Cristina Almeida Magalhães

New numerical methods for the photoelastic technique with high accuracy

The objective of this research is to find new equations for a novel phase-shifting method in digital photoelasticity. Some innovations are proposed. In terms of phase-shifting, only the analyzer is rotated, and the other equations are deduced by applying a new numerical technique instead of the usual algebraic techniques. This approach can be used to calculate equation of phase with a larger sequence of images. Each image represents a pattern and a measurement of the stresses present in the object. A reduction in the difference between the theoretical and experimental values of stresses was obtained by increasing the number of images in the equations for calculating phase. Every photographic image has errors and random noise, but the uncertainties due to these effects can be reduced with a larger number of observations.

Numerical method to digital photoelasticity using plane polariscope.

This research aims to find a new way to get the intensity equations for the phase-shifting model in digital photoelasticity. The procedure is based on the rotation of the analyzer itself. From the intensity equations, the isoclinic and isochromatic equations parameters are deduced by applying a new numerical technique. This approach can be done to calculate how many images allow the resolution of the polariscope. Each image indicates the stress forces in the object. In this study the plane polariscope was used. The amount of images will determinate the number of errors and uncertainties of the study, due to the observation that the veracity of the equations increases considerably with a large amout of images. Several analyses are performed with different amounts of photographic images. The results showed the possibility to measure stress forces with high precision using plane polariscopes.

New equations for phase evaluation in measurements with an arbitrary but constant phase shift between captured intensity signs

We offer new equations for phase evaluation in measurements. Several phase-shifting equations with an arbitrary but constant phase shift between captured intensity signs are proposed. We show a mathematical model that seeks new equations by minimizing the uncertainty in measurements. The equations are similarly derived as the so-called Carre equation. The idea is to develop a generalization of the Carre equation that is not restricted to four images. Errors and random noise in the images cannot be eliminated, but the uncertainty due to their effects can be reduced by increasing the number of observations. An experimental analysis of the mistakes of the technique was made, as well as a detailed analysis of mistakes of the measurement. The advantages of the proposed equation are its precision in the measures taken, speed of processing, and the immunity to noise in signs and images.

New numerical method for the photoelastic technique

The objective of this research is to find new equations for a novel phase-shifting method in digital photoelasticity. Some innovations are proposed. In terms of phase-shifting, only the analyzer is rotated, and the other equations are deduced by applying a new numerical technique instead of the usual algebraic techniques. This approach can be used to calculate a larger sequence of images. Each image represents a measurement of the stresses present in the object. Every photographic image has errors and random noise, but the uncertainties due to these effects can be reduced with a larger number of observations. Keywords: photoelasticity, metrology, stress analysis, optical measurement