoparticle suggests that this method allows for far more reliable quantitative analysis of beam-sensitive materials.
Zeitschrift Fur Kristallographie | 2012
Miia Klingstedt; Margareta Sundberg; Lars Eriksson; Sarah J. Haigh; Angus I. Kirkland; Daniel Grüner; Annick De Backer; Sandra Van Aert; Osamu Terasaki
Abstract A new tungsten bronze in the Sb—W—O system has been prepared in a solid state reaction from Sb2O3, WO3 and W metal powder. The average structure was determined by single crystal X-ray diffraction. SbxWO3+y (x ∼ 0.11) crystallizes in the orthorhombic space group Pm21n (no. 31), a = 27.8135(9) Å, b = 7.3659(2) Å and c = 3.8672(1) Å. The structure belongs to the (n)-ITB class of intergrowth tungsten bronzes. It contains slabs of hexagonal channels formed by six WO6 octahedra. These slabs are separated by three layers of WO6 octahedra that are arranged in a WO3-type fashion. The WO6 octahedra share all vertices to build up a three-dimensional framework. The hexagonal channels are filled with Sb atoms to ∼80% and additional O atoms. The atoms are shifted out of the center of the channels. Exit-wave reconstruction of focal series of high resolution-transmission-electron-microscope (HRTEM) images combined with statistical paramäeter estimation techniques allowed to study local ordering in the channels. Sb atoms in neighbouring channels tend to be displaced in the same direction, which is in agreement with total energy calculations on ordered structure models, but the ratio of the occupation of the two possible Sb sites varies from channel to channel. The structure of SbxWO3+y exhibits pronounced local modulations.
Materials | 2018
Giulio Guzzinati; Thomas Altantzis; Maria Batuk; Annick De Backer; Gunnar Lumbeeck; Vahid Samaee; Dmitry Batuk; Hosni Idrissi; Joke Hadermann; Sandra Van Aert; Dominique Schryvers; Johan Verbeeck; Sara Bals
The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab’s recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science.
Advances in Physics: X | 2018
Karel Hendrik Wouter van den Bos; Thomas Altantzis; Annick De Backer; Sandra Van Aert; Sara Bals
ABSTRACT Over the last decade, scanning transmission electron microscopy has become one of the most powerful tools to characterise nanomaterials at the atomic scale. Often, the ultimate goal is to retrieve the three-dimensional structure, which is very challenging since small species are typically sensitive to electron irradiation. Nevertheless, measuring individual atomic positions is crucial to understand the relation between the structure and physicochemical properties of these (nano)materials. In this review, we highlight the latest approaches that are available to reveal the 3D atomic structure of small species. Finally, we will provide an outlook and will describe future challenges where the limits of electron microscopy will be pushed even further. GRAPHICAL ABSTRACT Abbreviations: 2D: Two-dimensional; 3D: Three-dimensional; FAU: Faujasite; GPU: graphical processing unit; HAADF: High angle annular dark field; ICL: Integrated classification likelihood; SNR: Signal-to-noise ratio; STEM: Scanning transmission electron microscopy; XRD: X-ray diffraction
Microscopy and Microanalysis | 2017
Aakash Varambhia; Lewys Jones; Annick De Backer; Sandra Van Aert; Dogan Ozkaya; Sergio Lozano-Perez; Peter D. Nellist
Some of the key properties that affect the catalytic performance of nanoparticle ensembles are particle size, shape, surface-strain and composition. These parameters need to be measured from an ensemble of nanoparticles to obtain useful parameters to compare to catalytic activity. Using Scanning Transmission Electron Microscopy (STEM) it is possible to measure these parameters simultaneously from a nanoparticle. The Annular Dark Field (ADF) image can be used to obtain atomic positions [1,2], whereas Energy Dispersive X-ray (EDS) and Electron Energy Loss Spectroscopy (EELS) can be used to obtain high resolution compositional information. With careful instrument calibrations all three of these signals can be converted into quantitative scattering crosssections [3,4] to count the number of atoms along an atomic column of a nanoparticle.