Bernd R. Müller

Improved Computed Tomography by Variable Desmearing

Abstract In order to improve the spatial resolution of computed tomography reconstructions which suffer from un-sharpness due to an extended source size a new procedure of de-smearing has been developed. As the width of the source related smearing function of the projections may even double between the position near and far from the detector the desmearing procedure has to be variable. In contrast to the essentially wrong approach of de-convolution by a constant smear kernel for all voxel positions an implicit desmearing is established. The pre-known position dependent smearing is applied to the iteratively repeated projections of partial reconstructions obtained from the DIRECTT reconstruction algorithm. This approach of variable desmearing from sinograms of a pixel model with smearing from one to five pixel FWHM achieves a spatial resolution near one pixel.

Numerical correction of X-ray detector backlighting

Abstract A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals (“backlighting”) of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering by the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert–Beers law in single projections (radiographs). When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation phase and the samples aspect ratio (dynamics). The magnitude of the diffuse background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shadowed area and the stronger the total attenuation. This implies that the reconstruction suffers from additional anisotropic artifacts caused by elongated sample structures. This issue is studied simply by absorption of flat plates in a conventional laboratory radiography set-up and at a synchrotron radiation facility. In the latter case beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure requires simple integral intensity offsets as a constant (non-local) light scattering mechanism is assumed.

Wassermanagement in Brennstoffzellen — die Bedeutung von hochauflösenden zerstörungsfreien Untersuchungsmethoden

Kurzfassung Ein effektives Wassermanagement ist ein wichtiger Aspekt in der Entwicklung von Brennstoffzellen hinsichtlich Langzeitstabilität und Optimierung der Leistungsfähigkeit. Eine zentrale Rolle spielt dabei die Gasdiffusionslage, die für die gleichmäßige Verteilung der Reaktionsgase auf die elektrochemisch aktive Schicht (Katalysator) sorgen soll. In diesem Beitrag werden gemeinsame Forschungsaktivitäten des Helmholtz-Zentrums Berlin für Materialien und Energie (Entwicklung bildgebender Verfahren) sowie des Zentrums für Sonnenenergie- und Wasserstoff-Forschung (ZSW, Entwicklung von Brennstoffzellen) vorgestellt. Im Rahmen dieser Kooperation werden die Entstehung, die Verteilung und der Transport von flüssigem Wasser, kurz das Wassermanagement, unter Betriebsbedingungen untersucht. Mittels Synchrotronradiografie und -tomografie werden kleinste Wassercluster in der Gasdiffusionslage detektiert. Die gewonnenen Erkenntnisse dienen der Modifikation und einer gezielten Auswahl der eingesetzten Materialien.

Refraction computed tomography

Abstract For the first time metal matrix composites have been investigated by 3D computed tomography combined with enhanced interface contrast due to X-ray refraction. The related techniques of refraction topography and refraction computed tomography have been developed and applied during the last decade to meet the actual demand for improved non-destructive characterization of high performance composites, ceramics and other low-density materials and components. X-ray refraction is an optical effect that can be observed at small scattering angles of a few minutes of arc as the refractive index n of X-rays is nearly unity (n = 1 − 10−6). Due to the short X-ray wavelength, the technique determines the amount of inner surfaces and interfaces of nanometer dimensions. The technique can solve many problems in understanding micro and sub microstructures in materials science. Applying 3D refraction computed tomography, some questions could be clarified for a better understanding of fatigue failure mechanisms under cyclic loading conditions.

A dedicated compression device for high resolution X-ray tomography of compressed gas diffusion layers

We present an experimental approach to study the three-dimensional microstructure of gas diffusion layer (GDL) materials under realistic compression conditions. A dedicated compression device was designed that allows for synchrotron-tomographic investigation of circular samples under well-defined compression conditions. The tomographic data provide the experimental basis for stochastic modeling of nonwoven GDL materials. A plain compression tool is used to study the fiber courses in the material at different compression stages. Transport relevant geometrical parameters, such as porosity, pore size, and tortuosity distributions, are exemplarily evaluated for a GDL sample in the uncompressed state and for a compression of 30 vol.%. To mimic the geometry of the flow-field, we employed a compression punch with an integrated channel-rib-profile. It turned out that the GDL material is homogeneously compressed under the ribs, however, much less compressed underneath the channel. GDL fibers extend far into the channel volume where they might interfere with the convective gas transport and the removal of liquid water from the cell.

The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA)

The BAMline at the BESSY light source in Berlin and the TopoTomo beamline at the ANKA synchrotron facility in Karlsruhe (both Germany) operate in the hard X-ray regime (above 6 keV) with similiar photon flux density. For typical imaging applications, a double multilayer monochromator or a filtered white beam is used. In order to optimise the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 16-bit dynamic range slow-scan CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. The moderate flux of both beamlines compared to other 3rd generation light sources is compensated by a dedicated scintillator concept. For selected applications, X-ray beam collimation has proven to be a reliable approach to increase the available photon flux density. Absorption contrast, phase contrast, holotomography and refraction-enhanced imaging are used depending on the application. Additionally, at the TopoTomo beamline digital white beam synchrotron topography is performed, using the digital X-ray pixel detectors installed.

The synchrotron-based imaging station for micro- radiography and -tomography at the BAMline (BESSY)

Third generation synchrotron light sources allow one to image micro-structured, multi-component specimens with different contrast modalities and resolutions up to the submicrometer range, thanks to their high brilliance and partial coherence. An imaging setup for micro-tomography and -radiography installed at BESSY as part of its first hard X-ray beamline (BAMline) can now be used for absorption, refraction as well as phase contrast. The experimental station is dedicated to in-house research and applications by external users. Monochromatic synchrotron light between 6 keV and 80 keV is attained via a fully automated double multilayer monochromator. We show the suitability of the setup for several applications from materials research.

Terahertz spectral computed tomography

The novel technique of spectral THz computed tomography is demonstrated at an example of a small plastic figure. The data are reconstructed by conventional filtered back-projection. The reconstruction are discussed.

Micro-Diagnostics: X-ray and Synchrotron Techniques

Beyond classical X-ray techniques are used for the purpose of preferably short-term applications, but some supplementary X-ray and synchrotron techniques for higher resolution microdiagnostics take advantage of scattering effects. In contrast to directly imaging methods their resolution is only limited by the diffraction limit of the X-ray wavelength, far below the atomic dimensions. These techniques of scanning topography and refraction synchrotron tomography may permit the systematic diagnostics for finding and exploiting structure/property relations like correlations among atomic, nano and microstructures with macroscopic properties. Their basic advantage over microscopic techniques is their potential for the non-destructive characterisation of materials, far from invasive sample treatments. They combine scattering and spatial resolution.

The charge of solid-liquid interfaces measured by x-ray standing waves and streaming current.

Measurements of ion distributions at a charged solid-liquid interface using X-ray standing waves (XSW) are presented. High energy synchrotron radiation (17.48 keV) is used to produce an XSW pattern inside a thin water film on a silicon wafer. The liquid phase is an aqueous solution containing Br and Rb ions. The surface charge is adjusted by titration. Measurements are performed over a pH range from 2.2-9, using the native Si oxide layer and functional (amine) groups as surface charge. The Debye length, indicating the extension of the diffuse layer, could be measured with values varying between 1-4 nm. For functionalized wafers, the pH dependent change from attraction to repulsion of an ion species could be detected, indicating the isoelectric point. In combination with the measurement of the streaming current, the surface charge of the sample could be quantified.