Charlotte Platzer-Björkman

A Detrimental Reaction at the Molybdenum Back Contact in Cu2ZnSn(S,Se)4 Thin-Film Solar Cells

Experimental proof is presented for a hitherto undetected solid-state reaction between the solar cell material Cu(2)ZnSn(S,Se)(4) (CZTS(e)) and the standard metallic back contact, molybdenum. Annealing experiments combined with Raman and transmission electron microscopy studies show that this aggressive reaction causes formation of MoS(2) and secondary phases at the CZTS|Mo interface during thermal processing. A reaction scheme is presented and discussed in the context of current state-of-the-art synthesis methods for CZTS(e). It is concluded that alternative back contacts will be important for future improvements in CZTS(e) quality.

Zn(O,S) buffer layers by atomic layer deposition in Cu(In,Ga)Se2 based thin film solar cells: Band alignment and sulfur gradient

Thin film solar cells with the structure sodalimeglass∕Mo∕Cu(In,Ga)Se2∕Zn(O,S)∕ZnO∕ZnO:Al are studied for varying thickness and sulfur content of the Zn(O,S) buffer layer. These Zn(O,S) layers were deposited by atomic layer deposition (ALD) at 120°C. Devices with no or small concentrations of sulfur in the buffer layer show low open-circuit voltages. This is explained by the cliff, or negative conduction-band offset (CBO), of −0.2eV measured by photoelectron spectroscopy (PES) and optical methods for the Cu(In,Ga)Se2 (CIGS)∕ZnO interface. Devices with ZnS buffer layers exhibit very low photocurrent. This is expected from the large positive CBO (spike) of 1.2eV measured for the CIGS∕ZnS interface. For devices with Zn(O,S) buffer layers, two different deposition recipes were found to yield devices with efficiencies equal to or above reference devices in which standard CdS buffer layers were used; ultrathin Zn(O,S) layers with S∕Zn ratios of 0.8–0.9, and Zn(O,S) layers of around 30nm with average S∕Zn ratios...

A low-temperature order-disorder transition in Cu2ZnSnS4 thin films

Cu2ZnSnS4 (CZTS) is an interesting material for sustainable photovoltaics, but efficiencies are limited by the low open-circuit voltage. A possible cause of this is disorder among the Cu and Zn cations, a phenomenon which is difficult to detect by standard techniques. We show that this issue can be overcome using near-resonant Raman scattering, which lets us estimate a critical temperature of 533 ± 10 K for the transition between ordered and disordered CZTS. These findings have deep significance for the synthesis of high-quality material, and pave the way for quantitative investigation of the impact of disorder on the performance of CZTS-based solar cells.

Direct evidence of current blocking by ZnSe in Cu2ZnSnSe4 solar cells

Thin films of polycrystalline Cu2ZnSnSe4 were made by selenization of co-sputtered metallic precursors and processed to solar cells. Electron beam induced current (EBIC) in combination with microsc ...

Inline Cu(In,Ga)Se

In this paper, co-evaporation of Cu(In,Ga)Se2 (CIGS) in an inline single-stage process is used to fabricate solar cell devices with up to 18.6% conversion efficiency using a CdS buffer layer and 18.2% using a Zn1-xSnxOy Cd-free buffer layer. Furthermore, a 15.6-cm2 mini-module, with 16.8% conversion efficiency, has been made with the same layer structure as the CdS baseline cells, showing that the uniformity is excellent. The cell results have been externally verified. The CIGS process is described in detail, and material characterization methods show that the CIGS layer exhibits a linear grading in the [Ga]/([Ga]+[In]) ratio, with an average [Ga]/([Ga]+[In]) value of 0.45. Standard processes for CdS as well as Cd-free alternative buffer layers are evaluated, and descriptions of the baseline process for the preparation of all other steps in the Ångström Solar Center standard solar cell are given.

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Abstract Solar cells based on CuInSe2 (CIS) and Cu(In,Ga)Se2 (CIGS), with a ZnO buffer layer deposited by atomic layer deposition (ALD), are compared to their reference cells; (CIS or CIGS)/CdS/ZnO. While the CIS/ZnO devices show only slightly lower efficiencies compared to their reference cells, the difference between the CIGS/ZnO devices and their reference cells is larger. In the latter case, the main difference is the lower open circuit voltage of approximately 200 mV of the direct ZnO devices. The valence band offset between CIS and ZnO is determined by ultraviolet photoelectron spectroscopy to −2.2 eV which gives a conduction band offset, ΔEc, of +0.1±0.2 eV. This slightly positive offset is in contrast to our previous result for the CIGS/ZnO interface of ΔEc=−0.2±0.2 eV, and is a possible explanation for the much lower voltage loss observed for the CIS/ZnO devices. Zn diffusion into the different absorbers is investigated by energy dispersive X-ray spectroscopy on transmission electron microscope cross-sections prepared from direct ZnO devices. These cross-sections also show very good coverage of the absorber surface by the (ALD)ZnO layer.

Co-evaporation for High-Efficiency Solar Cells and Modules

To improve the conduction band alignment and explore the influence of the buffer-absorber interface, we here investigate an alternative buffer for Cu2ZnSnS4 (CZTS) solar cells. The Zn(O, S) system was chosen since the optimum conduction band alignment with CZTS is predicted to be achievable, by varying oxygen to sulfur ratio. Several sulfur to oxygen ratios were evaluated to find an appropriate conduction band offset. There is a clear trend in open-circuit voltage (Voc), with the highest values for the most sulfur rich buffer, before going to the blocking ZnS, whereas the fill factor peaks at a lower S content. The best alternative buffer cell in this series had an efficiency of 4.6% and the best CdS reference gave 7.3%. Extrapolating Voc values to 0 K gave activation energies well below the expected bandgap of 1.5 eV for CZTS, which indicate that recombination at the interface is dominating. However, it is clear that the values are affected by the change of buffer composition and that increasing sulfur content of the Zn(O, S) increases the activation energy for recombination. A series with varying CdS buffer thickness showed the expected behavior for short wavelengths in quantum efficiency measurements but the final variation in efficiency was small.

Interface study of CuInSe2/ZnO and Cu(In, Ga)Se2/ZnO devices using ALD ZnO buffer layers

Cu2ZnSnS4 (CZTS) solar cells typically include a CdS buffer layer in between the CZTS and ZnO front contact. For sulfide CZTS, with a bandgap around 1.5 eV, the band alignment between CZTS and CdS ...

Zn(O, S) Buffer Layers and Thickness Variations of CdS Buffer for Cu

Abstract Metal hydrides have earlier been suggested for utilization in solar cells. With this as a motivation we have prepared thin films of yttrium hydride by reactive magnetron sputter deposition. The resulting films are metallic for low partial pressure of hydrogen during the deposition, and black or yellow-transparent for higher partial pressure of hydrogen. Both metallic and semiconducting transparent YH x films have been prepared directly in situ without the need of capping layers and post-deposition hydrogenation. Optically the films are similar to what is found for YH x films prepared by other techniques, but the crystal structure of the transparent films differ from the well-known YH 3− η phase, as they have an fcc lattice instead of hcp.

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Photoluminescence (PL) is commonly used for investigations of Cu2ZnSnS(e)4 [CZTS(e)] and Cu(In,Ga)Se2 (CIGS) thin film solar cells. The influence of interference effects on these measurements is, however, largely overlooked in the community. Here, it is demonstrated that PL spectra of typical CZTS absorbers on Mo/glass substrates can be heavily distorted by interference effects. One reason for the pronounced interference in CZTS is the low reabsorption of the PL emission that typically occurs below the band gap. A similar situation occurs in band gap graded CIGS where the PL emission originates predominantly from the band gap minimum located at the notch region. Based on an optical model for interference effects of PL emitted from a thin film, several approaches to reduce the fringing are identified and tested experimentally. These approaches include the use of measured reflectance data, a calculated interference function, use of high angles of incidence during PL measurements as well as the measurement of polarized light near the Brewster angle.