Annie Chi-yi Chen

p-type arsenic doping of Hg1−xCdxTe by molecular beam epitaxy

Growth of in situ As doped Hg1−xCdxTe by molecular beam epitaxy and activation of As at 250 °C is reported. We have used elemental arsenic, As4, as the p-type dopant source. The activation of As was observed in the 1016–1018 cm−3 range after a low temperature annealing step at 250 °C. However, for doping levels above 5×1018 cm−3, we have observed that the As activation efficiency drops. It is speculated at this time that self-compensation and formation of neutral As complexes may limit doping efficiency at very high levels. We also report our data on the structural and electrical characteristics of these As doped p-type layers using secondary ion mass spectroscopy analysis, and Hall effect measurements. An acceptor activation energy of 5.4 meV was obtained based on the dependence of the Hall coefficient on temperature. This value was attributed to singly ionized As located on a Te site (AsTe•) acting as an acceptor. A brief discussion on activation mechanism of As doped p-type HgCdTe material is also pres...

Latest results on HgCdTe 2048x2048 and silicon focal plane arrays

The worlds first 2048 X 2048 HgCdTe infrared focal plane array (FPA) has been developed by Rockwell Science Center for infrared astronomy. The Hawaii-2 is the largest CMOS multiplexer designed to date, developed to interface with both infrared and visible detector arrays. The 18 micrometer pixel pitch was selected to accommodate both reasonable telescope optics and maximize yield in the fabrication of such a large readout. The fabrication uses world-class submicron photolithography to maximize yield of high quality devices. We will report on the characterization of FPAs using the Hawaii-2 multiplexer mated to SWIR detector arrays with a spectral response of 0.9 micrometer to 2.5 micrometer. These detector arrays have been processed on Liquid Phase Epitaxy (LPE) HgCdTe on sapphire substrates, also known as PACE-1. We also report on characterization of Silicon detectors in terms of their quantum efficiency, spectral response, and dark current.

Visible and infrared detectors at Rockwell Science Center

Rockwell Space Center is developing low-noise visible and IR imaging sensors and systems for astronomy, high-end commercial, NASA, and advanced military applications. The first science grade 2048 by 2048 HAWAII-2 focal plane array (FPA) for astronomy was recently demonstrated for the SWIR waveband. Science-grade deliveries to the University of Hawaiis Institute for Astronomy, the European Southern Observatory and the Subaru Telescope, among others, will soon start. MWIR/visible 2048 by 2048 HAWAII-2 arrays are also being developed for the NGST program using our process for removing the CdZnTe substrate from the back-side illuminated HgCdTe FPAs to detect visible radiation in addition to IR. Previously, more than 25 science grade 2.5micrometers 1024 by 1024 HAWAII FPAs were delivered for use in many observatories; these typically exhibit < 0.1 e-/s dark current and < 10 e- read noise after correlated double sampling at temperatures above 60K. 1024 by 1024 FPAs development is also continuing; dark current < 1 e-/s has been measured at 140K for a NIR 1024 by 1024 HAWAII array. In a related effort, development of high frame rate, low noise FPAs has begun for wavefront sensing including adaptive optical systems for both visible and NIR/SWIR bands. Hybrid Visible Silicon Imager development is also continuing, expanding the success achieved with prior 640 by 480 FPAs. We are now demonstrating 1024 by 1024 arrays with 0.3-1.05 micrometers response. The silicon detectors in HyViSI FPAs are independently processed on silicon wafers and mated to the same multiplexers fabricated originally for interface to HgCdTe detectors. HyViSI FPA quantum efficiency is > 90 percent with near-100 percent fill factor, and the dark current is negligible with minimum cooling. Our near-term plan to develop 4096 by 4096 visible and IR FPAs will also be discussed.

HgCdTe 20482 FPA for infrared astronomy: development status

The HAWAII-2 is an IR 20482 focal plane array (FPA) that is being developed for next-generation IR astronomy. It will supplant our HAWAII 10242 as the largest high- performance imaging array available for IR astronomy. As with our prior IR sensor, the flip-chip hybrid will consist of a low-capacitance HgCdTe detector array mated to a low- noise CMOS silicon multiplexer via indium interconnects. In order to accommodate reasonable telescope optics and fabrication of the large sophisticated readout using world- class submicron CMOS, the FPA has 18 micrometers pixel pitch. We anticipate > 5 percent yield of defect-free multiplexers using 0.8 micrometers CMOS. The HgCdTe detector arrays will be fabricated on large wafers including sapphire and silicon. Though the first FPAs will have 2.5 micrometers cut-off, the readout will be able to support longer wavelengths. Also reported are the latest 1024 X 1024 FPA results with 2.5 micrometers HgCdTe detectors.

Advanced imaging sensors at Rockwell Scientific Company

The past 2 to 3 years has been a period of explosive growth in technology development for imaging sensors at Rockwell Scientific Co. (RSC). The state of the art has been advanced significantly, resulting in a number of unique advanced imaging sensor products. A few key examples are: 2048 x 2048 sensor chip assemblies (SCA) for ground and space-based applications, 4096 x 4096 mosaic close-butted mosaic FPA assemblies, a very high performance 10 x 1024 hybridized linear SCA for optical network monitoring and other applications, the revolutionary CMOS ProCam-HD imaging system-on-a-chip for high definition television (HDTV), and RSCs near-infrared emission microscope camera for VLSI defect detection/analysis. This paper provides selected updates of these products and thereby provides an overview of the ongoing highly fertile period of technology and product development at Rockwell Scientific. A view into future directions for advanced imaging sensors is also provided.

Prospects for large-format IR astronomy FPAs using MBE-grown HgCdTe detectors with cutoff wavelength > 4 μm

Rockwell Science Center has developed a double layer planar heterostructure (DLPH) detector array fabrication process with significant advantages over the PACE-1 process now being used to produce 256 X 256 and 1024 X 1024 FPAs for low background IR astronomy. The DLPH detectors are p- on-n photodiodes fabricated in a double layer of wide and narrow bandgap HgCdTe grown by molecular beam epitaxy on CdZnTe substrates. The double layer structure provides superior surface passivation while the lattice matched CdZnTe substrate reduces the defect density. DLPH FPAs have been fabricated in array sizes up to 640 X 480 and with cutoff wavelengths as long as 15 micrometers . Quantum efficiencies are typically in the 0.5 to 0.8 range. For a 256 X 256 array DLPH detectors with 5.3 micrometers cutoff wavelength at 50K, the median dark current was 0.39 e-/sec at 0.5V reverse bias. For 7 of 17 individual DLPH detector with 10.6 micrometers cutoff at 30K, the dark current was less than 104 e-/sec at 20 mV bias. For long cutoff wavelengths, the detector breakdown voltage is too low to permit signal integration directly on the reverse biased detector capacitance. Such detectors require a readout circuit that maintains the detector near zero bias and provides a separate capacitor to store the integrated signal.

Large-format SWIR/MWIR HgCdTe infrared focal plane arrays for astronomy

We have developed 1024 X 1024 HAWAII (HgCdTe Arrays for Wide-field Astronomical Infrared Imaging) focal plane arrays (FPAs) for use in astronomical applications. These devices have been delivered to various astronomy organizations around the world and have resulted in increased sensitivities and decreased observation times for deep space imaging. The detector material is PACE-I for SWIR and Molecular Beam Epitaxy (MBE) HgCdTe on CdZnTe for MWIR. The 1024 X 1024 multiplexer has a 18.5 micrometer unit cell pitch, source follower per detector (SFD) input, and it was fabricated at or internal commercial CMOS process line with excellent yield. Mean dark currents as low as 0.02 e-/s have been measured at 77 K for 2.5 micrometer devices (1024 X 1024 format, 18.5 micrometer pitch) and 0.39 e-/s for 5.3 micrometer devices at 50 K (256 X 256 format, 40 micrometer pitch). Quantum efficiencies are greater than 50% for both SWIR and MWIR detectors; with AR coatings, these are expected to be above 75%. Noise levels of 3 e- have been measured by multiple sampling techniques for the SWIR and 75 e- for the MWIR. All of these devices are simple to operate and are readily available. We are presently developing 2048 X 2048 FPAs with 18 micrometer unit cell pitch for both SWIR and MWIR applications.