Peter Wawer
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Featured researches published by Peter Wawer.
photovoltaic specialists conference | 2011
Sven Wanka; David Rychtarik; Jörg Müller; Steffen Geissler; Philip Kappe; Marco Spallek; Uli vom Bauer; Christoph Ludwig; Peter Wawer
Single wafer identification is a mandatory element of a modern solar cell production [1]. It accelerates the efficiency roadmap of the solar cell and fosters the cost reduction roadmap of the fabrication. The laser marking concept Tra.Q creates an individual code on each and every wafer. This makes process optimization and quality control easier and faster. The solar cells are 100% traceable along the whole value chain [2–4]. Q-Cells has a broad experience of meanwhile 100 million solar cells, being fabricated in the Thalheim manufacturing line. A large statistical database is available. Typically, the code for the individual tracking is engraved onto the bare wafer before the manufacturing process. The big benefits of the single wafer identification are (a) faster learning in production, (b) steeper ramp curves for the introduction of innovations, (c) improved quality control of materials and of products from the suppliers, (d) enhanced transparency to the customer. The single wafer identification helps to make root cause analysis easier and faster and to nail down the key issues in a particular manufacturing site.
Archive | 2002
Georg Georgakos; Kai Huckels; Jakob Kriz; Christoph Kutter; Andreas Liebelt; Christoph Ludwig; Elard Stein Von Kamienski; Peter Wawer
Archive | 2000
Christoph Ludwig; Christoph Kutter; Peter Wawer; Von Kamienski Elard Stein
world conference on photovoltaic energy conversion | 2011
Peter Wawer; Christoph Ludwig; U. vom Bauer; M. Spallek; S. Thormann; P. Kappe; S. Geissler; Jörg Müller; David Rychtarik; S. Wanka
Archive | 2002
Peter Wawer; Elard Stein Von Kamienski; Christoph Ludwig
Archive | 2000
Peter Wawer; Oliver Springmann; Konrad Wolf; Olaf Heitzsch; Kai Huckels; Reinhold Rennekamp; Mayk Röhrich; Elard Stein Von Kamienski; Christoph Kutter; Christoph Ludwig
Archive | 1998
Christoph Ludwig; Christoph Kutter; Konrad Wolf; Olaf Heitzsch; Kai Huckels; Reinhold Rennekamp; Mayk Roehrich; Von Kamienski Elard Stein; Peter Wawer; Oliver Springmann
Archive | 2006
Olaf Heitzsch; Kai Huckels; Christoph Kutter; Christoph Ludwig; Reinhold Rennekamp; Mayk Roehrich; Oliver Springmann; Von Kamienski Elard Stein; Peter Wawer; Konrad Wolf; シュタイン フォン カミーンスキ エラルド; ハイツシュ オラフ; スプリングマン オリバー; フッケルス カイ; クッター クリストフ; ルードヴィッヒ クリストフ; ヴォルフ コンラート; ヴァヴェル ペーター; ローリッヒ マイク; レンネカンプ ラインホールド
Archive | 2000
Olaf Heitzsch; Christoph Kutter; Reinhold Rennekamp; Oliver Springmann; Peter Wawer; Kai Huckels; Christoph Ludwig; Mayk Roehrich; Von Kamienski Elard Stein; Konrad Wolf
Archive | 2000
Peter Wawer; Oliver Springmann; Konrad Wolf; Olaf Heitzsch; Kai Huckels; Reinhold Rennekamp; Mayk Röhrich; Von Kamienski Elard Stein; Christoph Kutter; Christoph Ludwig