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Cho Hyung-Suk

Samsung

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Publication

Featured researches published by Cho Hyung-Suk.

Archive | 1999

A view selecting apparatus for an X-ray inspection system

Kim Hyeong-Cheol; Cho Hyung-Suk; Kang Seong-Taek; Ko Guk-Won; Park Won-Sik; Roh Young-Jun

Archive | 2001

Verfahren und Vorrichtung zur Detektion von Mikrokratzern in einem Wafer

Jun Chung-Sam; Chon Sang-Mun; Choi Sang-Bong; Cho Hyung-Suk; Hyun Pil-Sik; Lim Kyu-Hong; Lee Byung-Am

Archive | 2017

ROTATION ANGLE MEASUREMENT MARKS AND METHODS OF MEASURING ROTATION ANGLE AND TRACING COORDINATES USING THE SAME

Yoon Doyoung; Cho Hyung-Suk

Archive | 2010

APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR DEVICE

Kim Young-Seok; Peak Jong-Sun; Kim Young-Nam; Cho Hyung-Suk; Kang Sun-Jin; Yoo Bu-Dl

Archive | 2002

MEASURING APPARATUS WITH MINUTE SIX DEGREES-OF-FREEDOM MOTION USING REFLECTOR

Cho Hyung-Suk; Park Won-Sik

Archive | 1999

IMAGE SELECTING DEVICE OF X-RAY INSPECTION SYSTEM

Kim Hyoung-Chul; Cho Hyung-Suk; Kang Seong-Taek; Ko Guk-Won; Park Won-Sik; Roh Young-Jun

Archive | 2017

DEFECT IMAGING APPARATUS, DEFECT DETECTION SYSTEM HAVING THE SAME, AND METHOD OF DETECTING DEFECTS USING THE SAME

Park Il-Suk; Cho Hyung-Suk

Archive | 2004

A method and a device for detecting micro-scratches

Chung-Samjun; Chon Sang-Mun; Choi Sang-Bong; Cho Hyung-Suk; Hyun Pil-Sik; Lim Kyu-Hong; Lee Byung-Am

Archive | 2003

METHOD FOR MEASURING THICKNESS OF THIN FILM

Jun Chung-Sam; Chon Sang-Moon; Hyun Pil-Sik; Cho Hyung-Suk; Sai Soho

Archive | 2002

Method of measuring etched state of semiconductor wafer

Cho Hyung-Suk; Chon Sang-Mun; Choi Sang-Bong; Chun Chung-Sam; Kang Min-Sub

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Choi Sang-Bong

Samsung

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Hyun Pil-Sik

Samsung

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Park Won-Sik

Samsung

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Chon Sang-Mun

Samsung

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Kang Seong-Taek

Samsung

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Ko Guk-Won

Samsung

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Lee Byung-Am

Samsung

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Roh Young-Jun

Samsung

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Jun Chung-Sam

Samsung

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Kim Hyeong-Cheol

Samsung

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