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Latest external collaboration on country level. Dive into details by clicking on the dots.

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Dive into the research topics where Christoph Kutter is active.

Publication


Featured researches published by Christoph Kutter.


Archive | 1998

Read only memory

Christoph Kutter; Georg Tempel


Archive | 2002

Nonvolatile nor semiconductor memory device and method for programming the memory device

Georg Georgakos; Kai Huckels; Jakob Kriz; Christoph Kutter; Andreas Liebelt; Christoph Ludwig; Elard Stein Von Kamienski; Peter Wawer


Archive | 1997

New ROM with multiple intersecting conductor line levels

Christoph Kutter; Georg Tempel


Archive | 2000

Non-volatile semiconductor memory location and method for producing the same

Christoph Ludwig; Christoph Kutter; Peter Wawer; Von Kamienski Elard Stein


Archive | 2002

Semiconductor structure having buried track conductors, and method for generating an electrical contact with buried track conductors

Christoph Ludwig; Klaus-Dieter Morhard; Christoph Kutter


Archive | 2000

Method of producing a non-volatile semiconductor memory cell with a separate tunnel window

Peter Wawer; Oliver Springmann; Konrad Wolf; Olaf Heitzsch; Kai Huckels; Reinhold Rennekamp; Mayk Röhrich; Elard Stein Von Kamienski; Christoph Kutter; Christoph Ludwig


Archive | 1998

Semiconductor element for integrated circuits

Christoph Ludwig; Christoph Kutter; Konrad Wolf; Olaf Heitzsch; Kai Huckels; Reinhold Rennekamp; Mayk Roehrich; Von Kamienski Elard Stein; Peter Wawer; Oliver Springmann


Archive | 2006

Method for manufacturing non-volatile semiconductor memory cell having separate tunnel window

Olaf Heitzsch; Kai Huckels; Christoph Kutter; Christoph Ludwig; Reinhold Rennekamp; Mayk Roehrich; Oliver Springmann; Von Kamienski Elard Stein; Peter Wawer; Konrad Wolf; シュタイン フォン カミーンスキ エラルド; ハイツシュ オラフ; スプリングマン オリバー; フッケルス カイ; クッター クリストフ; ルードヴィッヒ クリストフ; ヴォルフ コンラート; ヴァヴェル ペーター; ローリッヒ マイク; レンネカンプ ラインホールド


Archive | 2002

Procédé de essai et marquage de tranche pour des composants semi-conducteurs avec des structures fusibles

Ayad Abdul-Hak; Dirk Caspary; Achim Gratz; Patrick Haibach; Christoph Kutter; Von Kamienski Elard Stein


Archive | 2001

Wafer-Test- und Markierverfahren für Halbleiterbausteine mit Schmelzstrukturen Wafer testing and marking method for semiconductor devices with fuse structures

Ayad Abdul-Hak; Dirk Caspary; Achim Gratz; Patrick Haibach; Elard Stein Von Kamienski; Christoph Kutter

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