Catherine Durand
Commissariat à l'énergie atomique et aux énergies alternatives
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Featured researches published by Catherine Durand.
Occupational and Environmental Medicine | 2016
Irina Guseva Canu; Delphine Jezewski-Serra; Laurène Delabra; Stéphane Ducamp; Yuriko Iwatsubo; Sabyne Audignon-Durand; C. Ducros; Anca Radauceanu; Olivier Witschger; Catherine Durand; Emmanuel Flahaut
Inter-method reliability is a measure of the ability of two different methods which evaluate the same underlying exposure to yield similar results on the same subjects. In this study we compared an observational “EpiNano-method” developed for assessing exposure to nano-objects and their agglomerates and aggregates (NOAA) in workplaces within the framework of the French epidemiological surveillance program EpiNano with a more accurate but more expensive and time-consuming “Reference-method”. Methods EpiNano-method consists in an onsite visit of facilities and an observation of workstations where NOAA are present using a standardised tool, the Onsite technical logbook. Reference-method involved an onsite visit, interviews with operators and supervisors, analysis of the available exposure measurements data, a debriefing meeting and an expert’s report to validate results through consensus. Seven workstations which synthesise and functionalize carbon nanotubes were assessed by Reference-method and by EpiNano-method implemented by three evaluators. All statistics were calculated based on pairwise comparisons of the evaluator’s respective results with the results from the Reference-method by using mainly Spearman correlation coefficients (ρ) and weighted Fleiss kappa (kF). Results The prediction of exposure to NOAA using EpiNano-method exhibited substantial agreement with that of the reference method ((kF = 0.70, sensitivity = 0.88, specificity = 0.92). The best reliability of quantitative exposure scores was found for the EpiNano-method results of Evaluator#1, when comparing with the Reference-method (ρ = 0.75). The correlation was positive but of moderate strength (ρ = 0.57) for Evaluator#2 and negative for Evaluator#3. When comparing the semi-quantitative exposure potential variable almost perfect correlation was found; all but one workstation were classified in the first category corresponding to “Negligible to low” exposure potential. Conclusion This study allowed a first validation of the EpiNano-method. However, it should be confirmed by further comparison with more robust quantitative exposure measurement data, available for a larger workstation number, with more contrasting exposure conditions and various types of NOAA.
28. Congrès Français sur les Aérosols (CFA 2013) | 2013
Olivier Witschger; Olivier Le Bihan; Catherine Durand; Eric Zimmermann; Alain Marchetto; Martine Reynier; Dominique Charpentier
Annals of Work Exposures and Health | 2017
Irina Guseva Canu; Delphine Jezewski-Serra; L. Delabre; S. Ducamp; Yuriko Iwatsubo; Sabine Audignon-Durand; C. Ducros; Anca Radauceanu; Catherine Durand; Olivier Witschger; Emmanuel Flahaut
Cahiers de Notes Documentaires - Hygiène et Sécurité du Travail | 2012
Olivier Witschger; Olivier Le Bihan; Martine Reynier; Catherine Durand; Alain Marchetto; Eric Zimmermann; Dominique Charpentier
3. International Conference on Safe Production and Use of Nanomaterials (Nanosafe 2012) | 2012
Catherine Durand; Olivier Witschger; Olivier Le Bihan; Eric Zimmermann; Alain Marchetto; Martine Reynier; Dominique Charpentier
Archives Des Maladies Professionnelles Et De L Environnement | 2016
I. Guseva Canu; Delphine Jezewski-Serra; L. Delabre; S. Ducamp; Yuriko Iwatsubo; Sabyne Audignon-Durand; C. Ducros; Anca Radauceanu; Olivier Witschger; Catherine Durand; Emmanuel Flahaut
Archives Des Maladies Professionnelles Et De L Environnement | 2016
Kathleen Chami; Anca Radauceanu; Myriam Ricaud; D. Payen; Catherine Durand; S. Kowal; C. Ducros; P. Richard; I. Guseva Canu
Archives Des Maladies Professionnelles Et De L Environnement | 2015
I. Guseva Canu; S. Ducamp; L. Delabre; Sabyne Audignon-Durand; C. Ducros; Catherine Durand; Yuriko Iwatsubo; Delphine Jezewski-Serra; O. Le Bihan; Stéphane Malard; Anca Radauceanu; Martine Reynier; Myriam Ricaud; Olivier Witschger
International Congress on Safety of Engineered Nanoparticles and Nanotechnologies (SENN2012) | 2012
Olivier Witschger; Olivier Le Bihan; Martine Reynier; Catherine Durand; Alain Marchetto; Dominique Charpentier
Archive | 2009
Alain Soubie; Jean Brun; Catherine Durand