Chuanbin Zeng
Chinese Academy of Sciences
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Featured researches published by Chuanbin Zeng.
international conference on microelectronic test structures | 2014
Jinshun Bi; Chuanbin Zeng; Linchun Gao; Duoli Li; Gang Liu; Jiajun Luo; Zhengsheng Han; Zhengshen Han
This paper investigates the influence of metal spacing and poly-crystalline silicon gate and silicide technology on single event transients (SETs) occurring in pulsed laser irradiated test patterns based on 0.18 μm partially depleted silicon-on-insulator complementary-metal-oxide-semiconductor technology. Laser-induced transients were measured and analyzed in detail, including SET rise time, fall time, pulse width, pulse maximum, and collected charge. The quantitative dependence of the SET characteristics on metal spacing and silicide processing is reported. This information is useful for optimal design of test structures to evaluate soft errors in integrated circuits.
Archive | 2012
Jing Li; Chaohe Hai; Chuanbin Zeng; Zhengsheng Han; Duoli Li
Archive | 2012
Chuanbin Zeng; Linchun Gao; Jinshun Bi; Jiajun Luo; Zhengsheng Han
Archive | 2010
Chuanbin Zeng; Chaohe Hai; Jing Li; Duoli Li; Zhengsheng Han
Archive | 2012
Chuanbin Zeng; Jinshun Bi; Duoli Li; Jiajun Luo; Zhengsheng Han
Archive | 2012
Chuanbin Zeng; Chaohe Hai; Jing Li; Duoli Li; Jiajun Luo; Zhengsheng Han
Archive | 2012
Chuanbin Zeng; Jinshun Bi; Gang Liu; Jiajun Luo; Zhengsheng Han
Archive | 2012
Chuanbin Zeng; Duoli Li; Chaohe Hai; Jing Li; Jiajun Luo; Zhengsheng Han
Archive | 2011
Chuanbin Zeng; Chaohe Hai; Jing Li; Duoli Li; Jiajun Luo; Zhengsheng Han
Archive | 2009
Chuanbin Zeng; Chaohe Hai; Jing Li; Duoli Li; Zhengsheng Han
