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Dale E. Newbury

University of Oxford

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Featured researches published by Dale E. Newbury.

Applied Optics | 1986

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Patrick Echlin; Charles E. Fiori; Joseph I. Goldstein; David C. Joy; Dale E. Newbury

1. Modeling Electron Beam-Specimen Interactions.- 2. SEM Microcharacterization of Semiconductors.- 3. Electron Channeling Contrast in the SEM.- 4. Magnetic Contrast in the SEM.- 5. Computer-Aided Imaging and Interpretation.- 6. Alternative Microanalytical Techniques.- 7. Specimen Coating.- 8. Advances in Specimen Preparation for Biological SEM.- 9. Cryomicroscopy.- References.

Archive | 1992

Scanning Electron Microscopy and X-ray Micro-analysis

Joseph I. Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; A. D. Romig; Charles E. Lyman; Charles E. Fiori; Eric Lifshin

Journal of Materials Science | 1972

Scanning electron microscope selected area channelling patterns from 1 micron specimen areas

David C. Joy; Dale E. Newbury

Scripta Metallurgica | 1984

Diffusion-induced grain boundary migration in the AuAg system☆

Daniel B. Butrymowicz; Dale E. Newbury; D. Turnbull; J.M. Cahn

Scripta Metallurgica | 1970

Tensile testing of strain-rate-sensative materials at constant imposed strain rate

Dale E. Newbury; David C. Joy

Archive | 2011

Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Tim K. Maugel

Scripta Metallurgica | 1982

Diffusion-induced grain boundary migration in the Cu?Zn system?

T. J. Piccone; Daniel B. Butrymowicz; Dale E. Newbury; Jerry E. Manning; John W. Cahn

Scripta Metallurgica | 1984

Diffusion-induced grain boundary migration in the Au?Ag system?

Daniel B. Butrymowicz; Dale E. Newbury; D. Turnbull; John W. Cahn

Journal of Materials Science | 1973

Comments on “Constant stress creep and constant true strain-rate tensile tests of the superplastic alloy PbSn”

Dale E. Newbury

SPIE Scanning Microscopies | 2014

Front Matter: Volume 9236

Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel

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David C. Joy

University of Oxford

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Michael T. Postek

National Institute of Standards and Technology

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Daniel B. Butrymowicz

National Institute of Standards and Technology

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Patrick Echlin

University of Cambridge

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Charles E. Fiori

National Institute of Standards and Technology

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D. Turnbull

Harvard University

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John W. Cahn

Massachusetts Institute of Technology

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Joseph I. Goldstein

Lehigh University

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A. D. Romig

Sandia National Laboratories

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Charles E. Lyman

Lehigh University

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