Beth R. Cook
Micron Technology
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Publication
Featured researches published by Beth R. Cook.
international electron devices meeting | 2014
John K. Zahurak; Koji Miyata; Mark Fischer; Murali Balakrishnan; Sameer Chhajed; David H. Wells; Hong Li; Alessandro Torsi; Jay Lim; Mark S. Korber; Keiichi Nakazawa; Satoru Mayuzumi; Motonari Honda; Scott E. Sills; Shuichiro Yasuda; Alessandro Calderoni; Beth R. Cook; Gowri Damarla; Hai Tran; Bei Wang; Chris Cardon; Kamal M. Karda; Jun Okuno; Adam Johnson; Takafumi Kunihiro; Jun Sumino; Masanori Tsukamoto; Katsuhisa Aratani; Nirmal Ramaswamy; Wataru Otsuka
A 27nm 16Gb Cu based NV Re-RAM chip has been demonstrated. Novel process introduction to enable this technology include a Damascene Cell, Line-SAC Digit Lines filled with Cu, exhumed-silicided array contacts, raised epitaxial arrays, and high-drive buried access devices.
Archive | 2013
Durai Vishak Nirmal Ramaswamy; Lei Bi; Beth R. Cook; Dale W. Collins
Archive | 2014
Qian Tao; Matthew N. Rocklein; Beth R. Cook; D. V. Nirmal Ramaswamy
Archive | 2012
D. V. Nirmal Ramaswamy; Beth R. Cook; Lei Bi; Ian C. Laboriante
Archive | 2017
Scott E. Sills; Beth R. Cook; Nirmal Ramaswamy
Archive | 2016
Beth R. Cook; Nirmal Ramaswamy; Shuichiro Yasuda; Scott E. Sills; Koji Miyata
Archive | 2015
Qian Tao; Matthew N. Rocklein; Beth R. Cook; D. V. Nirmal Ramaswamy
Archive | 2014
Lei Bi; Beth R. Cook; Marko Milojevic; Durai Vishak Nirmal Ramaswamy
Archive | 2014
Scott E. Sills; Muralikrishnan Balakrishnan; Beth R. Cook; Durai Vishak Nirmal Ramaswamy; Yasuda Shuichiro
Archive | 2013
D. V. Nirmal Ramaswamy; Beth R. Cook; Lei Bi; Ian C. Laboriante
