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Dive into the research topics where Bg Bart Vossen is active.

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Featured researches published by Bg Bart Vossen.


Angewandte Chemie | 2013

Electron Micrographic Digital Image Correlation: Method Optimization and Microstructural banding Case Study

Jpm Johan Hoefnagels; Bg Bart Vossen; Cemal Cem Tasan

Segregation-induced microstructural banding is commonly encountered in commercial steels, yet its effect on the global mechanical behavior is disputed in the literature due to the difficulty of designing clean control experiments. This work locally compares the deformation of banded phases with unbanded regions in the same microstructure from in-situ electron micrographs analyzed with (optimized) micrographic digital image correlation. To this end, first, the employed electron micrographic digital image correlation (EMDIC) methodology is optimized in terms of its experimental parameters: specimen surface preparation settings, scanning electron microscopy imaging settings (contrast modes, magnification, resolution, and contrast-brightness), and image correlation settings (facet size and facet step size). Subsequently, the strength of the (optimized) EMDIC methodology is demonstrated on a case study on segregation-induced microstructural banding in steel, in which the influence of the banded phase and its morphology is probed by comparing the mechanical behavior of two carefully chosen, extreme cases of banded microstructures: a microstructure containing a continuous, hard band (the martensitic-ferritic system) and a microstructure containing non-continuous, softer bands (the pearlitic-ferritic system). The obtained micro-scale strain fields yield clear insight into the influence of band structure, morphology and band material properties.


Archive | 2018

Advances in Delamination Modeling of Metal/Polymer Systems: Continuum Aspects

Olaf van der Sluis; Bg Bart Vossen; J Jan Neggers; Ap Andre Ruybalid; Karthik Chockalingam; Ron Peerlings; J.P.M. Hoefnagels; Joris J. C. Remmers; V Varvara Kouznetsova; P.J.G. Schreurs; M.G.D. Geers

Adhesion and delamination have been pervasive problems hampering the performance and reliability of micro- and nano-electronic devices. In order to understand, predict, and ultimately prevent interface failure in electronic devices, development of accurate, robust, and efficient delamination testing and prediction methods is crucial. Adhesion is essentially a multi-scale phenomenon: at the smallest scale possible, it is defined by the thermodynamic work of adhesion. At larger scales, additional dissipative mechanisms may be active which results in enhanced adhesion at the macroscopic scale and are the main cause for the mode angle dependency of the interface toughness. Undoubtedly, the macroscopic adhesion properties are a complex function of all dissipation mechanisms across the scales. Thorough understanding of the significance of each of these dissipative mechanisms is of utmost importance in order to establish physically correct, unambiguous values of the adhesion properties, which can only be achieved by proper multi-scale techniques.


Materials | 2018

From Fibrils to Toughness: Multi-Scale Mechanics of Fibrillating Interfaces in Stretchable Electronics

Olaf van der Sluis; Tijmen Vermeij; Jan Neggers; Bg Bart Vossen; Mpfhl Marc van Maris; Jan Vanfleteren; Mgd Marc Geers; Jpm Johan Hoefnagels

Metal-elastomer interfacial systems, often encountered in stretchable electronics, demonstrate remarkably high interface fracture toughness values. Evidently, a large gap exists between the rather small adhesion energy levels at the microscopic scale (‘intrinsic adhesion’) and the large measured macroscopic work-of-separation. This energy gap is closed here by unravelling the underlying dissipative mechanisms through a systematic numerical/experimental multi-scale approach. This self-containing contribution collects and reviews previously published results and addresses the remaining open questions by providing new and independent results obtained from an alternative experimental set-up. In particular, the experimental studies on Cu-PDMS (Poly(dimethylsiloxane)) samples conclusively reveal the essential role of fibrillation mechanisms at the micro-meter scale during the metal-elastomer delamination process. The micro-scale numerical analyses on single and multiple fibrils show that the dynamic release of the stored elastic energy by multiple fibril fracture, including the interaction with the adjacent deforming bulk PDMS and its highly nonlinear behaviour, provide a mechanistic understanding of the high work-of-separation. An experimentally validated quantitative relation between the macroscopic work-of-separation and peel front height is established from the simulation results. Finally, it is shown that a micro-mechanically motivated shape of the traction-separation law in cohesive zone models is essential to describe the delamination process in fibrillating metal-elastomer systems in a physically meaningful way.


Journal of The Mechanics and Physics of Solids | 2014

Multi-scale modelling of delamination through fibrillation

Bg Bart Vossen; Pjg Piet Schreurs; van der O Olaf Sluis; Mgd Marc Geers


Computer Methods in Applied Mechanics and Engineering | 2013

On the lack of rotational equilibrium in cohesive zone elements

Bg Bart Vossen; Pjg Piet Schreurs; van der O Olaf Sluis; Mgd Marc Geers


Mechanics of Materials | 2015

On the role of fibril mechanics in the work of separation of fibrillating interfaces

Bg Bart Vossen; van der O Olaf Sluis; Pjg Piet Schreurs; Mgd Marc Geers; J Jan Neggers; Jpm Johan Hoefnagels


Engineering Fracture Mechanics | 2016

High toughness fibrillating metal-elastomer interfaces: on the role of discrete fibrils within the fracture process zone

Bg Bart Vossen; van der O Olaf Sluis; Pjg Piet Schreurs; Mgd Marc Geers


Archive | 2015

High toughness fibrillating interfaces in stretchable electronics a multi-scale numerical and experimental analysis.

O. van der Sluis; Bg Bart Vossen; Jan Neggers; J.P.M. Hoefnagels; P.J.G. Schreurs; M.G.D. Geers


Archive | 2014

Why are fibrillating interfaces so tough

Bg Bart Vossen; van der O Olaf Sluis; Pjg Piet Schreurs; Mgd Marc Geers; D Keijzers; J Jan Neggers; Jpm Johan Hoefnagels


Archive | 2013

MaTe cluster manual : how to use a LINUX cluster with PBS queuing system

de Twj Tom Geus; Jan Neggers; Bg Bart Vossen

Collaboration


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Mgd Marc Geers

Eindhoven University of Technology

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van der O Olaf Sluis

Eindhoven University of Technology

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Pjg Piet Schreurs

Eindhoven University of Technology

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Jpm Johan Hoefnagels

Eindhoven University of Technology

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J Jan Neggers

Eindhoven University of Technology

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Jan Neggers

Université Paris-Saclay

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J.P.M. Hoefnagels

Eindhoven University of Technology

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M.G.D. Geers

Eindhoven University of Technology

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P.J.G. Schreurs

Eindhoven University of Technology

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Cemal Cem Tasan

Massachusetts Institute of Technology

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