Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by C Zhao.
International symposium on advanced gate stack, source/frain and channel engineering for Si-based CMOS | 2005
S. De Gendt; D.P. Brunco; Matty Caymax; Thierry Conard; L. Date; Annelies Delabie; W. Deweerd; G. Groeseneken; M. Housaa; Sangjin Hyun; V. Kaushik; S. Kubicek; J. W. Maes; L. Pantisano; Lars-Ake Ragnarsson; E. Rohr; T. Schram; Yasuhiro Shimamoto; Erik Sleeckx; Wilfried Vandervorst; S. Van Elshocht; Kazuhiko Yamamoto; T. Winers; C Zhao; Paul Zimmerman; M. Heyns
ECS Transactions | 2007
C. Adelmann; S. Van Elshocht; P. Lehnen; Thierry Conard; A. Franquet; C Zhao; Lars-Ake Ragnarsson; Chang; Hyunyoon Cho; H.Y. Yu; Stefan De Gendt
Archive | 2006
David Paul Brunco; A. Dimoulas; Michel Houssa; Thierry Conard; C Zhao; Florence Bellenger; Matty Caymax; J. Van Steenbergen; M Meuris; Marc Heyns
Analytical and diagnostic techniques for semiconductor materials, devices, and processes | 2003
C Zhao; Stefan DeGendt; Matty Caymax; Marc Heyns; Consier; J. W. Maes; Gert Roebben; Omer Van der Biest
Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes | 2003
C Zhao; Bert Brijs; F Dortu; Stefan DeGendt; Matty Caymax; Marc Heyns; W.F.A. Besling; J. W. Maes
Proc. 15th International Plansee Seminar | 2001
Jef Vleugels; I Volders; Stijn Put; C Zhao; Omer Van der Biest; C Groffils; P.J Luypaert; G Barbier; L Bourgeois
2nd Belgian Crystallography Symposium | 2001
Gert Roebben; R.G Duan; Jef Vleugels; Omer Van der Biest; C Zhao; M. Heyns
presented at 4th Annual Meeting of the Belgian Ceramics Society | 2000
C Zhao; Jef Vleugels; L Vandeperre; Omer Van der Biest
11th Workshop on Dielectric in Microelectronics | 2000
C Zhao; Gert Roebben; E. Young; Hugo Bender; Michel Houssa; Mohamed Naili; S. De Gendt; M. Heyns; Omer Van der Biest
presented at 'European Conference on Advances in Hard Materials Production' | 1999
C Zhao; Jef Vleugels; Omer Van der Biest
