Curtis Colonero

Design approaches for digitally dominated active pixel sensors: leveraging Moore's Law scaling in focal plane readout design

Although CMOS technology scaling has provided tremendous power and circuit density benefits for innumerable applications, focal plane array (FPA) readouts have largely been left behind due to dynamic range and signal-to-noise considerations. However, if an appropriate pixel front end can be constructed to interface with a mostly digital pixel, it is possible to develop sensor architectures for which performance scales favorably with advancing technology nodes. Although the front-end design must be optimized to interface with a particular detector, the dominant back end architecture provides considerable potential for design reuse. In this work, digitally dominated long wave infrared (LWIR) active pixel sensors with cutoff wavelengths between 9 and 14.5 μm are demonstrated. Two ROIC designs are discussed, each fabricated in a 90-nm digital CMOS process and implementing a 256 x 256 pixel array on a 30-μm pitch. In one of the implemented designs, the feasibility of implementing a 15-μm pixel pitch FPA with a 500 million electron effective well depth, less than 0.5% non-linearity in the target range and a measured NEdT of less than 50 mK at f/4 and 60 K is demonstrated. Simple on-FPA signal processing allows for a much reduced readout bandwidth requirement with these architectures. To demonstrate the potential for commonality that is offered by a digitally dominated architecture, this LWIR sensor design is compared and contrasted with other digital focal plane architectures. Opportunities and challenges for application of this approach to various detector technologies, optical wavelength ranges and systems are discussed.

Design and testing of an all-digital readout integrated circuit for infrared focal plane arrays

The digital focal plane array (DFPA) project demonstrates the enabling technologies necessary to build readout integrated circuits for very large infrared focal plane arrays (IR FPAs). Large and fast FPAs are needed for a new class of spectrally diverse sensors. Because of the requirement for high-resolution (low noise) sampling, and because of the sample rate needed for rapid acquisition of high-resolution spectra, it is highly desirable to perform analog-to-digital (A/D) conversion right at the pixel level. A dedicated A/D converter located under every pixel in a one-million-plus element array, and all-digital readout integrated circuits will enable multi- and hyper-spectral imaging systems with unprecedented spatial and spectral resolution and wide area coverage. DFPAs provide similar benefits to standard IR imaging systems as well. We have addressed the key enabling technologies for realizing the DFPA architecture in this work. Our effort concentrated on demonstrating a 60-micron footprint, 14-bit A/D converter and 2.5 Gbps, 16:1 digital multiplexer, the most basic components of the sensor. The silicon test chip was fabricated in a 0.18-micron CMOS process, and was designed to operate with HgxCd1-xTe detectors at cryogenic temperatures. Two A/D designs, one using static logic and one using dynamic logic, were built and tested for performance and power dissipation. Structures for evaluating the bit-error-rate of the multiplexer on-chip and through a differential output driver were implemented for a complete performance assessment. A unique IC probe card with fixtures to mount into an evacuated, closed-cycle helium dewar were also designed for testing up to 2.5 Gbps at temperatures as low as 50 K.

Digital-pixel focal plane array development

Since 2006, MIT Lincoln Laboratory has been developing Digital-pixel Focal Plane Array (DFPA) readout integrated circuits (ROICs). To date, four 256 × 256 30 μm pitch DFPA designs with in-pixel analog to digital conversion have been fabricated using IBM 90 nm CMOS processes. The DFPA ROICs are compatible with a wide range of detector materials and cutoff wavelengths; HgCdTe, QWIP, and InGaAs photo-detectors with cutoff wavelengths ranging from 1.6 to 14.5 μm have been hybridized to the same digital-pixel readout. The digital-pixel readout architecture offers high dynamic range, A/C or D/C coupled integration, and on-chip image processing with low power orthogonal transfer operations. The newest ROIC designs support two-color operation with a single Indium bump connection. Development and characterization of the two-color DFPA designs is presented along with applications for this new digital readout technology.

An advanced wide area chemical sensor testbed

In order to meet current and emerging needs for remote passive standoff detection of chemical agent threats, MIT Lincoln Laboratory has developed a Wide Area Chemical Sensor (WACS) testbed. A design study helped define the initial concept, guided by current standoff sensor mission requirements. Several variants of this initial design have since been proposed to target other applications within the defense community. The design relies on several enabling technologies required for successful implementation. The primary spectral component is a Wedged Interferometric Spectrometer (WIS) capable of imaging in the LWIR with spectral resolutions as narrow as 4 cm-1. A novel scanning optic will enhance the ability of this sensor to scan over large areas of concern with a compact, rugged design. In this paper, we shall discuss our design, development, and calibration process for this system as well as recent testbed measurements that validate the sensor concept.