C. Venanzi

A Multi-Element Detector System for Intelligent Imaging: I-ImaS

I-ImaS is a European project aiming to produce new, intelligent X-ray imaging systems using novel APS sensors to create optimal diagnostic images. Initial systems concentrate on mammography and encephalography. Later development will yield systems for other types of radiography such as industrial QA and homeland security. The I-ImaS system intelligence, due to APS technology and FPGAs, allows real-time analysis of data during image acquisition, giving the capability to build a truly adaptive imaging system with the potential to create images with maximum diagnostic information within given dose constraints. A companion paper deals with the DAQ system and preliminary characterization. This paper considers the laboratory X-ray characterization of the detector elements of the I-ImaS system. The characterization of the sensors when tiled to form a strip detector will be discussed, along with the appropriate correction techniques formulated to take into account the misalignments between individual sensors within the array. Preliminary results show that the detectors have sufficient performance to be used successfully in the initial mammographic and encephalographic I-ImaS systems under construction and this paper will further discuss the testing of these systems and the iterative processes used for intelligence upgrade in order to obtain the optimal algorithms and settings.

Adaptive image content-based exposure control for scanning applications in radiography

I-ImaS (Intelligent Imaging Sensors) is a European project which has designed and developed a new adaptive X-ray imaging system using on-line exposure control, to create locally optimized images. The I-ImaS system allows for real-time image analysis during acquisition, thus enabling real-time exposure adjustment. This adaptive imaging system has the potential of creating images with optimal information within a given dose constraint and to acquire optimally exposed images of objects with variable density during one scan. In this paper we present the control system and results from initial tests on mammographic and encephalographic images. Furthermore, algorithms for visualization of the resulting images, consisting of unevenly exposed image regions, are developed and tested. The preliminary results show that the same image quality can be achieved at 30-70% lower dose using the I-ImaS system compared to conventional mammography systems.

A scanning system for intelligent imaging: I-ImaS

I-ImaS (Intelligent Imaging Sensors) is a European project aiming to produce adaptive x-ray imaging systems using Monolithic Active Pixel Sensors (MAPS) to create optimal diagnostic images. Initial systems concentrate on mammography and cephalography. The on-chip intelligence available to MAPS technology will allow real-time analysis of data during image acquisition, giving the capability to build a truly adaptive imaging system with the potential to create images with maximum diagnostic information within given dose constraints. In our system, the exposure in each image region is optimized and the beam intensity is a function not only of tissue thickness and attenuation, but also of local physical and statistical parameters found in the image itself. Using a linear array of detectors with on-chip intelligence, the system will perform an on-line analysis of the image during the scan and then will optimize the X-ray intensity in order to obtain the maximum diagnostic information from the region of interest while minimizing exposure of less important, or simply less dense, regions. This paper summarizes the testing of the sensors and their electronics carried out using synchrotron radiation, x-ray sources and optical measurements. The sensors are tiled to form a 1.5D linear array. These have been characterised and appropriate correction techniques formulated to take into account misalignments between individual sensors. Full testing of the mammography and cephalography I-ImaS prototypes is now underway and the system intelligence is constantly being upgraded through iterative testing in order to obtain the optimal algorithms and settings.

Optical and x-ray characterization of two novel CMOS image sensors

A UK consortium (MI3) has been founded to develop advanced CMOS pixel designs for scientific applications. Vanilla, a 520x520 array of 25&mgr;m pixels benefits from flushed reset circuitry for low noise and random pixel access for region of interest (ROI) readout. OPIC, a 64x72 test structure array of 30&mgr;m digital pixels has thresholding capabilities for sparse readout at 3,700fps. Characterization is performed with both optical illumination and x-ray exposure via a scintillator. Vanilla exhibits 34±3e- read noise, interactive quantum efficiency of 54% at 500nm and can read a 6x6 ROI at 24,395fps. OPIC has 46±3e- read noise and a wide dynamic range of 65dB due to high full well capacity. Based on these characterization studies, Vanilla could be utilized in applications where demands include high spectral response and high speed region of interest readout while OPIC could be used for high speed, high dynamic range imaging.

Design and Characterization of the I-ImaS Multi-Element X-Ray Detector System

I-ImaS (Intelligent Imaging Sensors) is a European project aiming to produce new, intelligent X-ray imaging systems using novel APS sensors to create optimal diagnostic images. Initial systems have been constructed for medical imaging; specifically mammography and dental encephalography. However, the I-ImaS system concept could be applied to all areas of X-ray imaging, including homeland security and industrial QA. The I-ImaS system intelligence is implemented by the use of APS technology and FPGAs, allowing real-time analysis of data during image acquisition. This gives the system the capability to perform as an on-the-fly adaptive imaging system, with the potential to create images with maximum diagnostic information within given dose constraints. The I-ImaS system uses a scanning linear array of scintillator-coupled 1.5-D CMOS Active Pixel Sensors to create a full 2-D X-ray image of an object. This paper describes the parameters considered when choosing the scintillator elements of the detectors. A study of the positioning of the sensors to form a linear detector is also considered, along with a discussion of the potential losses in image quality associated with creating a linear sensor by tiling many smaller sensors. Preliminary results show that the detectors have sufficient performance to be used successfully in the initial mammographic and encephalographic I-ImaS systems that are currently under construction.

A new front-end electronics design for silicon drift detector

Silicon drift detectors (SDD) are state of the art devices for spectroscopy applications. The utmost energy resolution can be obtained by means of low noise front-end electronics, having shaping time of the order of microseconds. We are proposing a new front-end electronics for applications that may benefit from higher rate capability while maintaining a reasonable spectroscopic resolution. The idea is to combine a high speed semi-Gaussian shaping amplifier (originally designed for gas detectors) with very compact high speed low noise input-output stages. The shaper amplifier is implemented in hybrid technology. The shaping time can be controlled from fins to ions.