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Dive into the research topics where Peter Wawer is active.

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Featured researches published by Peter Wawer.


photovoltaic specialists conference | 2011

Tra.Q — Laser marking for single wafer identification — Production experience from 100 million wafers

Sven Wanka; David Rychtarik; Jörg Müller; Steffen Geissler; Philip Kappe; Marco Spallek; Uli vom Bauer; Christoph Ludwig; Peter Wawer

Single wafer identification is a mandatory element of a modern solar cell production [1]. It accelerates the efficiency roadmap of the solar cell and fosters the cost reduction roadmap of the fabrication. The laser marking concept Tra.Q creates an individual code on each and every wafer. This makes process optimization and quality control easier and faster. The solar cells are 100% traceable along the whole value chain [2–4]. Q-Cells has a broad experience of meanwhile 100 million solar cells, being fabricated in the Thalheim manufacturing line. A large statistical database is available. Typically, the code for the individual tracking is engraved onto the bare wafer before the manufacturing process. The big benefits of the single wafer identification are (a) faster learning in production, (b) steeper ramp curves for the introduction of innovations, (c) improved quality control of materials and of products from the suppliers, (d) enhanced transparency to the customer. The single wafer identification helps to make root cause analysis easier and faster and to nail down the key issues in a particular manufacturing site.


Archive | 2002

Nonvolatile nor semiconductor memory device and method for programming the memory device

Georg Georgakos; Kai Huckels; Jakob Kriz; Christoph Kutter; Andreas Liebelt; Christoph Ludwig; Elard Stein Von Kamienski; Peter Wawer


Archive | 2000

Non-volatile semiconductor memory location and method for producing the same

Christoph Ludwig; Christoph Kutter; Peter Wawer; Von Kamienski Elard Stein


world conference on photovoltaic energy conversion | 2011

Tra.Q - Laser Marking for Single Wafer Identification - Production Experience from 100 Million Wafers

Peter Wawer; Christoph Ludwig; U. vom Bauer; M. Spallek; S. Thormann; P. Kappe; S. Geissler; Jörg Müller; David Rychtarik; S. Wanka


Archive | 2002

Method for the integrated production of EEPROM and FLASH memory cells

Peter Wawer; Elard Stein Von Kamienski; Christoph Ludwig


Archive | 2000

Method of producing a non-volatile semiconductor memory cell with a separate tunnel window

Peter Wawer; Oliver Springmann; Konrad Wolf; Olaf Heitzsch; Kai Huckels; Reinhold Rennekamp; Mayk Röhrich; Elard Stein Von Kamienski; Christoph Kutter; Christoph Ludwig


Archive | 1998

Semiconductor element for integrated circuits

Christoph Ludwig; Christoph Kutter; Konrad Wolf; Olaf Heitzsch; Kai Huckels; Reinhold Rennekamp; Mayk Roehrich; Von Kamienski Elard Stein; Peter Wawer; Oliver Springmann


Archive | 2006

Method for manufacturing non-volatile semiconductor memory cell having separate tunnel window

Olaf Heitzsch; Kai Huckels; Christoph Kutter; Christoph Ludwig; Reinhold Rennekamp; Mayk Roehrich; Oliver Springmann; Von Kamienski Elard Stein; Peter Wawer; Konrad Wolf; シュタイン フォン カミーンスキ エラルド; ハイツシュ オラフ; スプリングマン オリバー; フッケルス カイ; クッター クリストフ; ルードヴィッヒ クリストフ; ヴォルフ コンラート; ヴァヴェル ペーター; ローリッヒ マイク; レンネカンプ ラインホールド


Archive | 2000

Field programmable gate array (fpga) cell

Olaf Heitzsch; Christoph Kutter; Reinhold Rennekamp; Oliver Springmann; Peter Wawer; Kai Huckels; Christoph Ludwig; Mayk Roehrich; Von Kamienski Elard Stein; Konrad Wolf


Archive | 2000

Semiconductor/memory location pair

Peter Wawer; Oliver Springmann; Konrad Wolf; Olaf Heitzsch; Kai Huckels; Reinhold Rennekamp; Mayk Röhrich; Von Kamienski Elard Stein; Christoph Kutter; Christoph Ludwig

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