Christian Zschokke

Tunable, oblique incidence resonant grating filter for telecommunications

We have designed a tunable, oblique-incidence resonant grating filter that covers the C band as an add-drop device for incident TE-polarized light. We tune the filter by tilting a microelectromechanical systems platform onto which the filter is attached. The fabrication tolerances as well as the role of finite incident-beam size and limited device size were addressed. The maximum achievable efficiency of a finite-area device as well as a scaling law that relates the resonance peak width and the minimum device size is derived. In good agreement with simulations, measurements indicate a negligible change in shape of the resonance peak from 1526 nm at a 45 degrees angle of incidence to 1573 nm at a 53 degrees angle with a full width at half-maximum of 0.4 nm. In this range the shift of the peak wavelength is linear with respect to changes in the angle of incidence.

Wafer-scale replication and testing of micro-optical components for VCSELs

VCSELs (Vertical-Cavity Surface-Emitting Lasers) emit circularly symmetric beams vertical to the substrate; the small footprint of the active area (around 400 um2) enables the simultaneous fabrication of several thousand devices on a single wafer. Micro-optical components can modify the free-space optical properties of VCSELs for applications such as fiber-coupling in transceiver modules, illumination purposes, or beam profiling in sensing applications. However, the alignment of a laser towards a lens, for example, is expensive when performed separately for each device. Here we demonstrate a wafer-scale replication process to realise microlenses directly on top of the undiced VCSEL wafers. The process combines uv-casting and lithography to achieve material-free bonding pads and dicing lines. Several examples of lenses and gratings are given. An organically modified sol-gel material (ORMOCER) has been used as lens material. The micro-optical components on the wafer show good stability while sawing and bonding, where temperatures up to 220°C may occur. We have compared refractive lenses on top of the VCSELs with lenses on glass substrates. The lenses on the glass wafers were illuminated from the back-side by a planar wave. Spot diameters around 1.2 um and focal lengths of 30 um to 100 um were measured depending on the radii of curvature. On the VCSELs the lenses showed a strong influence on the transversal mode behaviour.

Cost-effective fabrication of waveguides for PLCs by replication in UV-curable sol-gel material

A new wafer-scale replication process for fabricating buried ridge waveguides for telecom/datacom applications using an uv-curable sol-gel material is proposed. Spin coating of the core material on the replication mould is used to form the waveguide cores with a smooth thin layer. The spin parameters allow an accurate control of the thickness and homogeneity. The bottom-cladding is uv-cast between a substrate and the mould, which is covered by the spun core layer. The ridge waveguide cores are demoulded and buried under a top cladding. This process allows the stacking of several layers of waveguides on top of each other to form two-dimensional waveguide arrays. A specially adapted SUSS mask aligner is used to control the cladding thickness between individual waveguide layers and to align them. A waveguide loss comparable to lithographically fabricated waveguides has been achieved.

Resonant grating filters at oblique incidence

We designed a tunable, oblique incidence resonant grating filter covering the c-band as drop device. Our resonant grating filter consists of a planar waveguide on a glass substrate covered by low index medium that separates the waveguide from the grating on top of it. With these 3 layers we reach a finesse of more than 3000, which would require much more layers in traditional thin film technology. The drop filter can be tuned by tilting the MEMS platform on which the filter will be glued. Tuning over the c-band will require tilt angles of 3° of the MEMS platform in both directions. Measurements indicate a resonance peak shift of 1.2% and a negligible shape change of the resonance peak from 1526nm at 45° angle of incidence to 1573nm at 53° with a full width at half maximum of 0.4nm. In this range the peak wavelength shift is linear with respect to the change of the AOI.

Tandem chirped grating couplers for data/telecom monitoring applications

Tandem chirped grating couplers for spectral measurement applications in optical communications are developed. The current devices are designed to monitor data/telecom dense wavelength-division multiplexing (DWDM) channels in the spectral range from 1528 to 1561 nm (C-Band). A replication process provides the diffractive structures, on the gratings a high-index waveguide material is deposited. Design parameters and fabrication tolerances are discussed in detail, and measurement results of the fabricated devices are presented.