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Dive into the research topics where Jun Chung-Sam is active.

Publication


Featured researches published by Jun Chung-Sam.


Archive | 2006

INSPECTION METHOD OF PATTERN FORMED ON SUBSTRATE, AND INSPECTION APPARATUS FOR IMPLEMENTING SAME

Kin Keigen; Jun Chung-Sam; Chung Ki-Suk; Chon Sang-Moon; Kim Seong-Jin; Lee Byung Seok; Yang Yu-Sin


Archive | 2007

METHOD OF INSPECTING A DEFECT ON A SUBSTRATE

Park Sung-Hong; Yoon Young-Jee; Lim Jung-Taek; Jun Chung-Sam


Archive | 2001

METHOD FOR MEASURING THIN FILM THICKNESS AND DEVICE APPLIED WITH SAME

Jun Chung-Sam; Chon Sang-Moon; Sai Soho; Cho Keidai; Hyun Pil-Sik


Archive | 2002

METHOD AND DEVICE FOR INSPECTING POLISHING PAD

Jun Chung-Sam; Kim Kye-Weon; Yang Yu-Sin; Kim Hyo-Hoo


Archive | 2001

Verfahren und Vorrichtung zur Detektion von Mikrokratzern in einem Wafer

Jun Chung-Sam; Chon Sang-Mun; Choi Sang-Bong; Cho Hyung-Suk; Hyun Pil-Sik; Lim Kyu-Hong; Lee Byung-Am


Archive | 2002

Verfahren zur Farbvariationskorrektur und Defekterkennung für Wafer

Jun Chung-Sam; Chon Sang-Mun; Kim Hyoung-Jin; Lee Dong-Chun; Choi Sang-Bong; Ryu Sung-Gon


Archive | 2001

METHOD FOR INSPECTING MICRO-SCRATCH AND DEVICE THEREFOR USING THE SAME

Jun Chung-Sam; Chon Sang-Moon; Sai Soho; Cho Keidai; Hyun Pil-Sik; Lim Kyu-Hong; Lee Byung-Am


Archive | 1998

Verfahren zur Überprüfung zumindest eines Teils eines Halbleiterwafers mit einem Rasterelektronenmikroskop

Jun Chung-Sam; Kim Jeong-Kon; Chon Sang-Moon; Choi Sang-Bong


Archive | 2018

METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR PERFORMING THE SAME, AND A METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME

Song Joonseo; Ryu Sung Yoon; Yap Wahseng; Jee Yunjung; Yang Yu-Sin; Jun Chung-Sam; Jeoung Yoo Jin; Ahn Jaehyung; Lee Janghee


Archive | 2017

APPARATUS AND METHOD FOR MEASURING THICKNESS

Ryu Sung Yoon; Sohn Younghoon; Yang Yu-Sin; Jun Chung-Sam; Jee Yunjung

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