D.A.J. Starmans
University of Twente
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Publication
Featured researches published by D.A.J. Starmans.
Sensors and Actuators B-chemical | 1992
J. Kruise; J.P. Rispens; Piet Bergveld; F.J.B. Kremer; D.A.J. Starmans; J.R. Haak; Jan Feijen; David N. Reinhoudt
The electrical resistance of a membrane containing charged proteins is a function of both concentration and mobility of the electrolyte ions present in the membrane, and thus it depends on the Donnan effect. We were able to determine the resistance of such a membrane deposited on an ISFET, by means of a simple a.c. impedance measurement. As an example a membrane containing cross-linked lysozyme was used. We found the membrane resistance to be inversely proportional to the fixed charge density, in good agreement with the theoretical description based on the Donnan theory.
Chemistry of Materials | 1994
E. Kelderman; D.A.J. Starmans; J.P.M. van Duynhoven; Willem Verboom; Johannes F.J. Engbersen; David N. Reinhoudt
Journal of Artificial Organs-special issue dedeicated to the abstracts of the XXIth ESAO Congress, Vol.17, No.8 | 1994
D.A.J. Starmans; G.H.M. Engbers; Pieter J. Dijkstra; Jan Feijen
Archive | 1993
J. Kruise; F.J.B. Kremer; D.A.J. Starmans; Piet Bergveld
Archive | 1992
F.J.B. Kremer; Johannes F.J. Engbersen; J. Kruise; Piet Bergveld; D.A.J. Starmans; Jan Feijen; David Reinhoudt
Archive | 1992
D.A.J. Starmans; Jan Feijen; F.J.B. Kremer; J.R. Haak; Johannes F.J. Engbersen; David Reinhoudt; J. Kruise; Piet Bergveld
Journal of Membrane Science | 1992
D.A.J. Starmans; Pieter J. Dijkstra; Jan Feijen; F.J.B. Kremer; J.R. Haak; Johannes F.J. Engbersen; David N. Reinhoudt; J. Kruise; Piet Bergveld
4th International Meeting on Chemical Sensors, IMCS 1992 | 1992
F.J.B. Kremer; Johannes F.J. Engbersen; J. Kruise; Piet Bergveld; D.A.J. Starmans; Jan Feijen; David Reinhoudt
Archive | 1991
F.J.B. Kremer; J.R. Haak; Johannes F.J. Engbersen; J. Kruise; Piet Bergveld; D.A.J. Starmans; Jan Feijen; David Reinhoudt
Archive | 1991
F.J.B. Kremer; J.R. Haak; Johannes F.J. Engbersen; J. Kruise; Piet Bergveld; D.A.J. Starmans; Jan Feijen; David Reinhoudt
