Brian Andrew Schell
Eastman Kodak Company
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Featured researches published by Brian Andrew Schell.
Advances in Resist Technology and Processing X | 1993
Allen H. Gabor; Eric A. Lehner; Guoping Mao; Christopher K. Ober; Timothy E Long; Brian Andrew Schell; Richard C. Tiberio
Block copolymers are a class of polymers deserving of more investigation by the resist community. We are investigating styrene-hydrosiloxane modified diene block copolymers which have good properties for use as negative tone, electron sensitive resists. Resolution better than 0.1 micrometers , sensitivity of 30 (mu) C/cm2 and contrast of 2.8 have been demonstrated using a poly(styrene)-pentamethyldisiloxane modified poly(isoprene) block copolymer (PS-b-PDPI). Used in a bilayer resist scheme, PS-b-PDPI has an oxygen RIE selectivity ratio of 42 with respect to poly(imide). A poly(styrene)-heptamethyltrisiloxane modified poly(butadiene) block copolymer (PS-b-HTPB) has an oxygen RIE selectivity ratio of 54 with respect to poly(imide). In a bilayer resist system, using PS-b-PDPI as the imageable layer, patterns of 0.3 micrometers wide lines and 1.5 micrometers wide spaces have been transferred through a 1.2 micrometers thick poly(imide) planarizing layer.
Archive | 1996
Dennis Jeffrey Savage; Brian Andrew Schell; Brian Kenneth Brady
Archive | 1923
Charles Chester Anderson; Brian Andrew Schell; Debasis Majumdar; Mario Dennis Delaura
Archive | 2000
Mridula Nair; Tamara K. Jones; Lloyd Anthony Lobo; Brian Andrew Schell
Archive | 1998
Charles Chester Anderson; Brian Andrew Schell; Mario Dennis Delaura
Archive | 1996
Charles Chester Anderson; Brian Andrew Schell; Yongcai Wang
Archive | 1997
Brian Andrew Schell; Charles Chester Anderson; Kenneth Lloyd Tingler; Yongcai Wang
Archive | 1998
Charles Chester Anderson; Brian Andrew Schell; Yongcai Wang; Mario Dennis Delaura
Archive | 1996
Brian Andrew Schell; Mridula Nair
Archive | 1999
Mridula Nair; Tamara K. Jones; Lloyd Anthony Lobo; Brian Andrew Schell