Charles Chester Anderson
Eastman Kodak Company
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Featured researches published by Charles Chester Anderson.
MRS Proceedings | 1998
Joseph S. Sedita; Andy H. Tsou; Charles Chester Anderson; B. A. Wohlschlegel
The microscratch behavior of poly(methyl methacrylate) (PMMA) coatings on flexible substrates of cellulose acetate (CA) and poly(ethylene terephthalate) (PET) was evaluated using the NanoTest 550 microscratch device with a 3-micron radius, 60-degree conical-angle diamond stylus in ramped load from 0.3 to 10 mN. Tensile surface cracking was observed within 6–8 mN for all coatings regardless of coating thickness (from 0.2 to 3 microns). For the same coating thickness, PMMA on PET cracked at lower loads than PMMA on CA because of PET substrate deformation. Coating removal of PMMA was also found, but at higher loads following the tensile cracking. Onset of severe coating damage/removal in PMMA coatings was found to be dependent on coating thickness. The ranking of various PMMA coatings in terms of their extent of microscratching damage was comparable to their rankings based on Taber abrasion results. This suggested that only the severe coating damage on PMMA could be detected by the Taber abrasion test.
Archive | 2005
Todd Mathew Spath; Glen C. Irvine Jr.; Debasis Majumdar; Ronald S. Cok; Charles Chester Anderson
Archive | 2006
Todd Mathew Spath; Glen C. Irvin; Devashish Majumdar; Charles Chester Anderson
Archive | 1995
Paul Albert Christian; Charles Chester Anderson
Archive | 1990
Charles Chester Anderson; Diane Ellen Kestner; Mark Alan Lewis; Gary Richard Opitz
Archive | 2005
Todd Mathew Spath; Glen C. Irvin; Debasis Majumdar; Ronald S. Cok; Charles Chester Anderson
Archive | 2005
Glen C. Irvin; Debasis Majumdar; Charles Chester Anderson; Lawrence A. Rowley; Gary Scot Freedman
Archive | 1993
Charles Chester Anderson; Mario Dennis Delaura; Paul Albert Christian; Ibrahim M Shalhoub; David F. Jennings
Archive | 2004
Debasis Majumdar; Glen C. Irvin; Charles Chester Anderson; Lee W. Tutt; Gary Scot Freedman; Leonard S. Gates
Archive | 2006
Glen C. Irvin; Todd Mathew Spath; Charles Chester Anderson; Lawrence A. Rowley; Debasis Majumdar