Byeong-Seon An

Quantification of crystallinity using zero-loss filtered electron diffraction

The quantity of the crystalline phases present in a nanomaterial is an important parameter that governs the correlation between its properties and microstructure. However, quantification of crystallinity in nanoscale‐level applications by conventional methods (Raman spectroscopy and X‐ray diffraction) is difficult because of the spatial limitations of sampling. Therefore, we propose a technique that involves using energy‐filtered electron diffraction in transmission electron microscopy which offers improved spatial resolution. The degree of crystallinity (DOC) was calculated by separating the crystalline and amorphous intensities from the total intensity histogram acquired by the azimuthal averaging of the zero‐loss filtered signals from electron diffraction. In order to validate the method, it was demonstrated that the DOC calculated by zero‐loss filtered electron diffraction was consistent with the DOC measured by the area ratio using an amorphous silicon on crystalline silicon standard sample. In addition, the results obtained from zero‐loss filtered and conventional electron diffractions were compared. The zero‐loss filtered electron diffraction successfully provided the reliable results of the crystallinity quantification. In contrast, the DOC measured using conventional electron diffraction yielded extremely variable results. Therefore, our results provide a crystallinity quantification technique that can extract quantitative information about crystallinity of nanoscale devices by using zero‐loss filtered electron diffraction with better reliability than conventional electron diffraction.

Investigation of Zirconium Effect on the Corrosion Resistance of Aluminum Alloy Using Electrochemical Methods and Numerical Simulation in an Acidified Synthetic Sea Salt Solution

Corrosion resistance of Zr that has been added to an Al alloy (U1070) is higher than that of a commercial Al alloy (A1070). A decreasing number and size of Al3Fe intermetallic particles (IMPs) were observed by electron microprobe analysis and transmission electron microscopy. Based on the numerical corrosion simulation, it was confirmed that decreasing the number and size of IMPs was favorable for improving the corrosion resistance of the Al alloy due to the reduction of the galvanic effect. In addition, Al3Zr was found to be insignificant in promoting galvanic corrosion within the Al matrix. Thus, Zr is an advantageous alloying element for improving the corrosion resistance of the Al alloy.

Epitaxial-Growth-Induced Junction Welding of Silver Nanowire Network Electrodes

In this study, we developed a roll-to-roll Ag electroplating process for metallic nanowire electrodes using a galvanostatic mode. Electroplating is a low-cost and facile method for deposition of metal onto a target surface with precise control of both the composition and the thickness. Metallic nanowire networks [silver nanowires (AgNWs) and copper nanowires (CuNWs)] coated onto a polyethylene terephthalate (PET) film were immersed directly in an electroplating bath containing AgNO3. Solvated silver ions (Ag+ ions) were deposited onto the nanowire surface through application of a constant current via an external circuit between the nanowire networks (cathode) and a Ag plate (anode). The amount of electroplated Ag was systematically controlled by changing both the applied current density and the electroplating time, which enabled precise control of the sheet resistance and optical transmittance of the metallic nanowire networks. The optimized Ag-electroplated AgNW (Ag-AgNW) films exhibited a sheet resistance of ∼19 Ω/sq at an optical transmittance of 90% (550 nm). A transmission electron microscopy study confirmed that Ag grew epitaxially on the AgNW surface, but a polycrystalline Ag structure was formed on the CuNW surface. The Ag-electroplated metallic nanowire electrodes were successfully applied to various electronic devices such as organic light-emitting diodes, triboelectric nanogenerators, and a resistive touch panel. The proposed roll-to-roll Ag electroplating process provides a simple, low-cost, and scalable method for the fabrication of enhanced transparent conductive electrode materials for next-generation electronic devices.