Christoph Dirnecker
Texas Instruments
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Publication
Featured researches published by Christoph Dirnecker.
IEEE Electron Device Letters | 2001
Jeffrey A. Babcock; Scott Balster; Angelo Pinto; Christoph Dirnecker; Philipp Steinmann; Reiner Jumpertz; Badih El-Kareh
The frequency dependence of PECVD nitride and LPCVD oxide metal-insulator-metal (MIM) capacitors is investigated with special attention for precision analog applications. At measurement frequencies of 1.0 MHz, nitride MIM capacitors show capacitance linearity close to that of oxide MIM capacitors, indicating potential for precision analog circuit applications. Due to dispersion effects, however, nitride MIM capacitors show significant degradation in capacitor linearity as the frequency is reduced, which leads to accuracy limitations for precision analog circuits. Oxide MIM capacitors are essentially independent of frequency.
Archive | 2001
Christoph Dirnecker; Jeffrey A. Babcock; Michael Schober; Scott Balster; Angelo Pinto
Archive | 2001
Christoph Dirnecker; Jeffrey A. Babcock; Michael Schober; Scott Balster; Angelo Pinto
Archive | 2009
Christoph Dirnecker; Philipp Steinmann; Badih El-Kareh
Archive | 2004
Scott Balster; Badih El-Kareh; Philipp Steinmann; Christoph Dirnecker
Archive | 2002
Angelo Pinto; Jeffrey A. Babcock; Michael Schober; Scott Balster; Christoph Dirnecker
Archive | 2007
Christoph Dirnecker; Jeffrey A. Babcock; Scott Balster
Archive | 2002
Jeffrey A. Babcock; Christoph Dirnecker; Angelo Pinto; Scott Balster; Michael Schober; Alfred Haeusler
Archive | 2007
Joerg Walter Haussmann; Christoph Dirnecker; Rupert Wagner
Archive | 2014
Christoph Dirnecker; Berthold Staufer
